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Integrated-optics expansion interferometer in an extension-metrological neutral environment

  • US 5,289,256 A
  • Filed: 01/26/1993
  • Issued: 02/22/1994
  • Est. Priority Date: 02/15/1992
  • Status: Expired due to Fees
First Claim
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1. A double-beam interferometer formed using integrated-optics technology comprising:

  • a baseplate having waveguides integrated thereon;

    an entrance optical fiber supplying primary light from a laser light source, said integrated waveguides having an entrance portion extending to an edge of the baseplate and connecting in a light-conducting manner to the entrance optical fiber;

    an exit optical fiber conducting interference light away from the baseplate to a detecting device, at least one further exit portion of said integrated waveguides extending to an edge of the baseplate and connecting in a light-conducting manner to the exit optical fiber;

    an integrated light splitting device disposed downstream of said entrance portion of the integrated waveguide for splitting an injected primary light onto a reference arm and a measuring arm of waveguides;

    an integrated light coupler for combining light from the reference arm and from the measuring arm, said coupler merging into the at least one exit portion;

    wherein the portion of the waveguide forming the reference arm and the portion forming the measuring arm are both integrated over their entire length in the baseplate, said length of the reference arm corresponding to said length of the measuring arm;

    wherein at least that portion of the waveguide forming the measuring arm is disposed in a plurality of loops with mutually parallel oriented straight active partial sections and intermediate deflecting sections, in which a coupling-free mutual minimum spacing of all straight active partial sections and deflecting sections forming the measuring arm is provided; and

    wherein the waveguide forming the reference arm is at least one of designed and disposed in the baseplate in such a manner that upon extension of the baseplate in a direction of the straight active partial sections of the measuring arm, said reference arm operates in an extension-metrologically neutral manner.

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