Method and structure for programming floating gate memory cells

• US 5,272,669 A
• Filed: 02/20/1991
• Issued: 12/21/1993
• Est. Priority Date: 02/20/1991
• Status: Expired due to Term

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: SunDisk Corporation (Seagate Technology Holdings Plc)
• Inventors: Fong, Yupin K., Samachisa, Gheorghe
• Primary Examiner(s): Heyman, John S.
• Application Number:
  US07/658,098
• Time in Patent Office: 1,035 Days
• Field of Search: 365/185, 365/218, 365/900, 357/23.5
• US Class Current: 365/185.3
• CPC Class Codes: G11C 11/5621 using charge storage in a floating gate
• CPC Class Codes: G11C 16/14 Circuits for erasing electrically, e.g. erase voltage switching circuits
• CPC Class Codes: G11C 16/3404 Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
• CPC Class Codes: G11C 16/3409 Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step
• CPC Class Codes: G11C 16/3413 Circuits or methods to recover overprogrammed nonvolatile memory cells detected during program verification, usually by means of a "soft" erasing step

Abstract

A novel method and structure are taught for narrowing the distribution of charge on the floating gates after electrical erasure of a population of cells. This allows faster programming following erasure. An additional recovery step is performed after erasure and prior to programming. The recovery step serves to adjust the state of erasure of the cells such that the distribution of the amount of erasure of each cell in the population of cells is reduced. This is accomplished in order to cause those cells which would have a relatively high floating gate voltage V_FG after erasure to be recovered such that their floating gate voltage is made less positive, while having little or no effect on the floating gate voltage of cells which are not overerased. The recovery is performed either as a final step in the erase operation, a separate recovery step independent of the erase or program operations, or as a preliminary step during the programming operation. Recovery can be performed on all memory cells simultaneously, blocks or groups of memory cells in sequence, or individual memory cells in sequence. The recovery step is performed utilizing a low control gate voltage, which voltage is approximately equal to or slightly greater than the threshold voltage of the select transistor, which generates a relatively high floating gate current for over-erased cells, causing them to be significantly less over-erased.

Claims

1. A method for operating an Electrically Erasable Programmable Read Only Memory (EEPROM) having a plurality of memory cells, each of said memory cells comprising a source, a drain, a channel region having a first and a second portion lying between said source and drain with said second portion adjacent said source and serving as the channel of a select transistor, a floating gate above said first portion of said channel region, and a control gate having a first portion above said floating gate and a second portion above said second portion of said channel region, comprising the steps of:

erasing a plurality of said memory cells; and

performing a recovery step by applying a potential voltage difference between said source and drain of sufficient magnitude for hot electron programming to occur, and a voltage approximately equal to the threshold voltage of said second portion of said channel region of said memory cells to said control gate, in which the floating gate voltages of said overerased cells are reduced while substantially not affecting the floating gate voltages of memory cells which are not overerased, whereby those of said plurality of said memory cells which have been overerased during said step of erasing are made to be less overerased in preparation for a subsequent programming step.

2. A method as in claim 1 wherein said recovery step comprises the step of causing a floating gate current to flow in said overerased memory cells, while causing a floating gate current to flow in those memory cells which are not overerased which is significantly less than the floating gate current in said overerased memory cells.

3. A method as in claim 2 wherein said floating gate current during recovery is greater for cells which are more overerased during recovery for cells which are less overerased.

4. A method as in claim 1 wherein said step of recovery is performed utilizing a relatively high drain voltage within the range of approximately 6 to 9 volts.

5. A method as in claim 1 wherein said step of recovery is performed utilizing a relatively low drain voltage within the range of approximately 4 to 6 volts in order to reduce drain hot carrier injection.

6. A method as in claim 4 wherein said subsequent programming step is performed utilizing a relatively high drain voltage within the range of approximately 6 to 9 volts and a relatively high control gate voltage within the range of approximately 8 to 12 volts.

7. A method as in claim 5 wherein said subsequent programming step is performed utilizing a relatively high drain voltage within the range of approximately 6 to 9 volts and a relatively high control gate voltage within the range of approximately 8 to 12 volts.

8. A method as in claim 4 wherein said step of recovery further utilizes a positive voltage coupled to said floating gate.

9. A method as in claim 8 wherein said positive voltage is coupled to said floating gate through an erase gate.

10. A method as in claim 5 wherein said step of recovery further utilizes a positive voltage coupled to said floating gate.

11. A method as in claim 10 wherein said positive voltage is coupled to said floating gate through an erase gate.

12. A method as in claim 1 wherein said step of recovery further utilizes a positive voltage coupled to said floating gate.

13. A method as in claim 12 wherein said positive voltage is coupled to said floating gate through an erase gate.

14. A method for operating an EEPROM comprising a plurality of memory cells which in turn comprise a first plurality of overerased memory cells and a second plurality of non-overerased memory cells, each of said memory cells comprising a source, a drain, a channel region having a first and a second portion lying between said source and drain with said second portion adjacent said source and serving as the channel of a select transistor, a floating gate above said first portion of said channel region, and a control gate having a first portion above said floating gate and a second portion above said second portion of said channel region, comprising the steps of:

performing a recovery step to cause said first plurality of overerased memory cells to become less overerased by applying a potential voltage difference between said source and drain of sufficient magnitude for hot electron programming to occur, and a voltage approximately equal to the threshold voltage of said second portion of said channel region of said memory cells to said control gate, in which the floating gate voltages of said overerased cells are reduced while substantially not affecting the floating gate voltages of memory cells which are not overerased; and

programming said first and second plurality of memory cells.

15. A method as in claim 14 wherein said recovery step comprises the step of causing a floating gate current to flow in said overerased memory cells, while causing a floating gate current to flow in those memory cells which are not overerased which is significantly less than the floating gate current in said overerased memory cells.

16. A method as in claim 15 wherein said floating gate current during recovery is greater for cells which are more overerased than said floating gate current during recovery for cells which are less overerased.

17. A method as in claim 14 wherein said step of recovery is performed utilizing a relatively high drain voltage within the range of approximately 6 to 9 volts.

18. A method as in claim 14 wherein said step of recovery is performed utilizing a relatively low drain voltage within the range of approximately 4 to 6 volts in order to reduce drain hot carrier injection.

19. A method as in claim 17 wherein said subsequent programming step is performed utilizing a relatively high drain voltage within the range of approximately 6 to 9 volts and a relatively high control gate voltage within the range of approximately 8 to 12 volts.

20. A method as in claim 18 wherein said subsequent programming step is performed utilizing a relatively high drain voltage within the range of approximately 6 to 9 volts and a relatively high control gate voltage within the range of approximately 8 to 12 volts.

21. A method as in claim 17 wherein said step of recovery further utilizes a positive voltage coupled to said floating gate.

22. A method as in claim 21 wherein said positive voltage is coupled to said floating gate through an erase gate.

23. A method as in claim 18 wherein said sep of recovery further utilizes a positive voltage coupled to said floating gate.

24. A method as in claim 23 wherein said positive voltage is coupled to said floating gate through an erase gate.

25. A method as in claim 14 wherein said step of recovery further utilizes a positive voltage coupled to said floating gate.

26. A method as in claim 25 wherein said positive voltage is coupled to said floating gate through an erase gate.