Method and apparatus for measuring the permittivity of materials

• US 5,233,306 A
• Filed: 02/13/1991
• Issued: 08/03/1993
• Est. Priority Date: 02/13/1991
• Status: Expired due to Fees

• Current Assignee: Board of Regents of The University of Wisconsin (University of Wisconsin System)
• Original Assignee: Board of Regents of The University of Wisconsin (University of Wisconsin System)
• Inventors: Misra, Devendra K.
• Primary Examiner(s): Wieder, Kenneth A.
• Assistant Examiner(s): Solis, Jose M.
• Application Number:
  US07/655,755
• Time in Patent Office: 902 Days
• Field of Search: 324/630, 324/601, 324/605, 324/638, 324/642, 324/643, 324/646, 128/804
• US Class Current: 324/601
• CPC Class Codes: G01R 27/2623 Measuring-systems or electronic circuits G01R27/2635, G01R27/2682 take precedence

Abstract

A method and apparatus for determining the permittivity of a sample is disclosed. The method includes applying an AC electrical signal in the microwave frequency range via a coaxial probe having an end position near the sample and measuring the reflection coefficient of the sample. The complex permittivity of the sample is determined from an admittance parameter of the sample/probe combination and a system constant. The system constant is determined by measuring the reflection coefficients of four standards having known complex permittivity. The admittance parameter of the sample/probe combination is determined from the admittance parameters of two standards/probe combinations and the measured reflection coefficients of the sample and the four standards. The admittance parameters of the two standard/probe combinations are determined from the known complex permittivities of the two standards and the system constant. The apparatus includes a coaxial probe having an end positioned near the sample, a microwave frequency generator and a device for measuring a reflection coefficient are connected to the other end of the coaxial probe. A microprocessor determines the complex permittivity of the sample from the measured reflection coefficients of the sample and four standards having known complex permittivities.

Claims

1. A method for determining the permittivity of a sample using a coaxial probe having a first end positioned at the sample and a second end, comprising the steps of:

applying an AC electrical signal in the microwave frequency range to the second end;

measuring the resulting reflection coefficient of the sample;

determining an admittance parameter of the sample and probe combination using the admittance parameters of a pair of standards determined from their known complex permittivities and a system constant, and measured reflection coefficients of the sample and four standards having known complex permittivities, wherein the system constant has been determined from the measured reflection coefficients of the four standards and the known complex permittivities of the four standards; and

determining the complex permittivity of the sample from the admittance parameter of the sample and the system constant.

2. The method of claim 1 wherein said AC electric signal has a frequency of between 100 MHz and 20 GHz.

13. The method of claim 1, wherein the standards have dielectric constants different from each other and spanning a range of values, and the dielectric constant of the sample being tested fails within the range of dielectric constants defined by the standards.

3. In a method for determining the permittivity of a sample using a coaxial probe having a first end positioned at the sample and a second end, including the steps of applying an AC electrical signal in the microwave frequency range to the second end, measuring the resulting reflection coefficient of the sample, determining an admittance parameter of the sample and probe combination, and determining the complex permittivity of the sample from an admittance parameter of the sample, the improvement which comprises:

determining a system constant ξ

to determine complex relative permittivity ε

_r^* according to the equation;

space="preserve" listing-type="equation">y.sub.L =ε

.sub.r.sup.* +ξ

ε

.sub.r.sup.* 2

wherein y_L represents the admittance parameter of aperture admittance y_L.

4. A method for determining the permittivity of a sample using a coaxial probe having a first end positioned at the sample and a second end, comprising the steps of:

applying an AC electrical signal in the microwave frequency range to the second end;

measuring the reflection coefficient of a first, second, third and fourth standard having known complex permittivities;

determining a system constant from the measured reflection coefficients of the first, second, third and fourth standards and the known complex permittivities of the first, second, third and fourth standards;

determining an admittance parameter of the combination of the probe and the first standard, and the combination of the probe and the second standard, from their known complex permittivities and the system constant;

measuring the reflection coefficient of the sample;

determining the admittance parameter of the sample and probe combination from the determined admittance parameter of the first and second standards and the measured reflection coefficients of the sample and the first, second, third and fourth standards; and

determining the complex permittivity of the sample from the admittance parameter of the sample and the system constant.

5. The method of claim 4, wherein the step of applying an AC electric signal in the microwave range includes the step of applying an AC electric signal having a frequency of between 100 MHz and 20 GHz.

6. The method of claim 4, wherein each step is performed at a plurality of frequencies.

7. The method of claim 4, wherein said first standard is an open circuit, said second standard is water, said third standard is a short circuit, and said fourth standard is ethanol.

8. The method of claim 4, wherein the standards have dielectric constants different from each other and spanning a range of values, and the dielectric constant of the sample being tested falls within the range of dielectric constants defined by the standards.

9. An apparatus for determining the permittivity of a sample comprising:

a coaxial probe having a first end positioned at the sample and a second end;

means for applying an AC electrical signal in the microwave frequency range to the second end;

means for measuring the resulting reflection coefficient of the sample;

means for determining an admittance parameter of the sample and probe combination using the admittance parameter of a pair of standards determined from their known complex permittivities and a system constant, and measured reflection coefficients of the sample and four standards having known complex permittivities, wherein the system constant has been determined from the measured reflection coefficients of the four standards and the known complex permittivities of the four standards; and

means for determining the complex permittivity of the sample from the admittance parameter of the sample and the system constant.

10. The apparatus of claim 9, wherein said means for determining the complex permittivity further comprises means for solving y_s =ε

_r^* +ξ

ε

_r^*2, where ε

_r^* is relative complex permittivity of the sample, y_s is an admittance parameter of the sample and ξ

is a system constant.

12. The apparatus of claim 10, further comprising a display coupled to said microprocessor means.

11. An apparatus for determining the permittivity of a sample comprising:

a microwave source;

first and second directional couplers, each of said first and second couplers having an input, a main output and an auxiliary output, wherein said input of said first directional coupler is coupled to said microwave source and said input of said second directional coupler is coupled to said main output of said first directional coupler;

a coaxial probe having a first end and a second end, said first end positioned near the sample and said second end coupled to said main output of said first directional coupler;

a local oscillator coupled to a first and second mixer, wherein said first mixer is further coupled to said auxiliary output of said first directional coupler and said second mixer is further coupled to said auxiliary output of said second directional coupler;

first and second analog to digital converters, wherein said first analog to digital converters is coupled to said first mixer and said second analog to digital converters is coupled to said second mixer;

microprocessor means coupled to said first and second mixers for receiving reflection coefficient data indicative of the sample and for determining the permittivity of the sample using the reflection coefficient data.