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Method for testing electronic assemblies in the presence of noise

  • US 5,327,437 A
  • Filed: 11/25/1991
  • Issued: 07/05/1994
  • Est. Priority Date: 11/25/1991
  • Status: Expired due to Fees
First Claim
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1. A method for pass/fail testing an electronic assembly with a desired confidence target level by measuring a parameter in the presence of noise with known noise characteristics and comparing said measurement with a predetermined limit, said method comprising the steps of:

  • A. calculating at least one statistical limit value from said confidence target level;

    B. obtaining a test value which represents a measured value of said parameter;

    C. calculating an average measurement value from all test values of said parameter including the test value obtained in step B;

    D. calculating a statistical value from said predetermined limit, said average measurement value calculated in step C and said noise characteristics;

    E. repeating steps B through D when said statistical value calculated in step D has a predetermined relationship to said statistical limit value calculated in step A;

    F. resolving the pass/fail status of said assembly by comparing said average measurement value to said predetermined limit when said statistical value calculated in step D has a relationship other than said predetermined relationship to said statistical limit value calculated in step A.

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