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Semiconductor sensor for gamma-ray tomographic imaging system

  • US 5,245,191 A
  • Filed: 04/14/1992
  • Issued: 09/14/1993
  • Est. Priority Date: 04/14/1992
  • Status: Expired due to Term
First Claim
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1. A gamma-ray imaging apparatus for single-photon emission computed tomographic applications comprising, in combination:

  • (a) an aperture imaging system, consisting of a multiple-pinhole aperture in a layer of radiation attenuating material, for providing a field of view through said multiple pinhole aperture;

    (b) a slab of semiconductor material positioned to receive gamma rays from a gamma-ray emitting source in said field of view and capable of absorbing incident gamma rays, wherein said slab of semiconductor material is subjected to an electric field between an electrode attached to the side of the slab exposed to radiation and a plurality of electrodes attached to the other side of the slab, whereby the slab is partitioned into a corresponding plurality of sensor cells individually capable of producing an electric current pulse when a gamma ray is absorbed within the cell;

    (c) a monolithic multiplexer coupled to said plurality of electrodes for the sequential rad-out of electric pulses generated in each of said sensor cells as a result of gamma-ray absorption events, wherein during each cycle of operation of the multiplexer the current-pulse output of each cell is integrated by accumulation in a corresponding capacitor means that is sequentially discharged producing a voltage signal through a single-output channel of the multiplexer and that is then reset for charging during the next cycle of operation; and

    (d) data processing means, coupled to said single-output channel of the multiplexer, for analyzing the voltage signals produced at said single-output channel and for constructing an image corresponding to the gamma-ray emitting source;

    wherein said slab of semiconductor material and said monolithic multiplexer constitute a single gamma-ray detector module.

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