Time-of-flight mass spectrometer with an aperture enabling tradeoff of transmission efficiency and resolution

• US 5,300,774 A
• Filed: 04/25/1991
• Issued: 04/05/1994
• Est. Priority Date: 04/25/1991
• Status: Expired due to Term

• Current Assignee: Applied Biosystems LLC (Thermo Fisher Scientific Incorporated)
• Original Assignee: Applied Biosystems, Inc. (Thermo Fisher Scientific Incorporated)
• Inventors: Buttrill, S. E. Jr.
• Primary Examiner(s): Anderson, Bruce C.
• Application Number:
  US07/691,272
• Time in Patent Office: 1,076 Days
• Field of Search: 250/281, 250/287, 250/288, 250/423 P, 250/309
• US Class Current: 250/287
• CPC Class Codes: H01J 49/025 Detectors specially adapted to particle spectrometers data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29
• CPC Class Codes: H01J 49/40 Time-of-flight spectrometers H01J49/36 takes precedence

Abstract

A time-of-flight mass spectrometer in which sample ions are generated from a target and are focussed into an ion beam that is incident onto a detector. A barrier that defines an aperture in the path of the ion beam is positioned to block ions having an extra large deviation from an average time-of-flight of the ions, thereby improving resolution. The aperture can be adjusted to adjust a tradeoff between sensitivity and resolution. Alternatively, the position of the aperture or the bias on an einzel lens can be adjusted to control this resolution.

Claims

1. A time-of-flight mass spectrometer having a controllable resolution, said spectrometer comprising:

a barrier having an aperture;

a detector;

means for producing, from a sample substance, a beam of sample ions, at least part of which passes through said aperture to said detector;

each ion being characterized by a time-of-flight extending from a time of generation of that ion until said ion is detected by said detector; and

said ions exhibiting at said aperture a time-of-flight distribution that is a function of a lateral distance from an axis parallel to said beam and located within said beam; and

means for varying the resolution by varying how much of this beam passes through said aperture.

2. A time-of-flight mass spectrometer as in claim 1 wherein said means for producing a beam of sample ion comprises:

a target;

means for emitting ions from said target; and

ion optics section for focussing these ions to form an ion beam.

3. A time-of-flight mass spectrometer as in claim 2 wherein said means for emitting ions from said target comprises a source of a laser beam that is directed onto the target to emit ions.

4. A time-of-flight mass spectrometer as in claim 2 wherein said ion optics section includes an immersion lens, whereby a high fraction of ions emitted from said target can be focussed into said ion beam.

5. A time-of-flight mass spectrometer as in claim 4 wherein said ion optics section includes an einzel lens having an electrode that is biased to a controllable voltage to adjust the resolution of this spectrometer.

6. A time-of-flight mass spectrometer as in claim 1 wherein said means for producing a beam includes an ion optics section that is adjustable to adjust the resolution of this spectrometer by eliminating ions having a greatest off-axis distance from a central axis of said beam.

7. A time-of-flight mass spectrometer as in claim 6 wherein said ion optics section includes an immersion lens having a voltage that can be adjusted to adjust the resolution.

8. A time-of-flight mass spectrometer as in claim 6 wherein said ion optics section includes an einzel lens having an electrode that is biased to a controllable voltage to adjust the resolution of this spectrometer.

9. A time-of-flight mass spectrometer as in claim 1 wherein the barrier having an aperture is within a substantially field-free region of the spectrometer, whereby this aperture does not interact with fields within the spectrometer.

10. A time-of-flight mass spectrometer as in claim 9 wherein the barrier having an aperture is adjacent to another element in the spectrometer and is attached to this element, whereby this aperture can be easily aligned with the ion beam.

11. A time-of-flight mass spectrometer having a controllable resolution, said spectrometer comprising:

a barrier having an aperture;

a detector;

means for producing, from a sample substance, a beam of sample ions, at least part of which passes through said aperture to said detector;

each ion being characterized by a time-of-flight extending from a time of generation of that ion until said ion is detected by said detector; and

said ions exhibiting at said aperture a time-of-flight distribution that is a function of a lateral distance from an axis parallel to said beam and located within said beam; and

means for varying the resolution by varying how much of this beam passes through said aperture;

wherein said aperture has an adjustable dimension that can be changed to adjust the resolution of this spectrometer.

12. A time-of-flight mass spectrometer having a controllable resolution, said spectrometer comprising:

a barrier having an aperture;

a detector;

means for producing, from a sample substance, a beam of sample ions, at least part of which passes through said aperture to said detector;

each ion being characterized by a time-of-flight extending from a time of generation of that ion until said ion is detected by said detector; and

said ions exhibiting at said aperture a time-of-flight distribution that is a function of a lateral distance from an axis parallel to said beam and located within said beam; and

means for varying the resolution by varying how much of this beam passes through said aperture;

wherein said barrier contains a plurality of apertures of different sizes and said barrier can be translated in a direction lateral to said ion beam to selectively align any selected one of these apertures in the path of the ion beam to adjust a resolution of this spectrometer.