Target for calibrating and testing infrared devices
First Claim
1. An improved target for testing and calibrating a detection device, comprising;
- a metal substrate;
a first layer of high emissivity material formed on said metal substrate;
a second layer of low emissivity coated on said first layer; and
an aperture extending through said metal substrate, said first layer and said second layer.
1 Assignment
0 Petitions
Accused Products
Abstract
An improved target for testing and calibrating a detection device. The target (10) includes a metal substrate (12) with a first layer (14) of high emissivity material and a second layer (16) of low emissivity material are deposited thereon. In the specific implementation, the substrate (12) is copper, the first layer (14) is chromium-oxide and the second layer (16) is chrome. In the illustrative embodiment, an aperture (22) is drilled through the substrate (12) and the first and second layers (14, 16) thereon. An infrared emitter (20) is located at the aperture (22) to provide point source radiation. A conventional heater (26) is applied to the back surface of the target. A pattern is etched on second layer (16) on the front surface of the target using electron beam lithography. The use of a metal substrate (12) allows for the drilling of small holes more easily than in the conventional target. In addition, the metal substrate (12) provides good temperature uniformity without use of a separate metal plate due to the higher thermal conductivity of metal over glass. The elimination of the separate metal plate also simplifies target assembly and reduces target costs.
28 Citations
20 Claims
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1. An improved target for testing and calibrating a detection device, comprising;
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a metal substrate; a first layer of high emissivity material formed on said metal substrate; a second layer of low emissivity coated on said first layer; and an aperture extending through said metal substrate, said first layer and said second layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An improved target for testing and calibrating a detection device comprising:
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a metal substrate; a first layer of high emissivity material on said metal substrate; a second layer of low emissivity coated on said first layer; said substrate having an aperture which extends through said first and second layers; a source of optical energy disposed to radiate optical energy through said aperture; and means for applying heat to said metal substrate. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. An improved method of fabricating emissivity targets, including the steps of:
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depositing a first layer of high emissivity material on a metal substrate; depositing a second layer of low emissivity material on said first layer; and forming an aperture extending through said substrate and said first and second layers. - View Dependent Claims (18, 19, 20)
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Specification