Apparatus for assessing a particular property in a medium

• US 5,296,374 A
• Filed: 04/22/1992
• Issued: 03/22/1994
• Est. Priority Date: 10/20/1989
• Status: Expired due to Fees

• Current Assignee: University of Strathclyde
• Original Assignee: University of Strathclyde
• Inventors: Culshaw, Brian, Turner, Anthony P. F.
• Primary Examiner(s): Wityshyn, Michael G.
• Assistant Examiner(s): Beisner, William H.
• Application Number:
  US07/847,009
• Time in Patent Office: 699 Days
• Field of Search: 435/287, 435/288, 435/291, 435/807, 435/808, 435/817, 422/68.1, 422/82.01, 422/82.05, 422/82.11, 422/82.12, 422/51, 374/31, 374/117, 374/118, 374/32
• US Class Current: 435/287.9
• CPC Class Codes: G01K 5/52 with electrical conversion means for final indication
• CPC Class Codes: G01N 25/482 concerning the temperature responsive elements measuring temperature or quantity of heat, thermally-sensitive elements G01K; thermoelectric devices H10N10/00, H10N15/00
• CPC Class Codes: G01N 29/036 by measuring frequency or resonance of acoustic waves
• CPC Class Codes: G02B 26/001 based on interference in an adjustable optical cavity interference filters G02B5/28; devices or arrangements using multiple reflections in spectrometry or monochromators G01J3/26

Abstract

A sensor is provided which is sensitive to a particular property of a medium and which is thermally activated when in contact with the property containing medium. The sensor is externally mounted on the undersurface of a silicon wafer, the upper surface of which contains a well in which a vibratile bridge element is located. The top of the well is closed off so that the vibratile bridge element is within a chamber. Excitation energy from a source is delivered to the vibratile bridge element to establish vibratory motion which is monitored and detected by a circuit. Presence of the particular property in the medium causes a thermal change in the wafer resulting in a change in the resonance frequency of the vibratory motion of the vibratile bridge element. The frequency shift is a measure of the particular property.

Claims

1. An apparatus for assessing a particular property of a medium comprising:

a chamber having a thermally conductive portion;

a vibratile element thermally coupled within said chamber to said thermally conductive portion;

optical excitation means for delivering optical excitation energy incident to said vibratile element so as to cause the vibratile element to vibrate at its resonant frequency without inducing thermal changes in the chamber;

optical means for monitoring and detecting the vibration frequency of the vibratile element; and

thermally activated sensor means, thermally coupled to an exterior surface of said thermally conductive portion thereby being exposed to enable contact between said thermally activated sensor means and the medium, said thermally activated sensor means being a material which is thermally activated when contacted with said medium having said particular property for changing the temperature of the chamber and hence the resonant frequency of the vibratile element by heat transfer through the thermally conductive portion between the thermally activated sensor means and the chamber, said changes in said resonant frequency being monitored and detected by the optical means which provides an assessment of the presence of said particular property of said medium.

2. An apparatus according to claim 1, wherein the thermally activated sensor means is chemically reactive with the medium in an exothermic or an endothermic manner.

3. An apparatus according to claim 1, wherein the thermally activated sensor means comprises an enzyme selected so that the particular property to be detected is the substrate of the enzyme.

4. An apparatus according to claim 3, wherein the thermally activated sensor means comprises a diffusion barrier.

5. An apparatus according to claim 1,

wherein the thermally conductive portion is a semiconductor wafer segment having two wells therein, said vibratile element being formed within a first well in the upper surface of the wafer segment and said thermally activated sensor means being located in a second well in the lower surface of the wafer segment.

6. An apparatus according to claim 5, further comprising an optical fiber, coupled to the upper surface of the wafer segment and overlying said first well therein, said optical fiber being provided for the delivery of the optical excitation energy and for the monitoring and detecting of the vibration frequency of the vibratile element.