Integrated circuit dual-port memory device having reduced capacitance

• US 5,287,322 A
• Filed: 07/17/1991
• Issued: 02/15/1994
• Est. Priority Date: 07/17/1991
• Status: Expired due to Term

• Current Assignee: SGS Thomson Microelectronics Inc (STMicroelectronics NV)
• Original Assignee: SGS Thomson Microelectronics Inc (STMicroelectronics NV)
• Inventors: Rastegar, Bahador
• Primary Examiner(s): Sikes, William L.
• Assistant Examiner(s): OUELLETTE, SCOTT
• Application Number:
  US07/731,802
• Time in Patent Office: 944 Days
• Field of Search: 365/190, 365/202, 365/206, 365/221, 365/230.03, 365/231, 365/230.05
• US Class Current: 365/230.05
• CPC Class Codes: G11C 7/00 Arrangements for writing information into, or reading information out from, a digital store G11C5/00 takes precedence; auxiliary circuits for stores using semiconductor devices G11C11/4063, G11C11/413
• CPC Class Codes: G11C 7/18 Bit line organisation; Bit line lay-out
• CPC Class Codes: G11C 8/16 Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups

Abstract

A dual-port memory device provides for a memory array which is divided approximately in half. Between the two halves of the array, a bit line crossover scheme is provided which minimizes stray capacitance and cross-coupling capacitance between bit lines for the two different ports. A bit line layout plan which minimizes such capacitances causes the data for one of the ports to be inverted in one-half of the array. When data from this half of the array is read or written by such port, the data being read or written must be inverted.

Claims

1. A dual port memory device, comprising:

an array of memory cells, said array divided into a first part and a second part along a line in a first direction; and

a plurality of bit lines traversing the array in a second direction perpendicular to the first direction, said bit lines being grouped into a first group corresponding to a first port and a second group corresponding to a second port, with each cell of the array being accessible by bit lines from both the first and second groups, and wherein bit lines in the first group cross over bit lines in the second group in a crossover region between the first and second memory parts.

2. The device of claim 1, wherein the cross over of bit lines in the crossover region causes data read from the second part of the array to be inverted when read by the second port, and further comprising:

means connected to the second port for inverting data read from the second part of the array.

3. The device of claim 2, further comprising means for inverting data written to the second part of the array by the second port.

4. The device of claim 1, wherein the cells in said array comprise SRAM cells, and wherein complemented and uncomplemented bit lines connect to each cell in said array from each of the first and second ports.

5. The device of claim 4, wherein, in the first part of said array, the uncomplemented bit lines connected to each cell for both ports are physically adjacent, and wherein, in the second part of said array, the uncomplemented bit line for the first port is physically adjacent to the complemented bit line for the second port.

6. The device of claim 4, wherein the cells in said array are laid out in rows in the first direction and columns in the second direction, and wherein one uncomplemented bit line or complemented bit line for each port lies on each side of a column of cells.

7. The device of claim 6, wherein, in the first part of said array, the complemented bit lines for both ports lie on the same side of the column, and, in the second part of said array, the complemented bit lines for both ports lie on opposite sides of the column, and wherein matching portions of each bit line and complemented bit line are connected by signal lines crossing over in the crossover region.

8. The device of claim 7, further comprising:

means connected to the second port for inverting data read from the second half of said array, and for inverting data being written to the second half of said array.

9. The device of claim 7, wherein bit lines for adjacent columns are located so that they are mirror images of each other around a line in the second direction between the columns.

10. A method for transmitting data to and from a dual port memory array, comprising the steps of:

for a first port, reading data from the array as it is stored therein and writing data into the array to store it thereinto; and

for a second port, reading data from a first part of the array as it is stored therein and writing data into the first part of the array to store it thereinto, and reading data from a second part of the array in an inverted form and writing data into the second part of the array in an inverted form to store it thereinto.

11. The method of claim 10, wherein for the second port, data read from the first part of the array and data read from the second part of the array are sensed by a sense amplifier.

12. The method of claim 10, further comprising the step of:

after reading data from the second part of the array for the second port, inverting such data.

13. The method of claim 12, further comprising the steps of:

determining whether a location addressed by the second port is in the first or second part of the array based on a value of a most significant address bit; and

inverting data read by the second port when the most significant address bit indicates that the data is being read from the second part of the array.

14. A dual port memory device, comprising:

an array of memory cells organized into rows and columns, wherein the rows are divided into first and second groups;

a plurality of bit lines traversing the array in the column direction, wherein said bit lines cross over each other in a crossover region between the first and second row groups, a first set of bit lines associated with a first port and a second set of bit lines associated with a second port; and

means connected to the array for inverting data read from the second group of rows by the second port, and for inverting data to be written to the second group of rows through the second port, wherein data communicated to and from the array through the first port is not inverted.

15. The device of claim 14, further comprising:

means for determining, from an address of a location being accessed through the second port, whether such location is contained in the first or second group of rows; and

means connected to said inverting means for communicating thereto a signal indicative of whether the data is to be inverted.

16. The device of claim 15, wherein said determining means comprises means for detecting a most significant bit of an address used to access said memory array through the second port.

17. The device of claim 14, wherein the cells in said array comprise SRAM cells, and wherein complemented and uncomplemented bit lines are connected to each column of cells from each port.

18. The device of claim 17, wherein the bit lines cross over in the crossover region so that the complemented bit lines for the first and second ports are physically adjacent for the first group of rows, and are located on opposite sides of the cells in a column for the second group of rows.