Apparatus and method for digitizer sampled point validation

• US 5,245,139 A
• Filed: 02/18/1992
• Issued: 09/14/1993
• Est. Priority Date: 02/18/1992
• Status: Expired due to Term

• Current Assignee: NCR Corporation
• Original Assignee: NCR Corporation
• Inventors: Martin, Wayne A., Brehm, Joseph E., Protheroe, Robert L.
• Primary Examiner(s): Schreyer, Stafford
• Application Number:
  US07/836,663
• Time in Patent Office: 574 Days
• Field of Search: 178/18, 178/19, 178/20
• US Class Current: 178/18.05
• CPC Class Codes: G06F 3/045 using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact

Abstract

An apparatus and method for digitizer sampled point validation which determines the contact resistance at a point of contact between the upper and lower layers of the digitizer and compares the contact resistance with a valid range of contact resistances to either accept or reject the sampled point. The apparatus includes an analog drive circuit for driving the digitizer with one of a plurality of drive sources, a switch control logic coupled to the drive circuit for determining which drive source is coupled to the digitizer, an analog-to-digital convertor coupled to the digitizer, and a microcontroller coupled between the analog-to-digital convertor and the switch control logic. The method of the present invention determines the contact resistance, compares the contact resistance with the valid range, and determines and stores the location of the point if the contact resistance is within the valid range.

Claims

1. An apparatus for determining the validity of a point sampled from a digitizer having upper and lower resistive layers, each layer containing a plurality of electrodes, the apparatus comprising:

drive means for driving the digitizer with one of a plurality of drive sources;

selection means coupled to the drive means for determining which drive source is coupled to the digitizer;

means for sensing a predetermined electrical parameter at a predetermined number of electrodes coupled to the digitizer; and

control means coupled between the sensing means and the selection means for controlling the selection means, and for determining the contact resistance between the upper and lower resistive layers at at least one point of contact between the two layers and comparing the contact resistance to a valid range of contact resistances to either accept or reject the point;

wherein a contact resistance below the valid range is indicative of a plurality of points of contact and a resistance above the valid range is indicative of insufficient pressure at the point of contact.

2. The apparatus as recited in claim 1, wherein the drive means comprises:

a current source coupled to one electrode; and

a ground for the current source coupled to another electrode.

3. The apparatus as recited in claim 2, wherein the one electrode is in the same layer as the other electrode.

4. The apparatus as recited in claim 2, wherein the one electrode and the other electrode are in different layers.

5. The apparatus as recited in claim 2, wherein the control means also determines the coordinates of the point and the drive means further comprises:

a voltage source coupled to the one electrode; and

a ground for the voltage source coupled to another electrode on the same layer as the one electrode.

6. The apparatus as recited in claim 5, wherein the drive means further comprises:

switching means controlled by the selection means for coupling a single source and a single ground to the digitizer at a time.

7. The apparatus as recited in claim 1, wherein the selection means comprises a latch.

8. The apparatus as recited in claim 1, wherein the sensing means comprises an analog-to-digital convertor.

9. The apparatus as recited in claim 1, wherein the control means comprises a microcontroller.

10. An apparatus for determining the validity of a point sampled from a digitizer having upper and lower resistive layers comprising:

drive means for driving the digitizer with one of a plurality of drive sources including a current source, a voltage source, a ground, and switching means for coupling the sources and the ground to the digitizer;

selection means coupled to the drive means for determining which drive source is coupled to the digitizer including a latch;

an analog-to-digital converter coupled to the digitizer; and

control means coupled between the analog-to-digital converter and the selection means for controlling the selection means, for determining the contact resistance at at least one point of contact between the upper and lower resistive layers, for determining the coordinates of the point of contact between the upper and lower resistive layers, and for comparing the contact resistance to a valid range of contact resistance to either accept or reject the point;

wherein a contact resistance below the valid range is indicative of a plurality of points of contact and a resistance above the valid range is indicative of insufficient pressure at the point of contact.

11. A method for determining the validity of a point sampled from a digitizer having upper and lower resistive layers, each containing a plurality of electrodes, the method comprising the steps of:

(a) determining the contact resistance at at least one point of contact between the upper and lower layers;

(b) comparing the contact resistance to a range of valid contact resistances;

(c) if the contact resistance is within the valid range, determining the location of the point and accepting the location; and

(d) if the contact resistance is above the valid range, which is indicative of a plurality of points of contact, or if the contact resistance is below the valid range, which is indicative of insufficient pressure at the point of contact, rejecting the location.

12. The method as recited in claim 11, wherein step a comprises the substeps of:

(a-1) measuring a first voltage across the upper layer;

(a-2) measuring a second voltage across the lower layer;

(a-3) measuring a third voltage across a first portion of the upper layer and a first portion of the lower layer, the first portions being joined by the point of contact;

(a-4) measuring a fourth voltage across a second portion of the upper layer and a second portion of the lower layer, the second portions being joined by the point of contact; and

(a-5) determining the difference between the sum of the first and second voltages and the sum of the third and fourth voltages.

13. The method as recited in claim 12, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-1) comprises the substeps of:

(a-1-A) coupling a current source to the first electrode;

(a-1-B) coupling a ground to the second electrode; and

(a-1-C) sampling the voltage at the first electrode and storing it as the first voltage.

14. The method as recited in claim 12, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-2) comprises the substeps of:

(a-2-A) coupling a current source to the third electrode;

(a-2-B) coupling a ground to the fourth electrode; and

(a-2-C) sampling the voltage at the third electrode and storing it as the second voltage.

15. The method as recited in claim 12, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-3) comprises the substeps of:

(a-3-A) coupling a current source to the first electrode;

(a-3-B) coupling a ground to the fourth electrode; and

(a-3-C) sampling the voltage at the first electrode and storing it as the third voltage.

16. The method as recited in claim 12, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-4) comprises the substeps of:

(a-4-A) coupling a current source to the third electrode;

(a-4-B) coupling a ground to the second electrode; and

(a-4-C) sampling the voltage at the third electrode and storing it as the fourth voltage.

17. The method as recited in claim 13, wherein substeps a-1-A and a-3-A comprise the substep of closing a switch between the current source and the first electrode.

18. The method as recited in claim 13, wherein substeps a-2-A and a-4-A comprise the substep of closing a switch between the current source and the third electrode.

19. The method as recited in claim 13, wherein substeps a-1-A and a-4-A comprise the substep of closing a switch between the ground and the second electrode.

20. The method as recited in claim 13, wherein substeps a-2-A and a-3-A comprise the substep of closing a switch between the ground and the fourth electrode.

21. The method as recited in claim 20, wherein step c comprises the substeps of:

(c-1) coupling a voltage source to a first electrode on the upper layer;

(c-2) coupling a ground to a second electrode on the upper layer;

(c-3) sampling the voltage on a third electrode on the lower layer and accepting it as a first position coordinate;

(c-4) coupling the voltage source to the third electrode;

(c-5) coupling the ground to a fourth electrode on the lower layer; and

(c-6) sampling the voltage on the first electrode and accepting it as a second position coordinate.

22. The method as recited in claim 21, wherein substep c-1 comprises the substep of:

(c-1-A) closing a first switch between the voltage source and the first electrode.

23. The method as recited in claim 22, wherein substep c-2 comprises the substep of:

(c-2-A) closing a second switch between the ground and the second electrode.

24. The method as recited in claim 23, wherein substep c-4 comprises the substeps of:

(c-4-A) opening the first switch; and

(c-4-B) closing a third switch between the voltage source and the third electrode.

25. The method as recited in claim 24, wherein substep c-5 comprises the substeps of:

(c-5-A) opening the second switch; and

(c-5-B) closing a fourth switch between the ground and the fourth electrode.

26. A method for determining the contact resistance at a point of contact between the upper and lower layers of a digitizer comprising the steps of:

(a) measuring a first voltage across the upper layer;

(b) measuring a second voltage across the lower layer;

(c) measuring a third voltage across a first portion of the upper layer and a first portion of the lower layer, the first portions being joined by the point of contact;

(d) measuring a fourth voltage across a second portion of the upper layer and a second portion of the lower layer, the second portions being joined by the point of contact; and

(e) determining the difference between the sum of the first and second voltages and the sum of the third and fourth voltages.

27. An apparatus for determining the validity of a point sampled from a digitizer having upper and lower resistive layers, each layer containing a plurality of electrodes, the apparatus comprising:

drive means for driving the digitizer with one of a plurality of drive sources, including a current source coupled to one electrode, and a ground for the current source coupled to another electrode, wherein the one electrode is in the same layer as the other electrode;

selection means coupled to the drive means for determining which drive source is coupled to the digitizer;

means for sensing a predetermined electrical parameter at a predetermined number of electrodes coupled to the digitizer; and

control means coupled between the sensing means and the selection means for controlling the selection means, and for determining the contact resistance between the upper and lower resistive layers at a point of contact between the two layers and comparing the contact resistance to a valid range of contact resistances to either accept or reject the point.

28. The apparatus as recited in claim 27, wherein the control means also determines the coordinates of the point and the drive means further comprises:

a voltage source coupled to the one electrode; and

a ground for the voltage source coupled to another electrode on the same layer as the one electrode.

29. The apparatus as recited in claim 28, wherein the drive means further comprises:

switching means controlled by the selection means for coupling single source and a single ground to the digitizer at a time.

30. The apparatus as recited in claim 27, wherein the selection means comprises a latch.

31. The apparatus as recited in claim 27, wherein the sensing means comprises an analog-to-digital converter.

32. The apparatus as recited in claim 27, wherein the control means comprises a microcontroller.

33. A method for determining the validity of a point sampled from a digitizer having upper and lower resistive layers, each containing a plurality of electrodes, the method comprising the steps of:

(a) determining the contact resistance at a point of contact between the upper and lower layers, including the substeps of;

(a-1) measuring a first voltage across the upper layer, measuring a second voltage across the lower layer;

(a-2) measuring a third voltage across a first portion of the upper layer and a first portion of the lower layer wherein the first portions are joined by the point of contact;

(a-3) measuring a fourth voltage across a second portion of the upper layer and a second portion of the lower layer wherein the second portions are joined by the point of contact;

(a-4) and determining the difference between the sum of the first and second voltages and the sum of the third and fourth voltages;

(b) comparing the contact resistance to a range of valid contact resistances;

(c) if the contact resistance is within the valid range, determining the location of the point; and

(d) accepting the location.

34. The method as recited in claim 33, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-1) comprises the substeps of:

(a-1-A) coupling a current source to the first electrode;

(a-1-B) coupling a ground to the second electrode; and

(a-1-C) sampling the voltage at the first electrode and storing it as the first voltage.

35. The method as recited in claim 33, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-2) comprises the substeps of:

(a-2-A) coupling a current source to the third electrode;

(a-2-B) coupling a ground to the fourth electrode; and

(a-2-C) sampling the voltage at the third electrode and storing it as the second voltage.

36. The method as recited in claim 33, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-3) comprises the substeps of:

(a-3-A) coupling a current source to the first electrode;

(a-3-B) coupling a ground to the fourth electrode; and

(a-3-C) sampling the voltage at the first electrode and storing it as the third voltage.

37. The method as recited in claim 33, wherein the upper layer comprises first and second electrodes and the lower layer comprises third and fourth electrodes, and wherein substep (a-4) comprises the substeps of:

(a-4-A) coupling a current source to the third electrode;

(a-4-B) coupling a ground to the second electrode; and

(a-4-C) sampling the voltage at the third electrode and storing it as the fourth voltage.

38. The method as recited in claim 34, wherein substep (a-1-A) comprises the substep of closing a switch between the current source and the first electrode.

39. The method as recited in claim 35, wherein substep (a-2-A) comprises the substep of closing a switch between the current source and the third electrode.

40. The method as recited in claim 34, wherein substep (a-1-B) comprises the substep of closing a switch between the ground and the second electrode.

41. The method as recited in claim 35, wherein substep (a-2-B) comprises the substep of closing a switch between the ground and the fourth electrode.

42. The method as recited in claim 33, wherein step c comprises the substeps of:

(c-1) coupling a voltage source to a first electrode on the upper layer;

(c-2) coupling a ground to a second electrode on the upper layer;

(c-3) sampling the voltage on a third electrode on the lower layer and accepting it as a first position coordinate;

(c-4) coupling the voltage source to the third electrode;

(c-5) coupling the ground to a fourth electrode on the lower layer; and

(c-6) sampling the voltage on the first electrode and accepting it as a second position coordinate.

43. The method as recited in claim 42, wherein substep c-1 comprises the substep of:

(c-1-A) closing a first switch between the voltage source and the first electrode.

44. The method as recited in claim 43, wherein substep c-2 comprises the substep of:

(c-2-A) closing a second switch between the ground and the second electrode.

45. The method as recited in claim 44, wherein substep c-4 comprises the substeps of:

(c-4-A) opening the first switch; and

(c-4-B) closing a third switch between the voltage source and the third electrode.

46. The method as recited in claim 45, wherein the substep c-5 comprises the substeps of:

(c-5-A) opening the second switch; and

(c-5-B) closing a fourth switch between the ground and the fourth electrode.

47. The method as recited in claim 36, wherein substep (a-3-A) comprises the substep of closing a switch between the current source and the first electrode.

48. The method as recited in claim 37, wherein substep (a-4-A) comprises the substep of closing a switch between the current source and the third electrode.

49. The method as recited in claim 37, wherein substep (a-4-B) comprises the substep of closing a switch between the ground and the second electrode.

50. The method as recited in claim 36, wherein substep (a-3-B) comprises the substep of closing a switch between the ground and the fourth electrode.