Desk top spectrum analyzer

• US 5,299,138 A
• Filed: 08/09/1991
• Issued: 03/29/1994
• Est. Priority Date: 08/09/1991
• Status: Expired due to Term

• Current Assignee: National Institute of Standards and Technology- United States of America, As Represented By The Secretary of Commerce
• Original Assignee: THE GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE, United States Department Of Health And Human Services
• Inventors: Fiori, Charles E., Swyt, Carol R.
• Primary Examiner(s): Black, Thomas G.
• Assistant Examiner(s): NGUYEN, TAN QUANG
• Application Number:
  US07/743,072
• Time in Patent Office: 963 Days
• Field of Search: 364/485, 364/487, 364/498, 364/551.01, 250/310, 250/390.07, 250/370.07
• US Class Current: 702/22
• CPC Class Codes: G01N 23/20091 Measuring the energy-dispersion spectrum [EDS] of diffracted radiation

Abstract

A control system emulates an X-ray spectrum generation and analyzing system on a computer by emulating the experimental apparatus, emulating the experimental geometry between elements of the experimental apparatus and emulating a material sample within the experimental apparatus including the emulated material sample'"'"'s physical properties. The control system allows an operator generate theoretical spectra of material samples based on the emulated experimental apparatus and the physical characteristics of the emulated material sample. The control system also allows the operator to compare the generated theoretical spectrum to a real spectrum acquired from the experimental system and sample which have been emulated. Thus, the operator can easily determine the sufficiency of the emulation of the experimental set-up. The control system further allows the operator to analyze the generated theoretical spectra. Thus, the operator can determine the sufficiency of the experimental set-up in determining the character and composition of the real material sample.

Claims

1. A spectrum analyzer system comprising:

a spectrum analyzer;

a data interface means for porting spectra data from an x-ray acquisition system to said spectrum analyzer; and

output interface means driven by said spectrum analyzer for providing output data in a desired form;

wherein said spectrum analyzer comprises;

a microcomputer means comprising processing means for processing spectra data according to a selected one of a plurality of control modes and a controlling means for selectively configuring the processing means for processing said spectra data according to said selected control mode,

operator interface means comprising keyboard/mouse means for receiving commands from an operator to set said selected control mode, and display means for displaying at least one of said selected control mode and spectra data processed according to said control mode,

storage means connected to said microcomputer means for storing at least spectra data,

input device means connected to said microcomputer means for receiving said data interface means, and

output device means connected to said microcomputer means for driving said output interface means; and

wherein said display means comprises;

overlay means for forming an overlaid image from a plurality of spectra so that each spectrum of said plurality of spectra is distinguishable,

annotation means for marking points in and labeling said overlaid image, and

display apparatus for displaying said marked and labeled overlaid image to said operator.

2. The spectrum analyzer system of claim 1 wherein said processing means transfers a selected spectrum from said storage means to said overlay means of said display means according to a command from said operator interface means.

3. The spectrum analyzer system of claim 1 wherein said processing means deletes a selected spectrum from said overlay means according to a command from said operator interface means.

4. The spectrum analyzer system of claim 1 wherein said overlay means forms said overlay image of said plurality of spectra wherein each of said spectrum comprises a plurality of channels, each channel having an amplitude.

5. A control system emulating an x-ray spectrum generation and analyzing system on a computer, the computer comprising:

a controller;

data input means for inputting data to the computer;

data output means for outputting data from the computer;

interface means for connecting the data input means and data output means to the controller; and

memory means for storing data;

wherein the controller comprises;

experimental apparatus emulation means for emulating operating characteristics of an experimental apparatus, including operating characteristics of an incident exciting beam,

experimental geometry emulation means for emulating geometrical relationships between elements of the emulated experimental apparatus,

material sample emulation means for emulating physical properties of an experimental material sample,

physics equations selecting means for emulating physical interactions of the emulated material sample and the incident exciting beam of the emulated experimental apparatus, and

data generating means for generating theoretical x-ray spectrum data based on the emulated experimental apparatus, the emulated geometrical relationships and the emulated material sample and the emulated physical interactions.

6. The control system of claim 5, wherein the data input means comprises at least one of an actual experimental apparatus, a keyboard, a mouse, a hard drive, a disk drive, and a remote computer.

7. The control system of claim 5, wherein the data output means comprises at least one of a video display, a plotter, and a printer.

8. The control system of claim 5, wherein the memory means comprises at least one of a RAM, a ROM, a hard drive, a disk drive, and a remote computer.

9. The control system of claim 5, wherein the emulated experimental apparatus comprises:

an incident exciting beam generator;

at least one resulting photon detector; and

a material sample.

10. The control system of claim 9, wherein the incident exciting beam generator generates an electron beam, and wherein the resulting photon detector detects x-ray photons emitted by the emulated material sample.

11. The control system of claim 9, wherein the physical characteristics emulated by the experimental apparatus emulation means comprise:

an operating energy range of the emulated incident exciting beam generator;

operating characteristics of the at least one emulated detector; and

physical dimensions of the emulated material sample.

12. The control system of claim 9, wherein the geometrical relationships emulated by the experimental geometry emulating means comprises:

relative positioning between the material sample and the incident exciting beam generator;

an orientation of the emulated material sample;

relative positioning between the emulated material sample and the at least one emulated detector; and

an orientation of the at least one emulated detector.

13. The control system of claim 5, wherein the controller further comprises data conditioning means for conditioning the generated theoretical spectrum data.

14. The control system of claim 13, wherein the data conditioning means conditions the generated theoretical spectrum data by at least one of scaling, summing, filtering, differentiating, integrating, background removing and parsing.

15. The control system of claim 5, wherein the controller further comprises emulation altering means for altering at least one element of the emulated experimental apparatus, the emulated physical characteristics, the emulated experimental geometry, the emulated material sample, the emulated physical properties and the emulated physical interactions.

16. The control system of claim 5, wherein the controller further comprises data converting means for converting at least one of an actual spectrum data and the theoretical spectrum data between a wavelength dispersive spectrum and an energy-dispersive spectrum.

17. The control system of claim 5, wherein the controller further comprises data removal means for deleting data corresponding to a theoretical spectrum of the emulated material sample from an actual spectrum of a first material sample to create a parsed spectrum corresponding to the first material sample without the emulated material sample.

18. A method for generating a theoretical x-ray spectrum, comprising the steps of:

emulating an actual experimental apparatus;

emulating geometric relationships between elements of the actual experimental apparatus;

emulating an experimental sample material;

generating a theoretical spectrum data based on the emulated experimental apparatus, the experimental geometric relationships, the emulated experimental material sample and first principles; and

displaying the generated theoretical spectrum.

19. The method of claim 18, wherein the step of emulating an actual experimental apparatus comprises the step of:

emulating an incident exciting beam generator;

emulating at least one resulting photon detector;

emulating an operating energy range of the incident exciting beam generator;

emulating operating characteristics of the at least one resulting photon detector;

emulating physical characteristics of the emulated sample; and

altering the emulated experimental apparatus in response to the generated theoretical spectrum.

20. The method of claim 19, wherein the step of emulating the geometric relationships comprises the steps of:

emulating relative positions of the emulated incident exciting beam generator, the emulated experimental sample and the at least one emulated detector; and

emulating orientations of the emulated material sample and the at least one emulated detector.

21. The method of claim 19, wherein the step of altering the experimental apparatus comprises the steps of:

determining an experimental goal;

generating the theoretical spectrum;

determining if the generated theoretical spectrum is adequate based on the determined experimental goal; and

altering the experimental apparatus based on discrepancies between the generated theoretical spectrum and the determined experimental goal.

22. The method of claim 19, wherein:

the step of emulating an incident exciting beam generator comprises emulating an electron beam generator; and

the step of emulating at least one resulting photon detector comprises emulating an x-ray photon detector.