Kit for converting a standard microscope into a single aperture confocal scanning epi-illumination microscope

• US 5,235,457 A
• Filed: 11/30/1990
• Issued: 08/10/1993
• Est. Priority Date: 09/24/1987
• Status: Expired due to Fees

• Current Assignee: Washington University In St Louis
• Original Assignee: Washington University In St Louis
• Inventors: Sunderland, William J., Lichtman, Jeffrey W.
• Primary Examiner(s): Arnold, Bruce Y.
• Assistant Examiner(s): Phan, James
• Application Number:
  US07/620,442
• Time in Patent Office: 984 Days
• Field of Search: 350/62, 350/319, 350/507, 350/523, 350/524, 350/526, 350/527, 350/528, 350/266, 350/272, 350/273, 350/275, 350/450, 350/442, 350/520, 350/321, 356/152, 359/368, 359/385, 359/389, 359/234-236, 359/740, 359/896, 359/894, 250/234-236
• US Class Current: 359/368
• CPC Class Codes: G02B 21/0028 specially adapted for specific applications, e.g. for endoscopes, ophthalmoscopes, attachments to conventional microscopes
• CPC Class Codes: G02B 21/0032 Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06
• CPC Class Codes: G02B 21/0044 moving apertures, e.g. Nipkow disks, rotating lens arrays
• CPC Class Codes: G02B 21/0084 time-scale detection, e.g. strobed, ultra-fast, heterodyne detection
• CPC Class Codes: G02B 21/082 for incident illumination only

Abstract

A kit to convert a standard epi-illumination microscope into a single aperture confocal scanning epi-illumination microscope comprises an assembly including, in one embodiment, a pair of intermediate lenses to create a second field plane conjugate to the specimen plane in both the incident and reflected light paths, with a single aperture positioned at this second conjugate field plane and controllably scanned through the plane to create the incident light beam as well as to mask the returning light before viewing. In a second embodiment, only a single lens is included in the assembly and the objective lens may be positioned at its correct tube length, or a non-standard objective lens may be used to prevent undesired degradation of the image. This assembly conveniently mounts to the nosepiece of the standard microscope in place of the objective lens, and the objective lens mounts to the assembly.

Claims

1. A kit for converting a standard optical imaging microscope for viewing a specimen into a confocal scanning microscope, said standard microscope having a detachable primary objective lens, and said kit having means for attaching said kit within said standard microscope adjacent and optically precedent to said primary objective lens.

2. The kit of claim 1 wherein said kit includes a scanning aperture having at least one set of holes of masking light which traverses the kit.

3. The kit of claim 1 wherein said kit includes a set of lenses for creating a field plane in at least a light path for returning light conjugate to a plane whereat the specimen is positioned.

4. The kit of claim 3 wherein said kit includes a scanning aperture positioned at said conjugate field plane.