Processor diagnostics using switch settings

• US 5,313,241 A
• Filed: 11/25/1992
• Issued: 05/17/1994
• Est. Priority Date: 11/25/1992
• Status: Expired due to Fees

• Current Assignee: Eastman Kodak Company
• Original Assignee: Eastman Kodak Company
• Inventors: Seim, April M.
• Primary Examiner(s): RUTLEDGE, DELLA J
• Application Number:
  US07/981,807
• Time in Patent Office: 538 Days
• Field of Search: 354/298, 354/324, 355/205-209
• US Class Current: 396/578
• CPC Class Codes: G03D 13/007 Processing control, e.g. test strip, timing devices

Abstract

A processor for developing latent images on a photosensitive material includes at least one processing station wherein a processing solution engages the photosensitive material, and a drying station at which the photosensitive material is dried, means for initiating a plurality of diagnostic tests for activating components of the processor, a controller coupled to the components of the processor for selectively activating one or more of the components according to a selected one of a plurality of predetermined diagnostic tests, a plurality of switches connected to the controller for selecting from among the plurality of diagnostic tests, and an initiator for starting the selected test a predetermined time after the switches are set.

Claims

1. In a processor for developing latent images on a photosensitive material, the processor having at least one processing station wherein a processing solution engages the material and a drying station wherein the material is dried, means for initiating a plurality of diagnostic tests for activating components of the processor, the improvement comprising:

control means coupled to the components of the processor for selectively activating one or more of the components according to a selected one of a plurality of predetermined diagnostic tests;

switch means connected to the control means for selecting from among the plurality of diagnostic tests;

initiation means for starting the selected test a predetermined time after the switch means are set; and

in which the control means includes means responsive to the switch means for terminating a diagnostic test and resetting the initiation means when the switch means is changed to select another diagnostic test.

2. The processor of claim 1 wherein the control means comprises a programmed microprocessor and interface means connected between the microprocessor and the components for activating the components upon receiving activation signals from the microprocessor.

3. The processor of claim 2 wherein the switch comprises a plurality of switches connected to the microprocessor, the selection depending on the setting of the plurality of switches.

4. The processor of claim 2 wherein the switches comprise single pole single throw switches.

5. The processor of claim 4 in which the switches are arranged to signal a binary code and the microprocessor reads the code from the switches.

6. The processor of claim 5 in which the binary code uniquely identifies one of the diagnostic tests.

7. The processor of claim 8 also comprising a switch for selecting between a diagnostic mode and a normal mode.

8. The processor of claim 1 also comprising a plurality of sensors and a plurality of indicators, wherein the plurality of diagnostic tests comprises at least one test in which the indicators are configured to indicate the status of the sensors.

9. In a method for processing latent images on a photosensitive material including the steps of developing the image with the developer solution, fixing the developed image with a fixed solution, washing the material to remove processing solution therefrom, drying the material, the improvement for individually trouble shooting a plurality of components comprising the steps of:

pre-programming a plurality of diagnostic tests;

providing plurality of switches for selecting one test from the plurality of pre-programmed tests;

monitoring the state of the switches to determine whether the state has changed during a predetermined period; and

initiating a test according to the setting of the switches after the predetermined period has passed since a last change in state of any of the switches.

12. The method of claim 9 in which providing a plurality of switches comprises providing a mode switch and a plurality of selector switches and said monitoring step comprises monitoring the state of said mode switch to determine whether to initiate a diagnostic mode, and monitoring the state of the selection switches to select a diagnostic test from a plurality of diagnostic tests.

10. In a method for processing latent images on a photosensitive material including the steps of developing the image with the developer solution, fixing the developed image with a fixed solution, washing the material to remove processing solution therefrom, drying the material, the improvement for individually trouble shooting a plurality of components comprising the steps of:

providing a plurality of switches;

monitoring the state of the switches to determine whether the state has changed during a predetermined period; and

initiating a test according to the setting of the switches after the predetermined period has passed since a last change in state of any of the switches; and

terminating a test if the state of the switches changes during the test.

11. The method of claim 10 comprising repeating the monitoring and initiating steps after the termination.