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Method for identifying a semiconductor die using an IC with programmable links

  • US 5,301,143 A
  • Filed: 12/31/1992
  • Issued: 04/05/1994
  • Est. Priority Date: 12/31/1992
  • Status: Expired due to Term
First Claim
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1. A method for identifying a semiconductor die comprising;

  • forming a programmable integrated circuit on the die including programmable links connected to output nodes and to an FET transistor;

    selectively activating the programmable links;

    addressing the FET transistor with a predetermined address code to control current flow to each output node such that for a given address code and based on a condition of the programmable links a predetermined identification code can be read at the output nodes; and

    thenreading the predetermined identification code at the output nodes to identify the semiconductor die.

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