Spectroscopic sampling accessory having dual measuring and viewing systems

• US 5,311,021 A
• Filed: 03/09/1992
• Issued: 05/10/1994
• Est. Priority Date: 11/13/1991
• Status: Expired due to Fees

• Current Assignee: Connecticut Instrument Corporation
• Original Assignee: Connecticut Instrument Corporation
• Inventors: Messerschmidt, Robert G.
• Primary Examiner(s): Dzierzynski, Paul M.
• Assistant Examiner(s): HANIG, RICHARD E
• Application Number:
  US07/848,603
• Time in Patent Office: 792 Days
• Field of Search: 250/339, 250/341, 250/353, 356/51, 356/73, 356/326, 359/859
• US Class Current: 250/339.07
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes
• CPC Class Codes: G01N 2021/1738 Optionally different kinds of measurements; Method being valid for different kinds of measurement
• CPC Class Codes: G01N 2021/558 Measuring reflectivity and transmission
• CPC Class Codes: G01N 21/255 Details, e.g. use of specially adapted sources, lighting or optical systems
• CPC Class Codes: G01N 21/35 using infrared light G01N21/39 takes precedence
• CPC Class Codes: G01N 21/65 Raman scattering
• CPC Class Codes: G02B 21/04 involving mirrors

Abstract

A microscope accessory uses symmetrical pairs of identical parabolic mirrors as an imaging optic to map a specimen plane with a remote focus. A mask at the remote focus defines at least one measuring area for making spectroscopic measurements while a separate viewing system simultaneously provides a wide field of view of the sample at higher magnification. The sample aperture, defines as 2 sterradians of solid angle surrounding each side of the specimen plane, is multiplexed between and among different functions--such as spectroscopic measurements and visual observations. The high numerical aperture possible using identical symmetrical aberration canceling (ISAC) optics facilitates the aperture multiplexing which has particular advantage in making reflectance measurements without any need for a significant loss of throughput efficiency.

Claims

1. A microspectrometer accessory, comprising:

a first set of identical symmetrical aberration canceling imaging mirror optics which map a first measuring area on a specimen plane which is to be spectroscopically analyzed with at least a first remote focus, the first measuring area having a size and shape, the specimen plane and the first remote focus being at conjugate foci, and

a first mask positioned at the first remote focus, the first mask delimiting an area which substantially defines the size and shape of the first measuring area on the specimen plane.

2. A microspectrometer accessory as claimed in claim 1, wherein the first set of identical symmetrical aberration canceling imaging optics comprise parabolic mirrors.

3. A microspectrometer accessory as claimed in claim 1, further comprising a viewing system which projects an observation area at the specimen plane to a remote image plane, the observation area being greater in size than the measuring area.

4. A microspectrometer accessory as claimed in claim 1, wherein the observation area has a dimension of between 1 and 2 mm and the measuring area has a dimension of substantially 100 microns or less.

5. A microspectrometer accessory as claimed in claim 1, further comprising:

a second set of identical symmetrical aberration canceling imaging optics which maps substantially the same specimen plane with a second remote focus, the specimen plane and the second remote focus being at conjugate foci, and

a second mask positioned at the second remote focus, the second mask delimiting a second measuring area on the specimen plane.

6. A microspectrometer accessory as claimed in claim 5, wherein the first and second measuring areas on the specimen plane have substantially the same size, shape and relative position as mapped with the specimen plane.