Method and apparatus for testing LCD panel array
First Claim
1. A method for testing a panel array of circuit elements, each element coupled to a pair formed by a drive line and a gate line, each of the drive lines being coupled to one of two opposing first boundaries of the panel and each of the gate lines being coupled to second boundaries of the panel which are adjacent and generally orthogonal to said first boundaries, the panel being logically configurable into to test zones, the method comprising the steps of:
- isolating the test zones having a cross short defect, each one of said test zones having a set of drive lines coupled to the first boundaries and a set of said gate lines coupled to the second orthogonal boundaries; and
thereafterinspecting without establishing individual physical connections to each circuit element within said zone, one of said isolated test zones to identify the location of said cross short defect within said isolated zone by inputting a first voltage signal to said set of drive lines for the isolated zone and a second voltage signal, distinguishable from the first voltage signal, to said set of gate lines, for said isolated zone;
thereuponfor each drive line of said set of drive lines, electo-optically sampling voltage magnitude along each one of said drive lines by means of voltage imaging, wherein a difference between said sampled voltage and said first voltage signal signifies the presence of a defect along the electro-optically sampled drive line; and
for each gate line of said set of gate lines, electro-optically sampling a voltage along each one of said gate lines, wherein a difference between said sampled voltage and said second voltage signal signifies presence of a defect along the electro-optically sampled gate line.
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Accused Products
Abstract
A hierarchical testing method is implemented taking advantage of the nature of the most common defects in an LCD panel to achieve fast effective parametric testing of LCD panels and the like. At the first hierarchy of testing, the panel is logically divided into zones and each zone tested in isolation to identify zones having at least one defect. At the next hierarchy, electro-optic assisted zone inspection is performed to identify where within the zone the defects are located. Lastly, every pixel is inspected using a voltage imaging method to determine whether the switching integrity of the pixel is acceptable. The testing apparatus includes a plurality of panel interface devices coupling the panel under test'"'"'s drive lines and gate lines to a precision measurement unit (PMU). A controller determines the PMU signals and configures the panel interface devices. The PMU monitors select drive lines and gate lines to isolate zones having defects. An electro-optic voltage measurement system is used to identify the location of defects within an isolated zone.
71 Citations
5 Claims
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1. A method for testing a panel array of circuit elements, each element coupled to a pair formed by a drive line and a gate line, each of the drive lines being coupled to one of two opposing first boundaries of the panel and each of the gate lines being coupled to second boundaries of the panel which are adjacent and generally orthogonal to said first boundaries, the panel being logically configurable into to test zones, the method comprising the steps of:
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isolating the test zones having a cross short defect, each one of said test zones having a set of drive lines coupled to the first boundaries and a set of said gate lines coupled to the second orthogonal boundaries; and
thereafterinspecting without establishing individual physical connections to each circuit element within said zone, one of said isolated test zones to identify the location of said cross short defect within said isolated zone by inputting a first voltage signal to said set of drive lines for the isolated zone and a second voltage signal, distinguishable from the first voltage signal, to said set of gate lines, for said isolated zone;
thereuponfor each drive line of said set of drive lines, electo-optically sampling voltage magnitude along each one of said drive lines by means of voltage imaging, wherein a difference between said sampled voltage and said first voltage signal signifies the presence of a defect along the electro-optically sampled drive line; and for each gate line of said set of gate lines, electro-optically sampling a voltage along each one of said gate lines, wherein a difference between said sampled voltage and said second voltage signal signifies presence of a defect along the electro-optically sampled gate line. - View Dependent Claims (2, 3, 4, 5)
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Specification