Contactless test method for testing printed circuit boards

• US 5,218,294 A
• Filed: 03/30/1992
• Issued: 06/08/1993
• Est. Priority Date: 01/22/1991
• Status: Expired due to Fees

• Current Assignee: Advanced Test Technologies, Inc.
• Original Assignee: Advanced Test Technologies, Inc.
• Inventors: Soiferman, Jacob
• Primary Examiner(s): NGUYEN, VINH P
• Application Number:
  US07/860,069
• Time in Patent Office: 435 Days
• Field of Search: 324/95, 324/536, 324/158 R, 324/537, 324/538, 324/201, 324/244, 324/83.1, 324/500, 455/67, 358/101, 358/106, 340/600, 343/703, 250/341, 250/334
• US Class Current: 324/763.01
• CPC Class Codes: G01R 31/309 of printed or hybrid circuits or circuit substrates
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

This application describes a novel method and its implementation for testing unpopulated and populated electronic printed circuit boards (PCBs). This method can be used to develop a new contactless test system (CTS). While eliminating drawbacks of existing test systems, this method measures electromagnetic near field distribution in the vicinity of a PCB, contactlessly, by using suitable sensors (possibly printed near field planar antennas) and sensitive measuring and processing devices. The electromagnetic fields (EMF) are generated by the distribution of charges and currents on paths and elements of the board under test (BUT). Therefore, accurate and repeatable measurements of these fields produce a specific pattern for the BUT. Such a pattern is then compared to a known pattern for the same type of board to determine whether the BUT is faulty or nonfaulty.

Claims

1. A method for testing an unpopulated circuit board including a test arrangement of electrically conductive paths, parts, and surfaces whose electrical and physical continuity and conformance to a known standard of a sample arrangement of unpopulated circuit board is to be verified, the sample arrangement having a predetermined required structure for carrying out a predetermined required function, the method comprising providing said known sample arrangement having said required structure and said required function, applying to the sample arrangement an electrical signal, the signal being independent of the predetermined function, providing an array of non-contact sensors for detecting the electromagnetic near field distribution generated by the sample arrangement in response to the signal, using the array to create a sample pattern representative of the electromagnetic near field distribution of the sample arrangement, applying to said test arrangement said electrical signal, using said array to create a test pattern representative of the electromagnetic near field distribution of the test arrangement, making a comparison of the test pattern with said sample pattern of said known sample arrangement and determining from said comparison whether the test arrangement is in conformance to the known standard, the non-contact sensors of the array each comprising a planar printed spiral loop antenna.