Contact detector using resistance elements and its application
First Claim
1. A contact detector comprising:
- a contact piece for contacting an object;
a strain generative body for transforming a force applied to said contact piece due to contact with an object to a mechanical deformation;
a semiconductor substrate connected to said strain generative body, said substrate including resistance elements having a resistance value varying on the basis of a mechanical deformation transformed by said strain generative body;
said strain generative body being made of a material different from said semiconductor substrate;
an enclosure for containing said strain generative body and said semiconductor substrate, an object contacting end of said contact piece protruding outwardly from said enclosure; and
supporting means for supporting said strain generative body within said enclosure;
said substrate having a flat surface, and wherein an XYZ three-dimensional coordinate system is defined including orthogonal X and Y axes lying in said flat surface and intersecting each other at an origin of said system, wherein said resistance elements are located on an XY plane of the coordinate system, said semiconductor substrate comprising first bridging portions (214,
215) formed along the X-axis on respective both sides of the origin of the coordinate system and second bridging portions (212,
213) formed along the Y-axis on respective both respective both sides of the origin, said first and second bridging portions being fixed to said strain generative body so that strains are produced in said respective bridging portions by applying a force to said contact piece; and
wherein resistance element groups (R) comprising a plurality of said resistance elements are provided on the XY plane of said first and second bridging portions at principal positions as follows;
a) a pair of positions for resistance elements (R13, R15) arranged on both sides of the X-axis in respective positive and negative directions of the Y-axis in the vicinity of said origin in the positive direction of said X-axis,b) a pair of positions for resistance elements (R10, R12)) arranged on both sides of said X-axis in respective positive and negative directions of said Y-axis in the vicinity of said origin in the negative direction of said X-axis,c) a pair of positions for resistance elements (R14, R16) arranged on both sides of said X-axis in respective positive and negative directions of said Y-axis in the vicinity of said fixed portion in the positive direction of said X-axis,d) a pair of positions for resistance elements (R9, R11) arranged on both sides of said X-axis in respective positive and negative directions of said Y-axis in the vicinity of said fixed portion in the negative direction of said X-axis,e) a pair of positions for resistance elements (R5, R7) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said origin in the positive direction of said Y-axis,f) a pair of positions for resistance elements (R2, R4) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said origin in the negative direction of said Y-axis,g) a pair of positions for resistance elements (R6, R8) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said fixed portion in the positive directions of said Y-axis, andh) a pair of positions for resistance elements (R1, R3) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said fixed portion in the negative direction of said Y-axis.
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Abstract
There is disclosed an applied technology of an elementary sensor for sensing a force comprising a transducer for transforming a mechanical deformation to an electric signal, and a first strain generative body (20) including a supporting portion (21) and a working portion (23) connected to the transducer so as to allow the transducer to produce a mechanical deformation on the basis of a displacement relative to the supporting portion of the working portion. By further adding a second strain generative body (30) including a fixed portion (31) fixed at least with respect to the direction of a force to be detected, and a displacement portion (33) connected to the working portion of the first strain generative body, wherein the displacement portion is constructed to produce a displacement based on a given external force relative to the fixed portion to transmit the displacement thus produced to the working portion of the first strain generative body, a force detector applicable to a wide variety of measurement ranges can be realized. Moreover, by allowing the displacement portion to be elongated, a detector suitable for measurement of both force and moment can be provided. In addition, an embodiment to connect stylus (306) to the elementary sensor to apply it to a contact detector, and an embodiment to affix the elementary sensor at the hand of a robot to apply it to a gripper for robot are disclosed.
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Citations
5 Claims
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1. A contact detector comprising:
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a contact piece for contacting an object; a strain generative body for transforming a force applied to said contact piece due to contact with an object to a mechanical deformation; a semiconductor substrate connected to said strain generative body, said substrate including resistance elements having a resistance value varying on the basis of a mechanical deformation transformed by said strain generative body; said strain generative body being made of a material different from said semiconductor substrate; an enclosure for containing said strain generative body and said semiconductor substrate, an object contacting end of said contact piece protruding outwardly from said enclosure; and supporting means for supporting said strain generative body within said enclosure; said substrate having a flat surface, and wherein an XYZ three-dimensional coordinate system is defined including orthogonal X and Y axes lying in said flat surface and intersecting each other at an origin of said system, wherein said resistance elements are located on an XY plane of the coordinate system, said semiconductor substrate comprising first bridging portions (214,
215) formed along the X-axis on respective both sides of the origin of the coordinate system and second bridging portions (212,
213) formed along the Y-axis on respective both respective both sides of the origin, said first and second bridging portions being fixed to said strain generative body so that strains are produced in said respective bridging portions by applying a force to said contact piece; andwherein resistance element groups (R) comprising a plurality of said resistance elements are provided on the XY plane of said first and second bridging portions at principal positions as follows; a) a pair of positions for resistance elements (R13, R15) arranged on both sides of the X-axis in respective positive and negative directions of the Y-axis in the vicinity of said origin in the positive direction of said X-axis, b) a pair of positions for resistance elements (R10, R12)) arranged on both sides of said X-axis in respective positive and negative directions of said Y-axis in the vicinity of said origin in the negative direction of said X-axis, c) a pair of positions for resistance elements (R14, R16) arranged on both sides of said X-axis in respective positive and negative directions of said Y-axis in the vicinity of said fixed portion in the positive direction of said X-axis, d) a pair of positions for resistance elements (R9, R11) arranged on both sides of said X-axis in respective positive and negative directions of said Y-axis in the vicinity of said fixed portion in the negative direction of said X-axis, e) a pair of positions for resistance elements (R5, R7) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said origin in the positive direction of said Y-axis, f) a pair of positions for resistance elements (R2, R4) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said origin in the negative direction of said Y-axis, g) a pair of positions for resistance elements (R6, R8) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said fixed portion in the positive directions of said Y-axis, and h) a pair of positions for resistance elements (R1, R3) arranged on both sides of said Y-axis in respective positive and negative directions of said X-axis in the vicinity of said fixed portion in the negative direction of said Y-axis.
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2. A contact detector comprising:
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a contact piece for contacting an object; a strain generative body for transforming a force applied to said contact piece due to contact with an object to a mechanical deformation; a semiconductor substrate connected to said strain generative body, said substrate including resistance elements having a resistance value varying on the basis of a mechanical deformation transformed by said strain generative body; said strain generative body being made of a material different from said semiconductor substrate; an enclosure for containing said strain generative body and said semiconductor substrate, an object contacting end of said contact piece protruding outwardly from said enclosure; and supporting means for supporting said strain generative body within said enclosure; wherein two sets, each comprising four of said resistance elements, are provided for detecting a component of contact along a respective one of at least two axes of a three-dimensional coordinate system; and wherein said strain generative body includes a supporting portion secured to said enclosure by said supporting means, a working portion for receiving a force applied to said contact piece, and a flexible portion provided between an interconnecting said supporting portion and said working portion. - View Dependent Claims (3, 4, 5)
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Specification