Apparatus and method for applying a laser beam through a microscope

• US 5,296,963 A
• Filed: 02/27/1992
• Issued: 03/22/1994
• Est. Priority Date: 02/27/1991
• Status: Expired due to Fees

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: Murakami, Sei, Takai, Masao, Kimura, Nobuo, Nakano, Ryusei
• Primary Examiner(s): NOT, DEFINED
• Application Number:
  US07/842,517
• Time in Patent Office: 754 Days
• Field of Search: 359/389, 359/385, 359/368, 359/201, 359/202, 219/121.8, 435/173, 435/204.2
• US Class Current: 359/389
• CPC Class Codes: G02B 21/0088 Inverse microscopes

Abstract

An inverted microscope is adapted so that a specimen thereon e.g. cells can be irradiated by a laser beam. The laser beam is guided from a laser source by a series of adjustably movable reflectors which introduce it into the microscope optical pathway at a parallel-beam region thereof, and through the objective lens of the microscope. A point to be irradiated can be selected by moving the reflectors which may be galvanometrically-movable. The laser beam can be focused together with the microscope image. The movable reflectors are kept within 200 mm behind the objective lens principal plane (PP) to ensure that the laser can be applied all over the microscope viewing field.

Claims

1. Microscope apparatus adapted for directing a laser beam onto a specimen, said apparatus comprising:

an inverted microscope, said microscope comprising an objective lens;

means defining a laser beam path of the apparatus, said laser beam path passing through the objective lens of the microscope;

said defining means comprising at least two laser beam deflectors mounted on said laser beam path optically behind said objective lens, and being controllably adjustable to adjust the direction of the laser beam path through the objective lens as the apparatus is operated;

said inverted microscope defining a microscope optical pathway, the microscope optical pathway comprises a parallel-beam region behind the objective lens, and the laser beam path meets the microscope optical pathway at said parallel-beam region.

2. Microscope apparatus as claimed in claim 1 in which a said controllably adjustable laser beam deflector is located at said parallel-beam region.

3. Microscope apparatus adapted for directing a laser beam onto a specimen, said apparatus comprising:

an inverted microscope, said microscope comprising an objective lens;

means defining a laser beam path of he apparatus, said laser beam path passing through the objective lens of the microscope;

said defining means comprising at least two laser beam deflectors mounted on said laser beam path optically behind said objective lens, and being controllably adjustable to adjust the direction of the laser beam path through the objective lens as the apparatus is operated;

two said laser beam deflectors being provided, each of said two deflectors being adjustable in a respective different sense whereby said deflectors produce mutually perpendicular adjustments of the laser beam path direction.

4. Microscope apparatus for directing a laser beam onto a sample, comprising:

a laser source,

an inverted microscope, said microscope comprising an objective lens and defining an optical pathway passing through said objective lens;

means defining a laser beam path from said laser source and extending through the objective lens of the inverted microscope, said means comprising at least two remote-controllably direction-adjustable laser beam deflectors;

a final one of said at least two laser beam deflectors being mounted in the microscope optical pathway, behind the objective lens.

5. Microscope apparatus as claimed in claim 4 in which all of said remote-controllably direction-adjustable laser beam deflectors lie within 200mm behind the object principal plane of the object lens, along the laser optical path.

6. Microscope apparatus as claimed in claim 4 in which said remote-controllably direction-adjustable laser beam deflectors comprise reflectors movable by galvanometers.

7. Microscope apparatus as claimed in claim 4 in which two said laser beam deflectors respectively provide adjustment of the laser beam path direction in mutually perpendicular senses.

8. An inverted microscope defining an optical pathway and comprising

a sample station;

an objective lens mounted axially movably underneath the sample station, on said optical pathway, for focusing said pathway at the sample station;

fixed microscope structure beneath said objective lens and defining at least part of said optical pathway, and

a remote-controllable adjustable laser beam deflector mounted in the optical pathway between the fixed microscope structure and the objective lens.

9. An inverted microscope as claimed in claim 8 in which the optical pathway comprises a parallel-beam region, and the laser beam deflector is situated in the parallel-beam region.

10. An inverted microscope as claimed in claim 8 in which the laser beam deflector comprises a galvanometer-movable reflector element.

11. An inverted microscope as claimed in claim 8 in which the laser beam deflector is axially fixed relative to the fixed microscope structure and the sample station.

12. A method of directing a laser beam onto a selected portion of a specimen at a specimen station of an inverted microscope, the method comprising:

deflecting a laser beam through an objective lens of the inverted microscope onto the specimen;

focusing the laser beam onto the specimen by said objective lens;

selecting a portion of the specimen to be treated with the laser beam; and

adjusting one or more deflectors on which the laser beam is incident, to direct the laser beam onto the selected portion of the specimen;

the inverted microscope having an optical pathway comprising a parallel-beam region, and the laser beam is introduced into said optical pathway at said parallel-beam region.

13. A method of directing a laser beam onto a selected portion of a specimen at a specimen station of an inverted microscope, the method comprising:

deflecting a laser beam through an objective lens of the inverted microscope onto the specimen;

focusing the laser beam onto the specimen by said objective lens;

selecting a portion of the specimen to be treated with the laser beam; and

adjusting one or more deflectors on which the laser beam is incident, to direct the laser beam onto the selected portion of the specimen;

all adjustments of said deflectors occur within 200 mm behind the object principal plane of the objective lens of the microscope, measured along the path of the laser beam.

14. A method as claimed in claim 13, wherein one of the laser beam deflectors or each deflector is remotely adjusted electrically to guide the laser beam to the selected portion of the specimen.

15. A method as claimed in claim 13, wherein said deflectors are adjusted discontinuously between selected individual conditions, corresponding to a sequence of selected individual locations on the specimen.

16. A method as claimed in claim 13, wherein all adjustments of said deflectors occur within 200mm behind the object principal plane of the objective lens of the microscope, measured along the path of the laser beam.

17. A method as claimed in claim 13, wherein the specimen comprises cells.

18. Microscope apparatus adapted for directing a laser beam onto a specimen, said apparatus comprising:

an inverted microscope comprising an objective lens;

means defining a laser beam path of the apparatus, said laser beam path passing through the objective lens of the microscope;

said defining means including at least two laser beam deflectors mounted on said laser beam path optically behind said objective lens, and being controllably adjustable to adjust the direction of the laser beam path through the objective lens as the apparatus is operated;

wherein said two laser beam deflectors are remote-controllably direction-adjustable and lie within 200mm behind the object principal plane of the objective lens, along the laser optical path.