Reference pattern adapting device trainable by a small number of training patterns

• US 5,274,737 A
• Filed: 07/31/1991
• Issued: 12/28/1993
• Est. Priority Date: 07/31/1990
• Status: Expired due to Term

• Current Assignee: NEC Corporation
• Original Assignee: NEC Corporation
• Inventors: Shinoda, Koichi
• Primary Examiner(s): Knepper, David D.
• Application Number:
  US07/738,641
• Time in Patent Office: 881 Days
• Field of Search: 395/2, 381/41-43
• US Class Current: 704/245
• CPC Class Codes: G10L 15/063 Training

Abstract

In a reference pattern adapting device for adapting reference pattern parameter groups (1-M) to adapted reference pattern parameter groups (1-M) by using training patterns (1-L) derived from a training pattern signal (TP). A similarity calculating unit (15) calculates a group of primary degrees of similarity between (a) each of M reference pattern element groups representative of reference patterns (output of a vector group memory 11) and (b) each of M reference pattern parameter groups (output of pattern parameter memory 12). A difference calculating unit (16) calculates a group of differences between reference pattern elements of each of the M reference pattern element groups and training pattern elements of each of L training pattern element groups representative of the training patterns (1-L). A first calculating unit (21) calculates a primary difference value by using the group of primary degrees of similarity and the group of differences. A second calculating unit (22) calculates a group of primary mean values by using each of L reference pattern parameter groups and the group of differences. The resulting group of primary mean values is output to an identifier (25) as one of L adapted pattern parameter groups.

Claims

1. A reference pattern adapting device for using first through L-th training patterns in adapting first through M-th reference pattern parameter groups to first through M-th adapted pattern parameter groups, where M represents a first integer, L represents a second integer which is not greater than said first integer, said first through said M-th reference pattern parameter groups characterizing first through M-th reference patterns, said first reference pattern parameter group through an L-th reference pattern group being classified into a first class, an (L+1)-th reference pattern parameter group through said M-th reference pattern parameter group being classified into a second class, said device comprising:

an element group memory for memorizing first through M-th groups of reference pattern elements as first through M-th memorized pattern element groups, said first through said M-th groups representing said first through said M-th reference patterns;

an extracting unit supplied with said first through said L-th training patterns for extracting a group of training pattern elements representative of one of said first through said L-th training patterns at a time from said first through said L-th training patterns, said group of training pattern elements corresponding to one of said first through said L-th reference pattern parameter groups;

a pattern parameter memory for memorizing said first through said M-th reference pattern parameter groups as first through M-th memorized pattern parameter groups;

a correspondence establishing unit connected to said element group memory and said extracting unit for establishing correspondence between the reference pattern elements of each of said first memorized pattern element group through an L-th memorized pattern element group and the training pattern elements of said group into a plurality of pairs, said first through said L-th memorized pattern element groups representing said first reference pattern through an L-th reference pattern characterized by said first through said L-th reference pattern parameter groups, each of said pairs consisting of one of the reference pattern elements of each of said first through said L-th memorized pattern element groups and one of the training pattern elements that corresponds in said group of training pattern elements to said one of the reference pattern elements;

a similarity calculating unit connected to said element group memory and said pattern parameter memory for calculating a group of primary degrees of similarity between each of said first memorized pattern element group through an L-th memorized pattern element group and each of said first memorized pattern parameter group through an L-th memorized pattern parameter group to produce a group of primary calculation results representative of said primary degrees of similarity, said L-th memorized pattern element group being the L-th group of reference pattern elements which is memorized in said element group memory to represent an L-th reference pattern characterized by said L-th reference pattern parameter group, said L-th memorized pattern parameter group being the L-th reference pattern parameter group memorized in said pattern parameter memory;

a difference calculating unit connected to said correspondence establishing unit for calculating a group of differences between the reference pattern elements and the training pattern elements in said plurality of pairs to produce a difference signal representative of said group of differences;

a first calculating unit connected to said similarity calculating unit and said difference calculating unit for calculating a group of primary difference values by using said group of primary degrees of similarity and said group of differences to produce a group of primary difference calculation results representative of said group of said primary difference values; and

a second calculating unit connected to said pattern parameter memory and said first calculating unit for calculating a group of primary means values by using said each of the first through the L-th memorized pattern parameter groups and said group of said primary difference values to produce a group of secondary calculation results representative of said group of primary means values as one of said first adapted pattern parameter group through an L-th adapted pattern parameter group among said first through said M-th adapted pattern parameter groups.

2. A reference pattern adapting device as claimed in claim 1, further comprising:

a difference value memory connected to said first calculating unit for memorizing said group of said primary difference values as a memorized difference value group;

said similarity calculating unit further calculating a group of secondary degrees of similarity between each of said first through said L-th memorized pattern parameter groups and each of an (L+1)-th memorized pattern parameter group through said M-th memorized pattern parameter group to produce a group of secondary calculation results representative of said group of secondary degrees of similarity, said (L+1)-th memorized pattern parameter group being the (L+1)-th reference pattern parameter group memorized in said pattern parameter memory;

said first calculating unit being supplied with said memorized difference value group for further calculating a group of secondary difference values by using said group of secondary degrees of similarity and said memorized difference value group to produce a group of secondary difference calculation results representative of said group of said secondary difference values;

said second calculating unit further calculating a group of secondary mean values by using each of said (L+1)-th through said M-th memorized pattern parameter groups and said group of said secondary difference values to produce another group of secondary calculation results representative of said group of secondary mean values as one of an (L+1)-th adapted pattern parameter group through said M-th adapted pattern parameter group among said first through said M-th adapted pattern parameter groups.

3. A reference pattern adapting device as claimed in claim 1, wherein said similarity calculating unit further calculates a group of secondary degrees of similarity between each of said first through said L-th memorized pattern parameter groups and each of an (L+1)-th memorized pattern parameter group through said M-th memorized pattern parameter group to produce a group of secondary calculation results representative of said group of secondary degrees of similarity, said (L+1)-th memorized pattern parameter group being the (L+1)-th reference pattern parameter group memorized in said pattern parameter memory, said device further comprising:

a mean value memory connected to said second calculating unit for memorizing said group of primary mean values as a memorized mean value group; and

a third calculating unit connected to said similarity calculating unit and said mean value memory for calculating a group of secondary mean values by using said group of secondary degrees of similarity and said memorized mean value group to produce another group of secondary calculation results representative of said group of secondary mean values as one of an (L+1)-th adapted pattern parameter group through said M-th adapted pattern parameter group among said first through said M-th adapted pattern parameter groups.

4. A reference pattern adapting device for using first through L-th training patterns in adapting first through M-th reference pattern parameter groups to first through M-th adapted pattern parameter groups, where M represents a first integer, L represents a second integer which is not greater than said first integer, said first through said M-th reference pattern parameter groups characterizing first through M-th reference patterns, said first reference pattern parameter group through an L-th reference pattern parameter group being classified into a first class, an (L+1)-th reference pattern parameter group through said M-th reference pattern parameter group being classified into a second class, said device comprising:

an element group memory for memorizing first through M-th groups of reference pattern elements as first through M-th memorized pattern element groups, said first through said M-th groups representing said first through said M-th reference patterns;

an extracting unit supplied with said first through said L-th training patterns for extracting a group of training pattern elements representative of one of said first through said L-th training patterns at a time from said first through said L-th training patterns, said group of training pattern elements corresponding to one of said first through said L-th reference pattern parameter groups;

a pattern parameter memory for memorizing said first through said M-th reference pattern parameter groups as first through M-th memorized pattern parameter groups;

a primary similarity calculating unit connected to said element group memory and said pattern parameter memory for calculating a group of primary degrees of similarity between each of said first memorized pattern element group through an L-th memorized pattern element group and each of said first memorized pattern parameter group through an L-th memorized pattern parameter group to produce a group of primary calculation results representative of said group of primary degrees of similarity, said L-th memorized pattern element group being the L-th group of reference pattern elements which is memorized in said element group memory to represent an L-th reference pattern characterized by said L-th reference pattern parameter group, said memorized pattern parameter group being the L-th reference pattern parameter group memorized in said pattern parameter memory;

a first calculating unit connected to said extracting unit and said primary similarity calculating unit for calculating a group of primary mean values by using said group of training pattern elements and said group of primary degrees of similarity to produce a group of primary calculation results representative of said group of primary mean values as one of said first adapted pattern parameter group through an L-th adapted pattern parameter group among said first through said M-th adapted pattern parameter groups;

a difference calculating unit connected to said pattern parameter memory and said first calculating unit for calculating a group of differences between each of said first through said L-th memorized pattern parameter groups and said group of primary mean values to produce a difference signal representative of said group of differences;

a secondary similarity calculating unit connected to said pattern parameter memory for calculating a group of secondary degrees of similarity between each of said first through said L-th memorized pattern parameter groups and each of an (L+1)-th memorized pattern parameter group through said M-th memorized pattern parameter group to produce a group of secondary calculation results representative of said group of secondary degrees of similarity;

a second calculating unit connected to said difference calculating unit and said secondary similarity calculating unit for calculating a group of difference values by using said group of differences and said group of secondary degrees of similarity to produce a group of second calculation results representative of said group of said difference values; and

a third calculating unit connected to said pattern parameter memory and said second calculating unit for calculating a group of secondary mean values by using said (L+1)-th through said M-th memorized pattern parameter groups and said group of said difference values to produce a group of third calculation results representative of said group of secondary mean values as one of an (L+1)-th adapted pattern parameter group through said M-th adapted pattern parameter group among said first through said M-th adapted pattern parameter groups.

5. A reference pattern adapting device for using first through L-th training patterns in adapting first through M-th reference pattern parameter groups to first through M-th adapted pattern parameter groups, where M represents a first integer, L represents a second integer which is not greater than said first integer, said first through said M-th reference pattern parameter groups characterizing first through M-th reference patterns, said first reference pattern parameter group through an L-th reference pattern parameter group being classified into a first class, an (L+1)-th reference pattern parameter group through said M-th reference pattern parameter group being classified into a second class, said device comprising:

an element group memory for memorizing first through M-th groups of reference pattern elements as first through M-th memorized pattern element groups, said first through said M-th groups representing said first through said M-th reference patterns;

an extracting unit supplied with said first through said L-th training patterns for extracting a group of training pattern elements representative of one of said first through said L-th training patterns at a time from said first through said L-th training patterns, said group of training pattern elements corresponding to one of said first through said L-th reference pattern parameter groups;

a pattern parameter memory for memorizing said first through said M-th reference pattern parameter groups as first through M-th memorized pattern parameter groups;

a primary similarity calculating unit connected to said element group memory and said pattern parameter memory for calculating a group of primary degrees of similarity between each of said first memorized pattern element group through an L-th memorized pattern element group and each of said first memorized pattern parameter group through an L-th memorized pattern parameter group to produce a group of primary calculation results representative of said group of primary degrees of similarity, said L-th memorized pattern element group being the L-th group of reference pattern elements which is memorized in said element group memory to represent an L-th reference pattern characterized by said L-th reference pattern parameter group, said L-th memorized pattern parameter group being the L-th reference pattern parameter group memorized in said pattern parameter memory;

a first calculating unit connected to said extracting unit and said primary similarity calculating unit for calculating a group of primary mean values by using said group of training pattern elements and said group of primary degrees of similarity to produce a group of primary calculation results representative of said group of primary mean values as one of said first adapted pattern parameter group through an L-th adapted pattern parameter group among said first through said M-th adapted pattern parameter groups;

a difference calculating unit connected to said pattern parameter memory and said first calculating unit for calculating a group of differences between each of said first through said L-th memorized pattern parameter groups and said group of primary mean values to produce a difference signal representative of said group of differences;

a secondary similarity calculating unit connected to said pattern parameter memory for calculating a group of secondary degrees of similarity between each of said first through said L-th memorized pattern parameter groups and each of an (L+1)-th memorized pattern parameter group through said M-th memorized pattern parameter group to produce a group of secondary calculation results representative of said group of secondary degrees of similarity; and

a second calculating unit connected to said first calculating unit and said secondary similarity calculating unit for calculating a group of secondary mean values by using said group of primary mean values and said group of secondary degrees of similarity to produce another group of calculation results representative of said group of secondary mean values as one of an (L+1)-th adapted pattern parameter group through said M-th adapted pattern parameter group among said first through said M-th adapted pattern parameter groups.