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Optical image analyzer using optical correlation and opto-electronic feedback

  • US 5,323,472 A
  • Filed: 02/11/1993
  • Issued: 06/21/1994
  • Est. Priority Date: 03/27/1990
  • Status: Expired due to Term
First Claim
Patent Images

1. An optical image analysis device, comprising:

  • a first lens for projecting a spatially coherent light beam onto an image plane;

    a first spatial light modulator for introducing an input image onto said image plane through which said light beam passes, said input image corresponding to an object in question;

    a second lens positioned downstream from said image plane by its focal length so as to receive said light beam after said light beam passes through said first spatial light modulator, said second lens producing a Fourier transformed input image at a Fourier plane positioned downstream from said second lens by a distance of the second lens focal length;

    a second spatial light modulator positioned at said Fourier plane;

    driving means coupled to said second spatial light modulator to produce a Fourier transformed reference image using a predetermined reference image and predetermined filter parameters, said predetermined filter parameters corresponding to parameters of said predetermined reference image;

    a third lens positioned downstream of said Fourier plane by a focal length of said third lens, said third lens correlating said Fourier transformed input image and said Fourier transformed reference image by producing a correlation image at a focal plane of said third lens;

    imaging means for detecting a magnitude of correlation of said correlation image;

    feedback means, coupled to said imaging means and said driving means for varying said Fourier transformed reference image in a Fourier domain by varying parameter values of said predetermined filter parameters until said magnitude of correlation is maximized to identify best fit parameter values; and

    identifying means for identifying said object in question according to said predetermined reference image and said best fit parameter values.

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