×

Apparatus and method of rapidly measuring hemispherical scattered or radiated light

  • US 5,313,542 A
  • Filed: 11/30/1992
  • Issued: 05/17/1994
  • Est. Priority Date: 11/30/1992
  • Status: Expired due to Fees
First Claim
Patent Images

1. A scatterometer for measuring light reflected angularly from a point comprising:

  • a power controlled laser light source for illuminating the point,a fiber optic bundle having a plurality of individual fiber optic elements having a common field of view which is the point for collecting light beams reflected therefrom,a camera for converting the reflected light beams into electrical signals,the signal level of the collected light beams being raised above the dark current noise level of the camera by predetermined amounts to form sequential images stored in a frame grabber, andthe frame grabber also sequentially digitizing and storing images and reconstructing therefrom a single scatter profile of light emanating from the point while simultaneously scaling out the signal level increases.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×