Method of continuously determining crack length

• US 5,227,731 A
• Filed: 05/24/1991
• Issued: 07/13/1993
• Est. Priority Date: 05/24/1991
• Status: Expired due to Fees

• Current Assignee: United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration
• Original Assignee: United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration
• Inventors: Prabhakaran, Ramamurthy, Lopez, Osvaldo F.
• Primary Examiner(s): Harvey, Jack B.
• Application Number:
  US07/705,474
• Time in Patent Office: 781 Days
• Field of Search: 324/691, 324/643, 324/699, 324/718, 324/724, 73/768, 73/774, 73/799, 73/826, 73/834
• US Class Current: 324/718
• CPC Class Codes: G01B 7/16 for measuring the deformation in a solid, e.g. by resistance strain gauge
• CPC Class Codes: G01N 19/08 Detecting presence of flaws or irregularities

Abstract

A crack length sensor is fabricated in a rectangular or other geometrical form from a conductive powder impregnated polymer material. The long edges of the sensor are silver painted on both sides and the sensor is then bonded to a test specimen via an adhesive having sufficient thickness to also serve as an insulator. A lead wire is connected to each of the two outwardly facing silver painted edges. The resistance across the sensor changes continuously as a function of the crack length in the specimen and sensor.

Claims

1. A method of continuously determining the length of a crack in a specimen comprising the steps of:

bonding a conducting substrate having a continuous length to the specimen,

measuring a resistance continuously across the conducting substrate as a crack propagates in the specimen and in the substrate along the length of the substrate; and

correlating a change in the measured resistance across the conducting substrate with the length of the specimen crack.

2. The method according to claim 1, wherein said measuring step comprises attaching lead wires to opposite edges of the substrate and connecting the lead wires to means for measuring the resistance between the lead wires.

3. The method according to claim 2, wherein the opposite edges are aligned parallel with the direction of an induced crank in the specimen.

4. The method according to claim 2, wherein the lead wires are attached to the substrate via silver paint.

5. The method according to claim 1, further comprising applying silver paint to one side of opposite edges of the substrate, attaching lead wires to the other side of the substrate opposite edges with silver paint after bonding the substrate to the specimen, and connecting the lead wires to means for measuring the resistance between the lead wires.

6. The method according to claim 5, wherein the opposite edges of the substrate are aligned parallel with the direction of an induced crank in the specimen.

7. The method according to claim 1, wherein said bonding step comprises applying an adhesive between the substrate and the specimen.

8. The method according to claim 7, further comprising applying the adhesive in a thickness sufficient to insulate the substrate from the specimen.

9. The method according to claim 1, wherein the conducting substrate is a polymer substrate impregnated with a conducting powder.

10. The method according to claim 9, wherein the conducting powder is selected from the group consisting of carbon, silver, iron and nickle.

11. The method according to claim 1, wherein said correlating step comprises correlating the change in measured resistance with a length of a crack along the length of the conductor substrate, the crack length of the substrate being indicative of the length of the crack in the specimen.

12. The method according to claim 11, further comprising measuring an initial resistance across the conducting substrate prior to the crack propagation, and comparing (1) a ratio of the change in measured resistance to the initial measured resistance of the conducting substrate to (2) previously determined ratios of a change in measured resistance to an initial measured resistance of a reference conducting substrate having similar resistance properties to and the same length as the conducting substrate, each of the previously determined ratios having a corresponding determined reference substrate crack length associated therewith, whereby the crack length to the conducting substrate is determined, whereby the crack length in the underlying specimen is determined.