Load driver and system with fault detection apparatus for providing a sequence of fault detection logic states

• US 5,304,935 A
• Filed: 12/17/1991
• Issued: 04/19/1994
• Est. Priority Date: 12/17/1991
• Status: Expired due to Term

• Current Assignee: Temic Automotive of North America, Incorporated (Continental AG)
• Original Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Inventors: McGraw, William J., Villevieille, Jean M., Rathke, William M.
• Primary Examiner(s): Strecker, Gerard R.
• Assistant Examiner(s): DO, DIEP N
• Application Number:
  US07/809,685
• Time in Patent Office: 854 Days
• Field of Search: 324/415, 324/418, 73/119 A, 73/129, 361/93, 361/100, 361/101
• US Class Current: 324/415
• CPC Class Codes: G01R 31/31701 Arrangements for setting the Unit Under Test [UUT] in a test mode
• CPC Class Codes: G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58
• CPC Class Codes: G06F 11/0763 by bit configuration check, e.g. of formats or tags

Abstract

Load driver system (10) preferably uses a microprocessor controller (20) to generate write/read signals and command signals received by a circuit at write/read and command/status input terminals (16, 17). The circuit (15) responds to the input signals and controls a semiconductor switch (11) that controls the operative state of a load (14). The circuit (15) includes a load shorted high detector (28), a load shorted low detector (29) and a load open detector (30) which are used to detect various faults and provide a predetermined sequence of logic states at the command/status input terminal (17) during read cycles implemented by the controller (20). Thus one input line (terminal 17) is used to both send commands to the semiconductor switch (11) and receive a sequence of logic states indicative of various fault modes. This permits the controller to determine which of several types of faults, if any, has occurred, while minimizing the number of controller-circuit interconnections.

Claims

1. Load driver with fault detection apparatus, comprising:

semiconductor switch having a control electrode for receiving a switch control signal which determines on and off modes of operation of the switch, said switch having an output electrode for connection to an associated electrical load;

W/R terminal for receiving a write/read control signal;

C/stat terminal for receiving a command signal;

circuit means coupled between said semiconductor switch and said W/R and C/stat terminals for providing said switch control signal to said semiconductor switch in accordance with said write/read signal and said command signal; and

fault diagnostic circuit means coupled to said semiconductor switch and at least one of said W/R and C/stat terminals for monitoring operation of said semiconductor switch and its associated load and for providing, at said one terminal, a timed sequence of at least three predetermined logic states indicative of said monitored switch/load operation, each of said predetermined logic states indicative of, respectively, switch/load operation at sequential times (a) after said switch control signal attempts to turn said switch on and when said switch is supposed to be on, (b) at a first time after said switch control signal attempts to turn said semiconductor switch off, and (c) at a second time when said switch is supposed to be off, later than said first time, after said switch control signal attempts to turn said semiconductor switch off, a particular sequence of said three logic states indicating proper switch/load operation and each of three other sequences of said three logic states indicative of a different operational fault of said switch/load.

2. Apparatus according to claim 1 wherein said circuit means provides said switch control signal with a switch on logic state to turn said switch on in response to the occurrence of a predetermined logic state condition of said write/read signal and a predetermined command on logic state of said command signal.

3. Apparatus according to claim 2 wherein said circuit means provides said switch control signal with a switch off logic state to turn said switch off in response to a predetermined logic state condition of said write/read signal and a predetermined command off logic state of said command signal which differs from said predetermined command on logic state.

4. Apparatus according to claim 2 wherein said circuit means includes a latch means for responding to said write/read signal and said command signal, and wherein said predetermined logic state condition of said write/read signal comprises a logic state transition of said write/read signal of a predetermined polarity.

5. Apparatus according to claim 1 wherein said fault diagnostic means includes fault detector means for providing said sequence of three logic states at said C/stat terminal by monitoring current through said switch and voltage at said switch output electrode.

6. Apparatus according to claim 5 wherein said fault detector means includes a load shorted high detector for providing as one of said logic three logic states a S.C. high fault logic state at said C/stat terminal in response to detecting, during said time (a), excessive current through said semiconductor switch after said semiconductor switch receives a switch on logic state signal at its control electrode and prior to said semiconductor switch receiving a switch off logic state signal at its control electrode.

7. Apparatus according to claim 6 wherein said load shorted high detector also includes circuitry for providing said S.C. high logic state in response to sensing an excessive voltage across said semiconductor switch when said switch is on.

8. Apparatus according to claim 6 wherein said fault detector means also includes a flyback voltage detector for determining said predetermined logic state at said C/stat terminal during said time (b) in response to comparing voltage at said semiconductor switch output electrode to a first high predetermined threshold voltage.

9. Apparatus according to claim 8 wherein said fault detector means includes a low voltage detector for determining said predetermined logic state at said C/stat terminal during said time (c) in response to comparing voltage at said semiconductor switch output electrode to a second low predetermined voltage threshold substantially below said first predetermined threshold.

10. Apparatus according to claim 5 wherein said fault detector means includes a flyback voltage detector for determining said predetermined logic state at said C/stat terminal during said time (b) in response to comparing voltage at said semiconductor switch output electrode to a first high predetermined threshold voltage.

11. Apparatus according to claim 1 which includes a microprocessor means for generating said write/read signal and said command signal provided to said W/R terminal and said C/stat terminal, respectively, and wherein said microprocessor also monitors the sequence of logic states provided at said C/stat terminal during times (a), (b) and (c) for determining the existence of any of at least three different types of fault conditions for operation of said semiconductor switch/load.

12. Apparatus according to claim 11 wherein said at least three different types of fault conditions correspond to a load shorted high condition, a load shorted low condition and a load open circuit condition.

13. Load driver system with fault detection apparatus, comprising:

semiconductor switch having a control electrode for receiving a switch control signal which determines on and off modes of operation of the switch, said switch having an output electrode;

a load coupled to said semiconductor switch output electrode;

W/R terminal for receiving a write/read control signal;

C/stat terminal for receiving a command signal;

circuit means coupled between said semiconductor switch and said W/R and C/stat terminals for providing said switch control signal to said semiconductor switch in accordance with said write/read signal and said command signal; and

fault diagnostic circuit means coupled to said semiconductor switch and at least one of said W/R and C/stat terminals for monitoring operation of said semiconductor switch and said load and for providing, at said one terminal, a timed sequence of at least three predetermined logic states indicative of said monitored switch/load operation, each of said predetermined logic states indicative of, respectively, switch/load operation at sequential times (a) after said switch control signal attempts to turn said switch on and when said switch is supposed to be on, (b) at a first time after said switch control signal attempts to turn said semiconductor switch off, and (c) at a second time when said switch is supposed to be off, later than said first time, after said switch control signal attempts to turn said semiconductor switch off, a particular sequence of said three logic states indicating proper switch/load operation and each of three other sequences of said three logic states indicative of a different operational fault of said switch/load.

14. System according to claim 13 wherein said circuit means includes a latch means for responding to said write/read signal and said command signal

15. System according to claim 13 wherein said load comprises an inductive load.

16. System according to claim 15 wherein said fault diagnostic means includes fault detector means for providing said sequence of three logic states at said C/stat terminal by monitoring current through said switch and voltage at said switch output electrode.

17. System according to claim 16 wherein said fault detector means includes a load shorted high detector for providing as one of said logic three logic states a S.C. high fault logic state at said C/stat terminal in response to detecting, during said time (a), excessive current through said semiconductor switch after said semiconductor switch receives a switch on logic state signal at its control electrode and prior to said semiconductor switch receiving a switch off logic state signal at its control electrode.

18. System according to claim 16 wherein said fault detector means includes a flyback voltage detector for determining said predetermined logic state at said C/stat terminal during said time (b) in response to comparing voltage at said semiconductor switch output electrode provided by inductive flyback from said load to a first high predetermined threshold voltage.

19. System according to claim 18 which includes a microprocessor means for generating said write/read signal and said command signal provided to said W/R terminal and said C/stat terminal, respectively, and wherein said microprocessor also monitors the sequence of logic states provided at said C/stat terminal during times (a), (b) and (c) for determining the existence of any of at least three different types of fault conditions for operation of said semiconductor switch/load.

20. System according to claim 19 wherein said at least three different types of fault conditions correspond to a load shorted high condition, a load shorted low condition and a load open circuit condition.

21. Load driver system with fault detection apparatus, comprising:

a plurality of semiconductor switches each having a control electrode for receiving a switch control signal which determines on and off modes of operation of the switch, each of said switches having an output electrode;

a load associated with and coupled to each of said semiconductor switch output electrodes, respectively;

W/R terminal for receiving a write/read control signal;

a plurality of C/stat terminals each associated with one of said switches, respectively, and each receiving a command signal;

a plurality of circuit means each coupled between said W/R terminal, one of said semiconductor switches and one of said C/stat terminals, respectively, for providing said switch control signal to said one of said semiconductor switches in accordance with said write/read control signal and said command signal provided at said one of said C/stat terminals associated with said one of said semiconductor switches; and

a plurality of fault diagnostic circuit means each coupled to and associated with one of said semiconductor switches and each coupled to at least one of said W/R and C/stat terminals associated with said one of said semiconductor switches for monitoring operation of said one of said semiconductor switches and its associated load and for providing, at said one of said W/R and C/stat terminals associated with said one of said switches, a timed sequence of at least three predetermined logic states indicative of said monitored switch/load operation, each of said predetermined logic states indicative of, respectively, switch/load operation at sequential times (a) after said switch control signal attempts to turn said one of said switches on and when said one of said switches is supposed to be on, (b) at a first time after said switch control signal attempts to turn said one of said semiconductor switches off, and (c) at a second time when said one of said switch is supposed to be off, later than said first time, after said switch control signal attempts to turn said one of said semiconductor switches off, a particular sequence of said three logic states indicating proper switch/load operation and each of three other sequences of said three logic states indicative of a different operational fault of said switch/load, whereby said write/read signal is coupled to a plurality of said switches to control the operation thereof and whereby each of said fault diagnostic circuit means monitors the operation of its associated switch and load.

22. System according to claim 21 which includes a microprocessor means for generating said write/read signal provided to said W/R terminal and said plurality of command signals provided to said plurality of said C/stat terminals, and wherein said microprocessor means also monitors the sequence of logic states provided at said plurality of said C/stat terminals during times (a), (b) and (c) for determining the existence of any of at least three different types of fault conditions for operation of each of said semiconductor switch/loads.

23. System according to claim 22 wherein said at least three different types of fault conditions correspond to a load shorted high condition, a load shorted low condition and a load open circuit condition.