Titanium-tungsten target material and manufacturing method thereof
First Claim
1. A titanium-tungsten target material consisting essentially of a tungsten phase and a titanium-tungsten alloy phase surrounding the tungsten phase.
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Accused Products
Abstract
A titanium-tungsten target material used to form, by sputtering, a barrier metal or the like for use in semiconductor devices. The titanium-tungsten target material is substantially composed of tungsten particles and a titanium-tungsten alloy phase surrounding the tungsten particles. The area ratio at which tungsten grains occupy in a cross section of the titanium-tungsten target material is, preferably, not more than 15%, more preferably, not more than 10%. If the average crystal grain size of the target material is not more greater 15 μm, a uniform thin film can be obtained by sputtering. The target material can be obtained by sintering a titanium powder and a tungsten powder.
18 Citations
7 Claims
- 1. A titanium-tungsten target material consisting essentially of a tungsten phase and a titanium-tungsten alloy phase surrounding the tungsten phase.
- 2. A titanium-tungsten target material consisting essentially of a tungsten phase and a titanium-tungsten alloy phase surrounding the tungsten phase, wherein the average crystal grain size is not greater than 15 μ
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4. A method of manufacturing a titanium-tungsten target, comprising the steps of:
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blending and milling a tungsten powder and a hydrogenated titanium powder having a grain size not greater than 25 μ
m so that a milled powder having an average grain size smaller than 5 μ
m and a maximum grain size smaller than 10 μ
m are obtained;press-sintering the powder after or during a dehydrogenation treatment to form a sintered material; and heating the sintered material at 1300°
to 1550°
C. to form a target consisting essentially of a tungsten phase and a titanium-tungsten alloy phase surrounding the tungsten phase. - View Dependent Claims (7)
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Specification