Probe apparatus for testing electronic circuits immersed in a liquid cryogen
First Claim
1. Probe apparatus for testing an electronic circuit at a cryogenic temperature by immersion in a liquid cryogen contained in a vessel having a substantially circular flange surrounding an opening that gives access to the interior of the vessel, said probe apparatus comprising:
- a mounting tube having two opposite ends,a mechanical holder for receiving a device under test and an etched circuit board probe and holding them in predetermined relative positions at one end of the mounting tube,interior means attached to the mounting tube at the opposite end thereof for sealing the interior of the tube from ambient atmosphere and having terminals for connecting to an external test and measurement instrument,signal transmission means extending within the mounting tube from the interface means to the mechanical holder for transmitting electrical signals between the etched circuit board probe and said terminals, anda bushing member attached to and surrounding the mounting tube for engaging in sealing fashion the flange of the vessel containing liquid cryogen.
1 Assignment
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Accused Products
Abstract
A mechanical holder for receiving an integrated circuit chip and an etched circuit board probe and holding them in predetermined relative positions includes an alignment block including alignment elements and having a main surface against which the probe is positioned, and a chip receiver having a main surface and including alignment elements that are complementary to the alignment elements of the alignment member. The chip receiver is attached to the alignment member with the main surface of the chip receiver in confronting relationship with the main surface of the alignment member and with the alignment elements of the chip receiver in registration with the alignment elements of the alignment member. The chip receiver defines a cavity that opens at its main surface. A pusher block is fitted in the cavity of the chip receiver in a manner permitting translation of the pusher block perpendicular to the main surface of the chip receiver and also permitting limited tilting movement of the pusher block in the cavity about at least one axis parallel to the main surface of the chip receiver. A spring urges the pusher block towards the alignment member when the chip receiver is attached to the alignment member.
14 Citations
14 Claims
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1. Probe apparatus for testing an electronic circuit at a cryogenic temperature by immersion in a liquid cryogen contained in a vessel having a substantially circular flange surrounding an opening that gives access to the interior of the vessel, said probe apparatus comprising:
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a mounting tube having two opposite ends, a mechanical holder for receiving a device under test and an etched circuit board probe and holding them in predetermined relative positions at one end of the mounting tube, interior means attached to the mounting tube at the opposite end thereof for sealing the interior of the tube from ambient atmosphere and having terminals for connecting to an external test and measurement instrument, signal transmission means extending within the mounting tube from the interface means to the mechanical holder for transmitting electrical signals between the etched circuit board probe and said terminals, and a bushing member attached to and surrounding the mounting tube for engaging in sealing fashion the flange of the vessel containing liquid cryogen. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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Specification