Image processor and automated optical inspection system using the same

• US 5,230,027 A
• Filed: 09/05/1991
• Issued: 07/20/1993
• Est. Priority Date: 09/05/1990
• Status: Expired due to Fees

• Current Assignee: NEC Corporation
• Original Assignee: NEC Corporation
• Inventors: Kikuchi, Hideo
• Primary Examiner(s): Mancuso, Joseph
• Application Number:
  US07/755,005
• Time in Patent Office: 684 Days
• Field of Search: 382/8, 382/27, 382/30, 382/34, 382/41, 382/49, 382/55, 358/101, 358/106, 358/107
• US Class Current: 382/147
• CPC Class Codes: G06T 1/20 Processor architectures; Processor configuration, e.g. pipelining
• CPC Class Codes: G06T 2207/20036 Morphological image processing
• CPC Class Codes: G06T 2207/30141 Printed circuit board [PCB]
• CPC Class Codes: G06T 7/0004 Industrial image inspection

Abstract

An image processor includes an image memory circuit for storing an inputted image data, and an image processing circuit for processing the image data stored in the image memory circuit. The image processing circuit includes a plurality of image processing circuits each for performing a predetermined processing different from each other. An image distributing circuit controls connection between the plurality of image processing circuits and the image memory circuit.

Claims

1. An image processor comprising an image memory circuit for sequentially receiving and storing an inputted image data and sequentially outputting stored image data, an image processing circuit means for processing the image data stored in the image memory circuit, the image processing circuit means including a plurality of image processing circuits being formed for respectively performing predetermined processing functions different from each other, and an image distributing circuit including control circuit means for establishing and controlling connections between the plurality of image processing circuits and the image memory circuit for selectively and arbitrarily coupling predetermined image processing circuits to said image memory circuit and causing said image processing circuits to operate and perform different processing functions in parallel so that a flow of data transferred and processed through said image processing circuits can be arbitrarily changed by said control circuit means.

2. An image processor claimed in claim 1 wherein the plurality of image processing circuits are constituted of at least two circuits selected from the group consisting of a pattern width measuring circuit for measuring a pattern width and a space between adjacent patterns, a thinning/thickening processing circuit for thinning or thickening the width of a pattern, a thinning processing circuit for thinning a pattern into a predetermined constant width, a feature recognition circuit for detecting a position of a featured point of an image, an image synthesis circuit for synthesizing an image, and an image reduction circuit for reducing an image in size.

3. An image processor claimed in claim 2 further including a featured point memory circuit for storing the featured point of the image detected by the feature recognition circuit.

4. An automated optical inspection system comprising:

an image input means for optically sensing an image of an object to be inspected so as to generate an image data; and

an image processor including an image memory circuit receiving the image data outputted from the image input means for storing a received image data, an image processing circuit means for processing the image data stored in the image memory circuit, the image processing circuit means including a plurality of image processing circuits being formed for respectively performing predetermined processing functions different from each other, and an image distributing circuit including control means for establishing and controlling connections between the plurality of image processing circuits and the image memory circuit for selectively and arbitrarily coupling predetermined image processing circuits to said image memory circuit and causing said image processing circuits to operate and perform different processing functions in parallel so that a flow of data transferred and processed through said image processing circuits can be arbitrarily changed by said control means.

5. An automated optical inspection system claimed in claim 4 wherein the plurality of image processing circuits are constituted of at least two circuits selected from the group consisting of a pattern width measuring circuit for measuring a pattern width and a space between adjacent patterns, a thinning/thickening processing circuit for thinning or thickening the width of a pattern, a thinning processing circuit for thinning a pattern into a predetermined constant width, a feature recognition circuit for detecting a position of a featured point of an image, an image synthesis circuit for synthesizing an image, and an image reduction circuit for reducing an image in size, and further including a featured point memory circuit for storing the featured point of the image detected by the feature recognition circuit.

6. An automated optical inspection system comprising:

an image data preparation means for preparing and outputting an image data of an object to be inspected; and

an image processor including an image memory circuit receiving the image data outputted from the image data preparation means for storing a received image data, an image processing circuit means for processing the image data stored in the image memory circuit, the image processing circuit means including a plurality of image processing circuits being formed for respectively performing predetermined processing functions different from each other, and an image distributing circuit including control circuit means for establishing and controlling connections between the plurality of image processing circuits and the image memory circuit for selectively and arbitrarily coupling predetermined image processing circuits to said image memory circuit and causing said image processing circuits to operate and perform different processing functions in parallel so that a flow of data transferred and processed through said image processing circuits can be arbitrarily changed by said control circuit means.

7. An automated optical inspection system claimed in claim 6 further including an image input means for optically sensing an image of an object to be inspected so as to generate an image data, and wherein the image memory circuit receives the image data outputted from the image input means for storing a received image data.

8. An image processor comprising an image memory circuit for storing an inputted image data;

an image processing circuit means for processing the image data stored in the image memory circuit, the image processing circuit means including a plurality of image processing circuits being formed for respectively performing predetermined processing functions different from each other; and

an image distributing circuit including a control circuit for establishing and controlling various connections between the plurality of image processing circuits and the image memory circuit so as to selectively and arbitrarily couple predetermined image processing circuits to said image memory circuit and cause said image processing circuits to operate and perform different processing functions in parallel, a data distributing circuit connected to said image processing circuits and to said control circuits for selecting predetermined image processing circuits and supplying an image data to selected image processing circuits, a memory address generating circuit connected to said image memory circuit for generating a read address and a write address thereof, said control circuit setting and controlling operation of said memory address generating circuit and said data distributing circuit, and a control memory circuit connected to said control circuit for storing and supplying a control procedure thereto.

9. An image processor claimed in claim 8 wherein the plurality of image processing circuits are constituted of at least two circuits selected from the group consisting of a pattern width measuring circuit for measuring a pattern width and a space between adjacent patterns, a thinning/thickening processing circuit for thinning or thickening the width of a pattern, a thinning processing circuit for thinning a pattern into a predetermined constant width, a feature recognition circuit for detecting a position of a featured point of an image, an image synthesis circuit for synthesizing an image, and an image reduction circuit for reducing an image in size.

10. An image processor claimed in claim 9, and further comprising a featured point memory circuit for storing the featured point of the image detected by the feature recognition circuit.

11. An automated optical inspection system comprising:

an image input data for optically sensing an image of an object to be inspected so as to generate an image data; and

an image processor including an image memory circuit receiving the image data outputted from the image input means for storing a received image data, an image processing circuit means for processing the image data stored in the image memory circuit, the image processing circuit means including a plurality of image processing circuits being formed for respectively performing predetermined processing functions different from each other, and an image distributing circuit including a control circuit for establishing and controlling connections between the plurality of image processing circuits and the image memory circuit so as to selectively and arbitrarily couple predetermined image processing circuits to said image memory circuit and cause said image processing circuits to operate and perform different processing functions in parallel, a data distributing circuit connected to said image processing circuits and to said control circuit for selecting predetermined image processing circuits and supplying an image data to selected image processing circuits, a memory address generating circuit connected to said image memory circuit for generating a read address and a write address thereof, said control circuit setting and controlling operation of said memory address generating circuit and said data distributing circuit, and a control memory circuit connected to said control circuit for storing and supplying a control procedure thereto.

12. An automated optical inspection system claimed in claim 11, wherein the plurality of image processing circuits are constituted of at least two circuits selected from the group consisting of a pattern width measuring circuit for measuring a pattern width and a space between adjacent patterns, a thinning/thickening processing circuit for thinning or thickening the width of a pattern, a thinning processing circuit for thinning a pattern into a predetermined constant width, a feature recognition circuit for detecting a position of a featured point of an image, an image synthesis circuit for synthesizing an image, and an image reduction circuit for reducing an image in size, and further including a featured point memory circuit for storing the featured point of the image detected by the feature recognition circuit.