Method and apparatus for forming layout pattern of semiconductor integrated circuit

• US 5,247,456 A
• Filed: 11/08/1988
• Issued: 09/21/1993
• Est. Priority Date: 11/08/1988
• Status: Expired due to Term

• Current Assignee: Fujitsu Semiconductor Limited (Fujitsu Limited)
• Original Assignee: Fujitsu Limited
• Inventors: Ohe, Ryoichi, Yamashita, Koichi
• Primary Examiner(s): Trans, Vincent N.
• Application Number:
  US07/433,334
• Time in Patent Office: 1,778 Days
• Field of Search: 364/488, 364/489, 364/490, 364/491
• US Class Current: 716/102
• CPC Class Codes: G06F 30/39 Circuit design at the physical level physical level design for reconfigurable circuits G06F30/347
• CPC Class Codes: H01L 27/11807 CMOS gate arrays

Abstract

A method and an apparatus is provided for forming a layout pattern of a semiconductor integrated circuit comprising automatically reforming a layout pattern by only carrying out a routing process, when a required layout pattern is the same as an existing layout pattern at the transistor-constitution level. Further, a method or an apparatus is provided for forming a layout pattern of a semiconductor integrated circuit comprising automatically reforming a layout pattern without analyzing the logical information down to the transistor-constitution level, when a required layout pattern is not the same as an existing layout pattern in the transistor-constitution level. Therefore, processing can be simplified and operation speed can be increased.

Claims

1. A method of forming a layout pattern of a semiconductor integrated circuit having regular transistor constitutions, said method comprising:

a step of receiving logical information;

a step of automatically forming the layout pattern by performing a placement process for determining relative positions of transistors and a routing process for determining wiring connections of the transistors at a transistor-constitution level; and

a step of automatically reforming the layout pattern forming a reformed layout pattern by only performing the routing process, when required logical information is the same as existing logical information and a required layout pattern is also the same as an existing layout pattern at the transistor-constitution level, using connection information and layout information of said existing layout pattern.

2. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 1, wherein said logical information is indicated by a logical circuit diagram.

3. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 1, wherein said logical information is indicated by a logical description language.

4. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 1, wherein said required layout pattern and said existing layout pattern comprise a plurality of basic cells including a plurality of transistors.

5. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 4, wherein a pattern of the plurality of transistors in the plurality of basic cells of said required layout pattern is different from that of said existing layout pattern.

6. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 5, wherein a gate length of each of the plurality of transistors in the plurality of basic cells of said required layout pattern is different from that of said existing layout pattern.

7. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 5, wherein a gate width of each of the plurality of transistors in the plurality of basic cells of said required layout pattern is different from that of said existing layout pattern.

8. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 1, wherein said reformed layout pattern is used for forming a cell including some logic gates.

9. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 1, wherein said cell generator is used in a computer aided design system.

10. A method of forming a layout pattern of a semiconductor integrated circuit having regular transistor constitutions, said method comprising:

a step of receiving logical information;

a step of automatically forming the layout pattern by performing a placement process for determining relative positions of transistors and a routing process for determining wiring connections of the transistors at a transistor-constitution level; and

a step of automatically reforming the layout pattern forming a reformed layout pattern without analyzing the logical information down to the transistor-constitution level, when required logical information is the same as existing logical information but a required layout pattern is not the same as an existing layout pattern at the transistor-constitution level, using connection information of said existing layout pattern.

11. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 10, wherein said logical information is indicated by a logical circuit diagram.

12. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 10, wherein said logical information is indicated by a logical description language.

13. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 10, wherein said required layout pattern and said existing layout pattern comprise a plurality of basic cells including a plurality of transistors.

14. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 13, wherein a constitution of the plurality of transistors in the plurality of basic cells of said required layout pattern is different from that of said existing layout pattern.

15. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 10, wherein said reformed layout pattern is used for forming a cell including some logic gates.

16. A method of forming a layout pattern of a semiconductor integrated circuit as claimed in claim 10, wherein said cell generator is used in a computer aided design system.

17. An apparatus for forming a layout pattern of a semiconductor integrated circuit having regular transistor constitutions, said method comprising:

means for receiving logical information and inputting said logical information to a cell generator;

means for automatically forming a layout pattern by performing a placement process for determining relative positions of transistors and a routing process for determining wiring connections of the transistors at a transistor-constitution level;

first reforming means for automatically reforming the layout pattern forming a reformed layout pattern by only performing the routing process, when required logical information is the same as existing logical information and a required layout pattern is also the same as an existing layout pattern at the transistor-constitution level, using connection information and layout information of said exiting layout pattern; and

second reforming means for automatically reforming the layout pattern forming the reformed layout pattern without analyzing the logical information down to the transistor-constitution level, when the required logical information is the same as the existing logical information but the required layout pattern is not the same as the existing layout pattern at the transistor-constitution level, using connection information of said existing layout pattern.

18. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 17, wherein said logical information is indicated by a logical circuit diagram.

19. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 17, wherein said logical information is indicated by a logical description language.

20. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 17, wherein said required layout pattern and said existing layout pattern comprise a plurality of basic cells including a plurality of transistors.

21. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 20, wherein said first reforming means automatically reforms a layout pattern by only performing the routing process, even if the pattern of each of the plurality of transistors in the basic cells of said required layout pattern is different from that of said existing layout pattern.

22. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 21, wherein said first reforming means automatically reforms a layout pattern by only performing the routing process, even if the gate length of each of the plurality of transistors in the plurality of basic cells of said required layout pattern is different from that of said existing layout pattern.

23. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 21, wherein said first reforming means automatically reforms a layout pattern by only performing the routing process, even if the gate width of each of the plurality of transistors in the plurality of basic cells of said required layout pattern is different from that of said existing layout pattern.

24. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 20, wherein said second reforming means automatically reforms a layout pattern without analyzing the logical information down to the transistor-constitution level, when the constitution of each of the plurality of transistors in the plurality of basic cells of said required layout pattern is different from that of said existing layout pattern.

25. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 17, wherein said reformed layout pattern is used for forming a cell including some logic gates.

26. An apparatus for forming a layout pattern of a semiconductor integrated circuit as claimed in claim 17, wherein said cell generator is used in a computer aided design system.