Ceramic package and method for making same

• US 5,227,583 A
• Filed: 08/20/1991
• Issued: 07/13/1993
• Est. Priority Date: 08/20/1991
• Status: Expired due to Fees

• Current Assignee: Polese Company Incorporated
• Original Assignee: Microelectronic Packaging America
• Inventors: Jones, Kenneth L.
• Primary Examiner(s): Picard, Leo P.
• Assistant Examiner(s): LEDYNH, BOT L
• Application Number:
  US07/747,729
• Time in Patent Office: 693 Days
• Field of Search: 174/52.1, 174/52.4, 174/51, 174/35 R, 174/35 MS, 29/592.1, 29/854, 29/885, 29/874, 437/218, 437/228, 428/615, 428/620, 428/621, 357/74, 156/625, 156/664
• US Class Current: 174/541
• CPC Class Codes: H01L 2224/05599 Material
• CPC Class Codes: H01L 2224/45124 Aluminium (Al) as principal constituent
• CPC Class Codes: H01L 2224/48091 Arched
• CPC Class Codes: H01L 2224/4911 the connectors being bonded to at least one common bonding area, e.g. daisy chain
• CPC Class Codes: H01L 23/15 Ceramic or glass substrates H01L23/142, H01L23/145, H01L23/147 take precedence
• CPC Class Codes: H01L 23/49838 Geometry or layout
• CPC Class Codes: H01L 23/552 Protection against radiation, e.g. light or electromagnetic waves
• CPC Class Codes: H01L 23/585 comprising conductive layers or plates or strips or rods or rings H01L23/60, H01L23/62, H01L23/64, H01L23/66 take precedence
• CPC Class Codes: H01L 23/66 High-frequency adaptations
• CPC Class Codes: H01L 24/45 of an individual wire connector
• CPC Class Codes: H01L 24/48 of an individual wire connector
• CPC Class Codes: H01L 24/49 of a plurality of wire connectors
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/00014 the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
• CPC Class Codes: H01L 2924/00015 the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed as prior art
• CPC Class Codes: H01L 2924/01005 Boron [B]
• CPC Class Codes: H01L 2924/01006 Carbon [C]
• CPC Class Codes: H01L 2924/01013 Aluminum [Al]
• CPC Class Codes: H01L 2924/01018 Argon [Ar]
• CPC Class Codes: H01L 2924/0103 Zinc [Zn]
• CPC Class Codes: H01L 2924/01047 : Silver [Ag]
• CPC Class Codes: H01L 2924/01078 : Platinum [Pt]
• CPC Class Codes: H01L 2924/01079 : Gold [Au]
• CPC Class Codes: H01L 2924/014 : Solder alloys
• CPC Class Codes: H01L 2924/09701 : Low temperature co-fired ceramic [LTCC]
• CPC Class Codes: H01L 2924/14 : Integrated circuits
• CPC Class Codes: H01L 2924/15153 : the die mounting substrate comprising a recess for hosting the device
• CPC Class Codes: H01L 2924/15165 : Monolayer substrate
• CPC Class Codes: H01L 2924/1517 : Multilayer substrate
• CPC Class Codes: H01L 2924/15173 : in a single layer of the multilayer substrate
• CPC Class Codes: H01L 2924/15787 : Ceramics, e.g. crystalline carbides, nitrides or oxides
• CPC Class Codes: H01L 2924/19107 : off-chip wires
• CPC Class Codes: H01L 2924/30105 : Capacitance
• CPC Class Codes: H01L 2924/3011 : Impedance
• CPC Class Codes: H01L 2924/3025 : Electromagnetic shielding
• CPC Class Codes: Y10T 29/49169 : Assembling electrical component directly to terminal or elongated conductor
• CPC Class Codes: Y10T 29/49224 : with coating

Abstract

A semiconductor package comprises a ceramic base component, a plurality of bonding pads of an electrically conductive metallic material, first and second electrically conductive buses, a signal shielding component which contains first and second electrically conductive plates electrically insulated from each other by a high temperature dielectric material wherein the shielding component is bonded to the base component outward of the bonding pad and the buses. A layer of a dielectric material covers the surface of the shielding component and a glass frit is bonded to the layer of dielectric material. The frit has the leads that extend from a metallic lead frame embedded in its outer surface. The leads, the dielectric layer and the signal shielding component are in substantial alignment The leads are electrically connected to the bonding pad and the first and second electrically conductive layers are connected to the first and second electrically conductive buses. A method of forming the package comprises depositing, in sequential order and in predetermined areas upon a prefired ceramic base component, the metallic materials, such as precious metals and precious metal alloys, the high temperature dielectrics and the glass frit. A semiconductor chip which is electrically connected to the other electrically conductive components can be hemetically sealed inside the package by sealing an impervious lid to the package.

Claims

1. A ceramic package suitable for a semiconductor device comprising

a) a ceramic base component having a first portion for receiving a semiconductor chip and a second portion outward from said first portion,

b) a plurality of bonding pads of an electrically conductive metallic material covering a first area of said second portion of said base component and suitable for being electrically connected to said chip,

c) a first bus of an electrically conductive metallic material covering a second area of said second portion of said base component and suitable for being electrically connecting to said chip,

d) a second bus of an electrically conductive metallic material covering a third area of said second portion of said base component and suitable for being electrically connecting to said chip, said bonding pad, said first and second buses being electrically insulated from each other,

e) a signal shielding component bonded to said base component outward of and electrically insulated from said bonding pad and said first and second buses, said shielding component comprising first and second electrically conductive metallic layers electrically insulated from each other by a first layer of a dielectric material, all of said layers being substantially in alignment, and said first electrically conductive metallic layer being electrically connected to said first bus and said second electrically conductive metallic layer being electrically connected to said second bus,

f) a second layer of a dielectric material covering the surface of said shielding component opposing the surface bonded to said base component, and

g) a glass frit bonded to said second layer of dielectric material having the metallic leads that extend from a metallic lead frame embedded therein, wherein said leads and said signal shielding component ar in substantial alignment an said leads are electrically insulated from said shielding component and are connected to said bonding pads.

2. A semiconductor package according to claim 1 wherein said one of said electrically conductive metallic layers is a ground plate and the other electrically conductive metallic layer is a power plate whereby when s id package is utilized in, high frequency semiconductor applications and where the density of leads is relatively high, the interference in the semiconductor circuits is significantly reduced.

3. A semiconductor package according to claim 2 wherein said electrically conductive metallic materials are precious metal materials.

4. A semiconductor package according to claim 3 wherein said precious metal material is selected from the group consisting of gold, silver, palladium and platinum metal and alloys of said metals.

5. A semiconductor package according to claim 3 wherein said precious metal material is a silver-platinum alloy.

6. A semiconductor package according to claim 1 wherein said ceramic in said base component is selected from the group consisting of Al₂ O₃, MgO, AlN, Si₃ N₄, BN, SiC, BeO, TiO₂, Zr₂ O and mixtures thereof.

7. A semiconductor package according to claim 1 wherein said first and second buses are generally concentric.

8. A semiconductor package according to claim 1 wherein said first conductive metallic layer and said first bus are spaced apart vertically from said second conductive metallic layer.

9. A semiconductor package according to claim 1 wherein said dielectric material is borosilicate.

10. A method of forming a semiconductor package comprising

a) providing a prefired ceramic base component having a first portion and a second portion outward of said first portion,

b) depositing an electrically conductive material over a first segment of said second portion adjacent said first portion, to provide a plurality of electrically conductive bonding pads,

c) forming a signal shielding component by depositing, in sequence and in substantial alignment, a first layer of an electrically conductive metallic material, a layer of a first dielectric material and a second layer of an electrically conductive metallic material,

d) bonding an external surface of said signal shielding component to said ceramic base component,

e) depositing a layer of a second dielectric material on the opposing external surface of said shielding component,

f) depositing a layer of glass frit upon the layer of said second dielectric material and between said bonding pad and said shielding component and positioning a metallic lead frame having its leads extending therefrom substantially in alignment with said signal shielding component and

g) firing said package to melt said frit thereby embedding said leads [frame] into said glass frit.

11. A method according to claim 10 wherein said metallic conductive materials are formed by depositing a photoetchable thick film material and thereafter etching the conductive segments.

12. A method according to claim 10 wherein said metallic conductive materials are formed by screening.