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Semiconductor pick-and-place machine automatic calibration apparatus

  • US 5,237,622 A
  • Filed: 12/04/1991
  • Issued: 08/17/1993
  • Est. Priority Date: 12/04/1991
  • Status: Expired due to Term
First Claim
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1. In a semiconductor chip manufacturing process, an apparatus that automatically monitors a pick-and-place machine part placement accuracy comprising:

  • a. a movable downward scanning gray scale camera mounted above a movable "Y" table section of the machine;

    b. a glass plate having dimensions the same as a plurality of PC boards in an inverted position above the table;

    c. a plurality of black calibration marks on the glass plate that match a part lead footprint;

    d. an adhesive layer above the glass plate affixing a plurality of parts to a top of the plate;

    e. a signal output from the gray scale camera to a machine computer; and

    f. an output from the computer to a readout device wherein a misplaced part below the inverted glass plate exposes a silver chip lead and the camera senses a white area and sends a signal to the computer and readout device indicating part placement error.

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