Test pattern signal generator and inspection method of display device using the same

• US 5,281,910 A
• Filed: 04/03/1992
• Issued: 01/25/1994
• Est. Priority Date: 07/01/1991
• Status: Expired due to Fees

• Current Assignee: Nec-Mitsubishi Electric Visual Systems Corporation (Hon Hai Precision Industry Co., Ltd.)
• Original Assignee: Mitsubishi Denki Kabushiki Kaisha (Mitsubishi Electric Corporation)
• Inventors: Terazono, Makoto, Emmoto, Kazuo
• Primary Examiner(s): Karlsen, Ernest F.
• Application Number:
  US07/863,104
• Time in Patent Office: 662 Days
• Field of Search: 324/73.1, 324/158 R, 371/27, 340/870.28, 340/870.29, 340/870.3, 358/10, 358/139
• US Class Current: 324/754.21
• CPC Class Codes: H01J 9/42 Measurement or testing during manufacture
• CPC Class Codes: H04N 17/04 for receivers

Abstract

In a test pattern signal generator, an infrared radiation generating section for generating a test pattern selecting infrared signal in response to a test pattern selecting signal given from a console box and a test pattern signal generating section for receiving the test pattern selecting infrared signal and for outputting a test pattern signal corresponding to the received signal are physically separate from one another. In an inspection method of a display device, the test pattern signal generator is used, and a display device to be inspected and adjusted and a test pattern signal generating section are connected through a cable. An infrared radiation generating section is installed at a prescribed position, and when the connected display device and the test pattern signal generating section enter a prescribed working area, a test pattern selecting signal is sent from a console box to the infrared radiation generating section.

Claims

1. A method of inspecting a display device using a test pattern generator for generating test pattern signals to perform inspection and adjustment of the display device,

wherein said test pattern signal generator is provided with an infrared radiation generating section for generating a test pattern selecting infrared signal in response to a test pattern selecting signal applied from the outside, and a test pattern signal generating section physically separate from said infrared radiation generating section for receiving the test pattern selecting infrared signal and for outputting a test pattern signal corresponding to the received signal;

said inspection method comprising the steps of;

installing said infrared radiation generating section at a prescribed position;

connecting said display device and said test pattern signal generating section;

moving the connected display device and test pattern signal generating section; and

generating a test pattern selecting infrared signal from said infrared radiation generating section when said display device and said test pattern signal generating section to be moved enter a prescribed working area.

2. A method of testing a plurality of display devices, said method comprising the steps of:

providing a conveyor system arranged to convey each of said plurality of display devices past a plurality of work stations along said conveyor system;

providing a plurality of infrared generating sections respectively at each of said work stations, each of said infrared radiation generating sections being adapted to generate a test pattern selecting infrared signal in response to an externally-applied test pattern selecting signal;

connecting a plurality of test pattern signal generating sections, each physically separate from said infrared radiation gathering sections, to a respective one of said plurality of display devices to create a plurality of tester/display combinations;

conveying each of said plurality of tester/display combinations on said conveyor system sequentially past said plurality of work stations;

applying said test pattern selecting signal to an infrared radiation generating section of a work station as said tester/display combination passes said work station;

generating said test pattern selecting infrared signal using said infrared radiation generating section;

receiving said test pattern selecting signal with said test pattern signal generating section of said tester/display combination passing said work station; and

applying said test pattern signal to said display of said tester/display combination using said test pattern signal generating section of said tester/display combination in response to the received test pattern selecting signal.