Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
First Claim
1. A method for identifying pixel defects on an active plate having a pixel array, a plurality of pixel drive elements and a matrix of data lines and gate lines, each one pixel in the array being coupled to one gate line and one data line in the matrix by a pixel drive element, a plurality of data lines of the matrix terminating at a first shorting means, a plurality of gate lines terminating at a second shorting means, the method comprising the steps of:
- applying a first timing pattern to the first shorting means and second shorting means;
capturing a voltage image of a first area of the active plate to obtain first pixel voltage data for pixels within said first area;
applying a second timing pattern to the first shorting means and second shorting means;
capturing a second voltage image of a second area of the active plate to obtain second pixel voltage data for pixels within said second area; and
comparing the first pixel voltage data and the second pixel voltage data to identify each pixel common to said first area and to said second area which has a short circuit to a data line.
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Accused Products
Abstract
LCD panels are inspected in-process to measure pixel decay, turn-on time and parasitic capacitance and/or identify pixel defects and line defects. Prior to final assembly, panels identified as having sufficiently few repairable defects are repaired. Line defects may be repaired. Further pixel defects may be repaired when redundant structures are included by splicing out the defective TFT or storage capacitor and splicing in a redundant, built-in TFT or storage capacitor. The inspection and repair systems are linked through a repair file. The inspection system identifies each defect by type and location and includes such information in the repair file. The repair system accesses such file and follows a prescribed repair method for a given type of defect at the location of such defect. The inspection system includes an automated non-contact voltage imaging system. The repair system includes lasers and means for repairing defects by adding metallization.
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Citations
2 Claims
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1. A method for identifying pixel defects on an active plate having a pixel array, a plurality of pixel drive elements and a matrix of data lines and gate lines, each one pixel in the array being coupled to one gate line and one data line in the matrix by a pixel drive element, a plurality of data lines of the matrix terminating at a first shorting means, a plurality of gate lines terminating at a second shorting means, the method comprising the steps of:
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applying a first timing pattern to the first shorting means and second shorting means; capturing a voltage image of a first area of the active plate to obtain first pixel voltage data for pixels within said first area; applying a second timing pattern to the first shorting means and second shorting means; capturing a second voltage image of a second area of the active plate to obtain second pixel voltage data for pixels within said second area; and comparing the first pixel voltage data and the second pixel voltage data to identify each pixel common to said first area and to said second area which has a short circuit to a data line. - View Dependent Claims (2)
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Specification