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Positioning device for scanning probe microscopes

  • US 5,306,919 A
  • Filed: 09/21/1992
  • Issued: 04/26/1994
  • Est. Priority Date: 09/21/1992
  • Status: Expired due to Term
First Claim
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1. A piezoelectric positioning device for controlling at least a two dimensional horizontal movement between a tip and a sample surface in a scanning probe microscope, including,a thin walled cylindrical shaped member formed of piezoelectric material having inner and outer surfaces and having a first fixed end and a second opposite movable end,a tip member and a sample member having a sample surface and with the tip member and sample member positioned relative to each other to have the tip member located adjacent to the sample surface and with one of the tip member and sample member mounted on the movable end of the cylindrical shaped member,a plurality of substantially rectangular shaped members positioned around one of the surfaces of the cylindrical shaped member to form opposite pairs of electrodes to control the two dimensional horizontal movement between the tip member and sample surface in accordance with voltages applied to the pairs of electrodes,wherein each rectangular shaped member is split into at least two electrode portions and with particular polarity voltages applied to the individual electrode portions to substantially eliminate tilting of the movable end of the cylindrical shaped member during the two dimensional movements, andwherein the cylindrical shaped member is formed of at least two pieces of piezoelectric material polarized in opposite directions and with the individual electrode portions in each split electrode located on a different one of the pieces of piezoelectric material and with the same polarity voltage applied to the individual electrode portions in each split electrode.

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