Atomic layer epitaxy of compound semiconductor
First Claim
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1. A process for growing a crystalline compound semiconductor, comprising the steps of:
- heating a crystalline substrate to a predetermined temperature in a vacuum chamber, andat said predetermined temperature of the crystalline substrate and in the following sequence;
supplying a first source gas for a III-group element containing an organic In compound diluted with hydrogen over said crystalline substrate under a predetermined pressure,discharging the first source gas,supplying a second source gas for a first V-group element over said crystalline substrate under a predetermined pressure,discharging the second source gas,supplying a third source gas for a III-group element containing an organic In compound diluted with hydrogen over said crystalline substrate under a predetermined pressure,discharging the third source gas,supplying a fourth source for a second V-group element over said crystalline substrate under a predetermined pressure, anddischarging the forth source gas,wherein said first and second V-group elements have at least different compositions or different constituent elements.
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Abstract
A heterojunction between In-containing compound semiconductors in which the interface thereof is controlled at an atom level is provided by a process of atomic layer epitaxy (ALE) in which hydrogen gas is utilized as a carrier gas and as a purge gas for a separation of source gases. The time for which the purge gas is supplied can be utilized for controlling the ALE.
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12 Claims
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1. A process for growing a crystalline compound semiconductor, comprising the steps of:
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heating a crystalline substrate to a predetermined temperature in a vacuum chamber, and at said predetermined temperature of the crystalline substrate and in the following sequence; supplying a first source gas for a III-group element containing an organic In compound diluted with hydrogen over said crystalline substrate under a predetermined pressure, discharging the first source gas, supplying a second source gas for a first V-group element over said crystalline substrate under a predetermined pressure, discharging the second source gas, supplying a third source gas for a III-group element containing an organic In compound diluted with hydrogen over said crystalline substrate under a predetermined pressure, discharging the third source gas, supplying a fourth source for a second V-group element over said crystalline substrate under a predetermined pressure, and discharging the forth source gas, wherein said first and second V-group elements have at least different compositions or different constituent elements. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A process for growing a crystalline compound semiconductor, comprising the steps of:
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supplying a III-group element source gas over a crystalline substrate, supplying a hydrogen gas over the crystalline substrate to purge away the III-group element source gas for a time, supplying a V-group element source gas over the crystalline substrate, and supplying a hydrogen gas over the crystalline substrate to purge away the V-group element source gas for a time, and repeating said steps to grow a III-V compound semiconductor layer on the crystalline substrate, wherein said time of supplying the hydrogen gas for said purge is controlled to thereby control a growth rate of said compound semiconductor.
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12. A process for growing a crystalline compound semiconductor, comprising the steps of:
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supplying a III-group element source gas over a crystalline substrate, supplying a hydrogen gas over the crystalline substrate to purge away the III-group element source gas, supplying a V-group element source gas over the crystalline substrate, supplying a hydrogen gas over the crystalline substrate to purge away the V-group source gas, and supplying a dopant source over the crystalline substrate, and repeating the above steps to grow a doped III-V compound semiconductor layer on the crystalline substrate for a time, wherein said time of supplying the hydrogen gas is controlled to thus control a concentration of said dopant in said doped-III-V compound semiconductor layer.
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Specification