Detection mark and method and apparatus for detecting mark

• US 5,210,411 A
• Filed: 06/27/1991
• Issued: 05/11/1993
• Est. Priority Date: 06/29/1990
• Status: Expired due to Term

• Current Assignee: Hitachi Maxell Limited (Maxell, Ltd.)
• Original Assignee: Hitachi Maxell Limited (Maxell, Ltd.)
• Inventors: Yamaguchi, Tsutomu, Oshima, Toshio, Nishida, Masato, Ohiwa, Tsunemi
• Primary Examiner(s): Hannaher, Constantine
• Application Number:
  US07/722,186
• Time in Patent Office: 684 Days
• Field of Search: 250/271, 250/459.1, 250/458.1, 250/461.1, 250/341, 235/491, 235/473, 235/468, 235/463
• US Class Current: 250/271
• CPC Class Codes: G06K 19/06028 using bar codes
• CPC Class Codes: G06K 7/12 using a selected wavelength, e.g. to sense red marks and ignore blue marks
• CPC Class Codes: G06K 7/14 using light without selection of wavelength, e.g. sensing reflected white light G06K7/10831 - G06K7/1097 take precedence

Abstract

A detection mark comprising a pattern formed from a thin phosphor layer which emits a light having a different wavelength from that of an excitation light irradiated on a surface side of the phosphor layer, and an undercoat layer which is formed on a rear surface side of the phosphor layer and reflects the excitation light, which mark can be detected by intermittently irradiating the excitation light to the mark and reading a light or afterglow from the phosphor layer.

Claims

1. A detection mark comprising:

a source of excitation light;

a pattern formed from a thin phosphor layer which emits light having a different wavelength from that of excitation light from said source and irradiated on a surface side of said phosphor layer,

an undercoat layer which is formed on a rear surface side of said phosphor layer and reflects said excitation light;

said undercoat layer having a selected reflectance characteristic so as to provide a ratio of an output voltage obtained from detected light emitted from said phosphor layer to that of excitation light reflected from said undercoat layer which is at least 1.6;

means for pulsing said source of excitation light to generate pulses of light emitted from said phosphor layer; and

means for detecting and counting said pulses of emitted light to determine a width dimension of said phosphor layer.

2. The detection mark according to claim 1, wherein said phosphor layer has a thickness of from 0.5 to 200 μ

m, and said undercoat layer has a uniform reflectance profile.

3. The detection mark according to claim 1, wherein said phosphor layer has a thickness of from 0.5 to 200 μ

m and said undercoat layer has an uneven reflectance profile.

4. A method for detecting a mark, which comprises the steps of:

irradiating an excitation light on a phosphor mark printed on a card, said mark being formed from a material having an afterglow property;

pulsing said excitation light;

moving said card relative to said excitation light;

detecting pulses of afterglow from said irradiated material of said mark during an off time of said excitation light; and

counting the number of pulses of afterglow to determine the width of said mark.

5. The method according to claim 4, wherein during said pulsing step the off time of said excitation light is shorter than the on time of said excitation light.

6. The method according to claim 4, wherein said irradiating and detecting steps are carried out in a shielded state, and said step of moving includes moving said mark from an irradiation side of said excitation light to a detection side of said afterglow.

7. An apparatus for detecting a phosphor mark, comprising:

a pulsed source of excitation light;

means for irradiating excitation light from said source on a mark being moved relative to said source of excitation light and comprising a phosphor layer, said phosphor layer thereafter emitting pulses of light in response to said excitation light;

means for selectively receiving and detecting said pulses of light emitted from a part of said mark irradiated by said excitation light;

said means for receiving and detecting being located adjacent said means for irradiating said excitation light;

means for counting said pulses of light emitted from said phosphor layer for detecting a width dimension thereof; and

wherein optical axes of said means for irradiating said excitation light and said means for receiving and detecting said pulses of emitted light are located on a plane perpendicular to a direction in which said mark moves, said axes further being inclined relative to each other.

8. The apparatus according to claim 7, wherein said mark comprises a plurality of strips which are parallel with each other and perpendicular to a moving direction of said mark, said excitation light and said emitted light are in the infrared region with said emitted light having a different center wavelength from that of said excitation light, said means for irradiating excitation light comprises an optical guide of a predetermined length extending from an emitting surface of a light emitting element, and wherein said means for receiving said light includes an optical guide which is connected to a light-receiving surface of a light-receiving element through an optical filter.