Apparatus and method for detecting leaks in packages

• US 5,307,139 A
• Filed: 01/15/1992
• Issued: 04/26/1994
• Est. Priority Date: 08/30/1990
• Status: Expired due to Term

• Current Assignee: Laser Technology Incorporated (Laser Technology)
• Original Assignee: Laser Technology Incorporated (Laser Technology)
• Inventors: Tyson, John II, Newman, John W.
• Primary Examiner(s): Turner, Samuel A.
• Assistant Examiner(s): KEESEE, LACHARLES
• Application Number:
  US07/820,403
• Time in Patent Office: 832 Days
• Field of Search: 356/35.5, 356/353, 356/354, 356/347, 356/348
• US Class Current: 356/35.5
• CPC Class Codes: G01M 3/363 the structure being removably mounted in a test cell

Abstract

This invention detects leaks in small, hermetically sealed packages, especially microchips or other packages of electronic circuits. The invention includes a procedure for detecting fine leaks, and a somewhat different procedure for finding gross leaks. To detect gross leaks, one places the package in a chamber, and varies the pressure in the chamber slightly. If the leak is not too big, one wall of the package, such as its lid, initially becomes deformed, but quickly returns to its original position, due to the leak. If the leak is very large, the wall of the package may not move at all. The position of the wall is monitored with an interferometer, such as an electronic shearography apparatus. The movements of the wall show whether there is a gross leak. In the fine leak test, the package is placed in the chamber and the pressure is changed substantially, thus causing the walls of the package to deform. If there is a fine leak, a deformed wall gradually returns to its initial position. Preferably, the chamber is pressurized with helium to increase the sensitivity of the test. The gradual return of the deformed wall can be measured by the interferometer, and the rate at which the wall returns to its starting position can be used to calculate the leak rate. In another embodiment, a single pixel of a series of interferometric images is analyzed to determine the number of times the pixel changes from a maximum to a minimum and back to a maximum. The latter number is related to the number of wavelengths of deformation, and can be used to compute the leak rate of the package.

Claims

1. A method of inspecting a package for gross leaks, the method comprising the steps of:

a) placing the package in a chamber,

b) varying the pressure in the chamber by an amount sufficient to deform a surface of the package by a small integral number of wavelengths of light,

c) recording an interferometric image of the surface of the package,

d) waiting for an interval of several seconds,

e) varying the pressure in the chamber at a known rate, while simultaneously recording a series of second interferometric images of the surface observed in step (c),

f) comparing the second images with the image of step (c) to determine whether the surface has moved during the interval of step (d), and

g) determining whether the package is leaking by analyzing movement of said surface.

2. The method of claim 1, wherein the comparing step is performed with respect to only a portion of the surface of the package, and wherein said portion is near a region of maximum interferometric response on the surface.

3. The method of claim 1, wherein steps (a) through (f) are simultaneously performed on the package being inspected and on at least one control package.

4. The method of claim 1, further comprising the step of calculating a leak rate based on the amount by which the surface has moved during said interval.

5. The method of claim 1, wherein step (e) comprises the step of allowing gas within the chamber to leak out of the chamber at a known

6. A method of inspecting a package for gross leaks, the method comprising the steps of placing the package in a chamber, and varying the pressure in the chamber at a known rate, while simultaneously recording a series of interferometric images of a surface of the package, comparing said images with each other to determine how much the surface has moved, and determining whether the package is leaking by analyzing movement of said surface.

7. A method of inspecting a package for fine leaks, the method comprising the steps of:

a) placing the package in a chamber,

b) varying the pressure in the chamber by an amount sufficient to deform a surface of the package by a large number of wavelengths of light,

c) recording a first interferometric image of the surface of the package, after completion of step (b),

d) recording a series of second interferometric images of the surface observed in step (c),

e) comparing the second images with the first image to detect changes in displacement of the surface while said second interferometric images are being recorded, and

f) determining whether the package is leaking by analyzing the changes in displacement of said surface,

wherein the chamber is pressurized with helium before the second interferometric images are recorded.

8. The method of claim 7, wherein the comparing step is performed with respect to only a portion of the surface of the package, and wherein said portion is near a region of maximum interferometric response on the surface.

9. The method of claim 7, wherein steps (a) through (e) are simultaneously performed on the package being inspected and on at least one control package.

10. The method of claim 7, further comprising the step of calculating a leak rate based on the amount by which the surface moves during step (e).

11. A method of inspecting a package for leaks, the method comprising the steps of:

a) placing the package in a chamber,

b) varying the pressure in the chamber by an amount sufficient to deform a surface of the package by a small integral number of wavelengths of light,

c) generating a series of interferometric images of at least a portion of the surface, during an interval of time, each image including at least one pixel,

d) determining the number of times that a given pixel changes from a maximum to a minimum to a maximum intensity, during said interval of time, and using said number to determine the deformation of the surface during said interval, and

e) determining whether the package is leaking by analyzing the deformation of said surface.

12. The method of claim 11, wherein the portion of the surface in step (c) is near a region of maximum interferometric response on the surface.

13. The method of claim 11, wherein steps (a) through (d) are simultaneously performed on the package being inspected and on at least one control package.

14. The method of claim 11, wherein the chamber is pressurized with helium.

15. The method of claim 11, wherein the method is repeated for at least one other pixel of the image.

16. The method of claim 11, further comprising the step of changing the pressure in the chamber, at a known rate, while step (c) is being performed.

17. The method of claim 16, wherein the pressure in the chamber is varied by allowing gas to leak out of the chamber.

18. A method of inspecting a package for leaks, the method comprising the steps of placing the package in a chamber, varying the pressure in the chamber, generating a series of interferometric images of at least a portion of the surface, during an interval of time, each image including at least one pixel, determining the number of times that a given pixel changes from a maximum to a minimum to a maximum intensity, during said interval of time, using said number to determine the deformation of the surface during said interval, and determining whether the package is leaking by analyzing the deformation of said surface.

19. The method of claim 18, wherein the chamber is pressurized with helium.

20. The method of claim 18, wherein the method is repeated for at least one other pixel of the image.

21. The method of claim 18, further comprising the step of changing the pressure in the chamber, at a known rate, while the images are generated.

22. A method of determining the stiffness of a surface of a package, the method comprising the steps of:

a) placing the package in a chamber,

b) generating a series of interferometric images of at least a portion of the surface, during an interval of time, each image including at least one pixel,

c) varying the pressure in the chamber at a known rate, so as to deform the surface of the package by a small integral number of wavelengths of light, and

d) determining the number of times that a given pixel changes from maximum to minimum to maximum intensity, during said interval of time, and using said number to determine the deformation of the surface of the package, and

e) determining whether the package is leaking by analyzing the deformation of said surface.

23. The method of claim 22, wherein said portion of the surface is near a region of maximum interferometric response on the surface.

24. The method of claim 22, wherein steps (a) through (d) are simultaneously performed on the package being inspected and on at least one control package.

25. The method of claim 22, wherein the package is inspected for gross leaks at the same time, by determining that the deformation of the surface did not reach an expected value for given package specifications.

26. A method of inspecting a pressurized package for leaks, the method comprising the steps of:

a) generating a series of interferometric images of at least a portion of the surface, during an interval of time, each image including at least one pixel, and

b) determining the number of times that a given pixel changes from maximum to minimum to maximum intensity, during said interval of time, and using said number to determine the deformation of the surface during said interval, and

c) determining whether the package is leaking by analyzing the deformation of said surface.

27. The method of claim 26, wherein said portion of the surface is near a region of maximum interferometric response on the surface.

28. The method of claim 26, wherein steps (a) and (b) are simultaneously performed on the package being inspected and on at least one control package.

29. A method of measuring fine movements or deformations of a surface, the method comprising the steps of:

a) generating a series of interferometric images of at least a portion of the surface, during an interval of time, each image including at least one pixel, and

b) determining the number of times that a given pixel changes from maximum to minimum to maximum intensity, during said interval of time, and using said number to determine the travel or deformation of the surface during said interval.