Image sensor and image sensor chips therefor including dummy photocells and internal discharge switches

• US 5,268,765 A
• Filed: 04/15/1992
• Issued: 12/07/1993
• Est. Priority Date: 04/15/1991
• Status: Expired due to Term

• Current Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Original Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Inventors: Yamashita, Hiromi
• Primary Examiner(s): Mancuso, Joseph
• Assistant Examiner(s): GARBER, WENDY RAE
• Application Number:
  US07/868,679
• Time in Patent Office: 601 Days
• Field of Search: 358/213.31, 358/213.16, 358/213.11, 358/482, 358/494, 250/208.1, 250/578
• US Class Current: 348/245
• CPC Class Codes: H04N 25/63 applied to dark current
• CPC Class Codes: H04N 25/7013 using abutted sensors forming a long line
• CPC Class Codes: H04N 25/75 Circuitry for providing, modifying or processing image signals from the pixel array

Abstract

An image sensor and image sensor chip therefor which generates a reference level for the dark output during the blanking period of the sensor and which provides internal switching for removing residual charge from a waveform shaping capacitor. In one embodiment, image sensor chips are arranged in a line and cascaded to form an image sensor and a dummy photocell is provided which is configured similarly to the image sensor photocells and which has its windows shielded from light. A dummy select switch selectively makes connections with a signal line to which the signals from the image sensor photocells are outputted. The dummy select switch remains closed after completion of the drive period of the photocells at the last image sensor chip and the output of the dummy photocell is used as the reference level for the dark output during the blanking period. In another aspect of the invention, a switch is provided within the chip to remove residual charge from the waveform shaping capacitor.

Claims

1. An image sensor chip, comprising:

a plurality of photocells arranged in a line, each of said photocells generating an image signal output indicative of a level of brightness of light reflected thereon, such as from a document or the like;

a signal line for outputting image signals from each of said plurality of photocells;

means for sequentially connecting each of said photocell outputs individually to said signal line;

a chip select switch for connecting said signal line to an external terminal during a period in which said photocell outputs are being sequentially connected to said signal line;

a dummy photocell which is shielded from light;

a dummy select switch for selectively connecting said dummy photocell to said signal line;

means for generating a dummy select switch signal subsequent to said period in which said photocell outputs are being sequentially connected to said signal line; and

control means for selectively applying said dummy select switch signal to said dummy select switch in response to an external condition.

2. The image sensor chip of claim 1, wherein said external condition corresponds to a connection of said image sensor chip as a last stage of an image sensor formed of a plurality of image sensor chips coupled in stages.

3. The image sensor chip of claim 1, wherein said external condition corresponds to a connection of said image sensor chip to a node of fixed electric potential.

4. The image sensor chip of claim 3, wherein said node of fixed electric potential is at ground potential.

5. An image sensor formed of a plurality of image sensor chips cascaded with each other in stages, each of said image sensor chips comprising:

a plurality of photocells arranged in a line, each of said photocells generating an image signal output indicative of a level of brightness of light reflected thereon, such as from a document or the like;

a signal line for outputting image signals from each of said plurality of photocells;

means for sequentially connecting each of said photocell outputs individually to said signal line;

a chip select switch for connecting said signal line to an external terminal during a period in which said photocell outputs are being sequentially connected to said signal line;

a dummy photocell which is shielded from light;

a dummy select switch for selectively connecting said dummy photocell to said signal line;

means for generating a dummy select switch signal subsequent to said period in which said photocell outputs are being sequentially connected to said signal line; and

control means for selectively applying said dummy select switch signal to said dummy select switch in response to an external condition.

6. The image sensor of claim 5, wherein said external condition corresponds to a connection of an image sensor chip as a last stage of said image sensor.

7. The image sensor of claim 5, wherein said external condition corresponds to a connection of an image sensor chip to a node of fixed electric potential.

8. The image sensor of claim 7, wherein said node of fixed electric potential is at ground potential.

9. An image sensor chip for a contact-type image sensor, comprising:

a plurality of photocells each of which outputs a current signal upon detection of light incident thereon;

a plurality of channel select switches respectively connected to outputs of said photocells;

shift register means for sequentially activating said channel select switches in response to a shift signal and successive clock pulses so as to sequentially output said current signals at a signal output terminal via a common signal line;

a chip select switch connected between said common signal line and said signal output terminal and being closed only during the operation of said shift register means; and

a switch connected at one end thereof between said chip select switch and said signal output terminal, and at another end thereof to ground, said switch opening and closing in accordance with high and low levels of said clock pluses.

10. The image sensor chip of claim 9, wherein said switch is closed in response to high levels of said clock pulses, so as to discharge a waveform-shaping capacitor coupled to said signal output terminal.

11. An image sensor formed of a plurality of image sensor chips cascaded with each other in stages and mounted on a board having an output terminal and a waveform-shaping capacitor coupled to said output terminal, each of said image sensor chips comprising:

a plurality of photocells each of which outputs a current signal upon detection of light incident thereon;

a plurality of channel select switches respectively connected to outputs of said photocells;

shift register means for sequentially activating said channel select switches in response to a shift signal and successive clock pulses so as to sequentially output said current signals via a common signal line to a signal output terminal coupled to the output terminal of said board;

a chip select switch connected between said common signal line and said signal output terminal and being closed only during the operation of said shift register means; and

a switch connected at one end thereof between said chip select switch and said signal output terminal, and at another end thereof to ground, said switch opening and closing in accordance with high and low levels of said clock pulses.