Parallel circuit module including a diode and an IGBT
First Claim
Patent Images
1. A module having a semiconductor substrate for providing thereon an insulated gate bipolar transistor (IBGT) and a diode, said IGBT and said diode being electrically connected in an anti-parallel fashion in said module,wherein assuming a value of di/dt attained, for a turn-on rise time of 0.5 μ
- s of the said IGBT with a voltage equal to half a rated voltage thereof and at room temperature of said semiconductor substrate, is α
max, where i represents the current through said IGBT and α
max represents the maximum value of di/dt the recovery characteristic of said diode, in the parallel connection, is such that a peak-to-peak value (IRP) of a recovery current thereof is less than 0.55 times the rated current (IF) when said diode is recovered at the rated current IF to the value of di/dt corresponding to α
max, and a recovery time thereof, in which the recovery current is attenuated from the peak-to-peak value IRP to one tenth thereof, is at least 0.75 times a resonance period determined by the sum of parasitic capacitances associated with said IGBT and said diode and a wiring inductance existing in said module.
1 Assignment
0 Petitions
Accused Products
Abstract
In a module using a high-speed switching element such as an IGBT for a high-speed inverter, a matching condition is established between the switching characteristic of the IGBT and the recovery characteristic of the diode to be connected thereto in an anti-parallel fashion. As a result, the oscillating voltage appearing in the inverter circuit is suppressed to prevent erroneous operation of the inverter system.
-
Citations
1 Claim
-
1. A module having a semiconductor substrate for providing thereon an insulated gate bipolar transistor (IBGT) and a diode, said IGBT and said diode being electrically connected in an anti-parallel fashion in said module,
wherein assuming a value of di/dt attained, for a turn-on rise time of 0.5 μ - s of the said IGBT with a voltage equal to half a rated voltage thereof and at room temperature of said semiconductor substrate, is α
max, where i represents the current through said IGBT and α
max represents the maximum value of di/dt the recovery characteristic of said diode, in the parallel connection, is such that a peak-to-peak value (IRP) of a recovery current thereof is less than 0.55 times the rated current (IF) when said diode is recovered at the rated current IF to the value of di/dt corresponding to α
max, and a recovery time thereof, in which the recovery current is attenuated from the peak-to-peak value IRP to one tenth thereof, is at least 0.75 times a resonance period determined by the sum of parasitic capacitances associated with said IGBT and said diode and a wiring inductance existing in said module.
- s of the said IGBT with a voltage equal to half a rated voltage thereof and at room temperature of said semiconductor substrate, is α
Specification