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Scanning laser measurement system

  • US 5,212,738 A
  • Filed: 04/12/1991
  • Issued: 05/18/1993
  • Est. Priority Date: 04/12/1991
  • Status: Expired due to Term
First Claim
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1. A thickness measurement system comprising:

  • means for imaging an object, wherein the imaging means generates a plurality of data values representing distances from the imaging means to respective points on the object; and

    means for processing the data values generated by the imaging means, wherein the processing means comprises;

    means for protruding a measured 21/2-D model of a surface of the object, comprising means for making a first object origin congruent with a second object origin, the first object origin being determined by first data points collected by the imaging means from a first position relative to the object, the second object origin being determined by second data points collected by the imaging means from a second position relative to the object, whereby data values collected by the imaging means from the first position may be combined with data values collected by the imaging means from the second position to produce the measured 21/2-D model;

    means for entering a predetermined 21/2-D mathematical model of the object; and

    first comparing means for comparing the measured 21/2-D model to the predetermined 21/2-D model to determine the object'"'"'s thickness.

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