Probe for measuring surface roughness by sensing fringe field capacitance effects

• US 5,270,664 A
• Filed: 05/19/1992
• Issued: 12/14/1993
• Est. Priority Date: 10/03/1990
• Status: Expired due to Fees

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: McMurtry, David R., Thomas, David K.
• Primary Examiner(s): Strecker, Gerard R.
• Assistant Examiner(s): DO, DIEP N
• Application Number:
  US07/857,939
• Time in Patent Office: 574 Days
• Field of Search: 324/662, 324/663, 324/671, 324/686, 324/687, 324/688, 324/690, 324/158 P
• US Class Current: 324/690
• CPC Class Codes: G01B 7/023 for measuring distance between sensor and object G01B7/082 and G01B7/102 take precedence
• CPC Class Codes: G01B 7/28 for measuring contours or curvatures
• CPC Class Codes: G01B 7/34 for measuring roughness or irregularity of surfaces

Abstract

A capacitance sensing probe is disclosed for taking measurements of features on a workpiece surface. The probe has two electrodes (E₁, E₂) spaced apart in the direction of movement of the probe with the electrodes being disposed in an attitude normal to the surface. Only the edge of the electrodes are exposed to the surface and an electric circuit (EC) is provided for determining the effect of the surface on the fringe field capacitance between the electrodes. Guard electrodes are used to reduce the stray capacitance being measured. Various embodiments are shown with different numbers and arrangements of electrodes.

Claims

1. A probe for measuring a surface roughness profile of a surface of a body along a measurement direction across the surface, the probe comprising;

a pair of electrodes; and

an electric circuit comprising means for determining the effect of the surface on a capacitance between the pair of electrodes as the probe is moved over the surface, wherein the pair of electrodes comprise thin plates mounted confronting each other in a spaced apart relationship, surface planes of the pair of electrodes being parallel to each other and substantially normal to the surface as the probe is moved a layer of electrical insulating material being provided between the pair of electrodes, and a total distance across the two electrodes including the insulating material therebetween being in the range of 0.1 to 10 microns.

2. The probe of claim 1, wherein each electrode of the pair of the electrodes is formed as a layer on a substrate by a deposition process.

3. The probe of claim 1, wherein the electrical circuit further comprises means for determining an effect of the surface on capacitances between each one of the pair of electrodes and the surface.

4. The probe of claim 1, wherein the probe comprises a rounded skid within which the pair of electrodes are mounted, edges of the pair of electrodes positioned adjacent to but spaced a small fixed distance from a surface of the skid.

5. The probe of claim 1, wherein the probe comprises a probe body, and a stylus protruding from the probe body, sad stylus having a longitudinal axis and terminating in a ball, the pair of electrodes comprising a pair of circular disk-shaped electrodes mounted adjacent a diameter of the ball, the pair of circular disk-shaped electrodes being substantially normal to and spaced apart along the direction of the longitudinal axis of the stylus.

6. A method for measuring a surface roughness profile of a body using a probe, the probe comprising an electrical circuit, a pair of thin plate electrodes and an electrical insulating material provided between the pair of thin plate electrodes, the total distance between the pair of thin plate electrodes in a measurement direction being in a range of 0.1 microns to 10 microns, the method comprising the steps of:

orienting the probe so that surface planes of the pair of thin plate electrodes are substantially normal to the surface and edges of the pair of thin plate electrodes are substantially parallel to the surface;

bringing the probe into close proximity to the surface;

moving the probe over the surface in a direction substantially normal to the surface planes of the pair of thin plate electrodes while measuring a capacitance between the pair of thin plate electrodes; and

determining a distance between the pair of thin plate electrodes and the surface of the body in response to the measured capacitance.

7. The method of claim 6, further comprising the step of simultaneously measuring a capacitance between each electrode and the surface.

8. A probe for measuring a surface roughness profile of a surface of a body along a measurement direction across the surface, the probe comprising:

at least three electrodes; and

an electric circuit comprising means for determining the effect of the surface on capacitances between each pair of adjacent electrodes as the probe is moved over the surface, wherein the at least three electrodes comprise at least three thin plates positioned in the probe in a spaced apart relationship, surface planes of the at least three thin plates being parallel to each other and substantially normal to the surface as the probe is moved; and

a layer of electrical insulating material provided between each pair of adjacent electrodes, such that a total distance across each pair of electrodes is in a range of 0.1 micron to 10 microns.