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High voltage boosted word line supply charge pump regulator for DRAM

  • US 5,267,201 A
  • Filed: 04/05/1991
  • Issued: 11/30/1993
  • Est. Priority Date: 04/06/1990
  • Status: Expired due to Term
First Claim
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1. A dynamic random access memory (DRAM) word line supply comprising:

  • (a) a voltage supply Vpp increasing from a voltage level insufficient to enable a memory cell access transistor for the word line toward a voltage level sufficient to enable said access transistor, for connection to the word line from time to time,(b) the memory cell access transistor for connecting a memory cell capacitor to a bit line, having a gate connected to the word line,(c) a sample transistor similar to the memory cell access transistor;

    (d) means for applying the increasing voltage supply to the sample transistor for causing the sample transistor to conduct, under voltage supply conditions similar to those required by the memory cell access transistor,(e) means for inhibiting increase of the voltage supply upon turn-on of the sample transistor,whereby the voltage supply having the voltage level sufficient to turn-on the memory cell access transistor is provided for connection to the word line.

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