Micromachined rate and acceleration sensor

• US 5,331,853 A
• Filed: 01/21/1992
• Issued: 07/26/1994
• Est. Priority Date: 02/08/1991
• Status: Expired due to Term

• Current Assignee: L-3 Communications Corporation (L3Harris Technologies, Inc.)
• Original Assignee: Alliedsignal Inc. (Honeywell International Inc.)
• Inventors: Hulsing, Rand H. II
• Primary Examiner(s): CHAPMAN JR, JOHN E
• Application Number:
  US07/823,102
• Time in Patent Office: 917 Days
• Field of Search: 73/505, 73/510, 73/511, 73/517 AV, 73/517 R
• US Class Current: 73/514.29
• CPC Class Codes: F02G 1/044 having at least two working members, e.g. pistons, delivering power output
• CPC Class Codes: F02G 1/0445 Engine plants with combined cycles, e.g. Vuilleumier
• CPC Class Codes: F16L 37/24 in which the connection is made by inserting one member axially into the other and rotating it to a limited extent, e.g. with bayonet action
• CPC Class Codes: G01C 19/5719 using planar vibrating masses driven in a translation vibration along an axis
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/097 by vibratory elements
• CPC Class Codes: G01P 15/18 in two or more dimensions
• CPC Class Codes: G01P 2015/0828 the mass being of the paddle type being suspended at one of its longitudinal ends

Abstract

A sensor (10) is disclosed for measuring the acceleration and angular rotation rate of a moving body and is micromachined from a silicon substrate (16). First and second accelerometers (32a and b) are micromachined from the silicon substrate (16), each having a force sensing axis (38) and producing an output signal of the acceleration of the moving body along its force sensing axis (38). The first and second accelerometers (32a and b) are mounted within the substrate (16) to be moved along a vibration axis (41). The first and second accelerometers (32a and b) are vibrated or dithered to increase the Coriolis component of the output signals from the first and second accelerometers (32a and b). A sinusoidal drive signal of a predetermined frequency is applied to a conductive path (92) disposed on each of the accelerometers. Further, magnetic flux is directed to cross each of the conductive paths (92), whereby the interaction of the magnetic flux and of the drive signal passing therethrough causes the desired dithering motion. A link (72) is formed within the silicon substrate (16) and connected to each of the accelerometers (32a and b), whereby motion imparted to one results in a like, but opposite motion applied to the other accelerometer (32). Further, a unitary magnet (20) and its associated flux path assembly direct and focus the magnetic flux through the first and second accelerometers (32a and b) formed within the silicon substrate (16).

Claims

1. A substrate for use in an acceleration and angular rate sensor comprising:

first and second accelerometers formed in said substrate, said first and second accelerometers having generally parallel force sensing axes;

a dither frame formed in said substrate;

mounting means formed in said substrate for mounting said first and second accelerometers to said dither frame, said mounting means adapted to allow said first and second accelerometers to dither along a dither axis, said dither axis being perpendicular to said force sensing axes of said first and second accelerometers;

a linking means interconnecting said first and second accelerometers for allowing said first and second accelerometers to dither at the same frequency; and

said linking means further providing means for imparting a reaction force on said first accelerometer along said dither axis when an action force is imparted on said second accelerometer along said dither axis, said action and reaction forces being of substantially equal magnitude and being oppositely directed.

2. A substrate as claimed in claim 3, wherein said linking means is interiorly disposed between said first and second accelerometers.

3. A substrate as claimed in claim 1 and further comprising torsion inhibiting means connecting said first and second accelerometers to said ditherframe to place torsional modes of movement of said first and second accelerometers at a frequency significantly above the natural frequency of said first and second accelerometers,

4. A substrate as claimed in claim 1 wherein said mounting means further provides means for allowing said first and second accelerometers to dither along said dither axis in a pure linear manner,

5. A substrate as claimed in claim 1 wherein said linking means comprises a pair of exteriorly disposed links interconnecting said first and second accelerometers for allowing said first and second accelerometers to dither at the same frequency,

6. A generally planar monolithic substrate for use in an acceleration and angular rate sensor comprising:

first and second accelerometers formed in said substrate, said first and second accelerometers having generally parallel linear force sensing axes for measuring linear acceleration therealong, each of said first and second accelerometers having a proof mass, a support frame, and at least one flexure connecting said proof mass to said support frame;

a dither frame formed in said substrate;

a first pair of substantially parallel mounting flexures formed in said substrate and connecting said support frame of said first accelerometer to a first side of said dither frame, said first pair of substantially parallel mounting flexures adapted to allow said first accelerometer to dither along a first dither axis, said first dither axis being perpendicular to said force sensing axes of said first and second accelerometers; and

a second pair of substantially parallel mounting flexures formed in said substrate and connecting said support frame of said second accelerometer to a second side of said dither frame, said second pair of substantially parallel mounting flexures adapted to allow said second accelerometer to dither along a second dither axis.

7. A substrate as claimed in claim 6 wherein said first and second dither axes coincide,

8. A substrate as claimed in claim 7 and further comprising linking means formed in said substrate interconnecting said first and second accelerometers for allowing said first and second accelerometers to dither at the same frequency.

9. A substrate as claimed in claim 8 wherein said linking means further provides means for imparting a reaction force on said first accelerometer along said dither axis when an action force is imparted on said second accelerometer along said dither axis, said action and reaction forces being of substantially equal magnitude and being oppositely directed,

10. A substrate as claimed in claim 8 wherein said linking means is interiorly disposed between said first and second accelerometers.

11. A substrate as claimed in claim 8 wherein said linking means comprises:

a link;

a pivot flexure connecting said link to said dither frame, said pivot flexure allowing said link to pivot about a pivot point;

a first flexure connecting a first end of said link to said first accelerometer; and

a second flexure connecting a second end of said link to said second accelerometer.

12. A substrate as claimed in claim 11 wherein said link comprises:

a U-shaped member; and

a pair of lever arms extending from said U-shaped member, said first flexure being connected to one lever arm of said pair of lever arms, said second flexure being connected to the other lever arm of said pair of lever arms.

13. A substrate as claimed in claim 8 wherein said linking means comprises:

a link having a mid-portion with a circular arc flexure, said link further having first and second oppositely extending arms extending from said mid-portion;

a fulcrum connecting said circular arc flexure to said dither frame;

a first flexure connecting said first arm of said link to said first accelerometer; and

a second flexure connecting said second arm of said link to said second accelerometer.

14. A substrate as claimed in claim 6 wherein said first and second pairs of flexures connect said first and second accelerometers to opposite sides of said dither frame.

15. A substrate as claimed in claim 6 and further comprising a pair of exteriorly disposed linking means formed in said substrate and interconnecting said first and second accelerometers to allow said first and second accelerometers to dither at the same frequency.

16. A substrate as claimed in claim 15 wherein said pair of exteriorly disposed linking means further provides means for imparting a reaction force on said first accelerometer along said first dither axis when an action force is imparted on said second accelerometer along said second dither axis, said action and reaction forces being of substantially equal magnitude and being oppositely directed.

17. A substrate as claimed in claim 16 wherein each of said exteriorly disposed linking means comprises:

a link;

a pivot flexure connecting said link to said dither frame, said pivot flexure allowing said link to pivot about a pivot point;

a first flexure connecting a first end of said link to said first accelerometer; and

a second flexure connecting a second end of said link to said second accelerometer.

18. A substrate as claimed in claim 17 wherein said link comprises:

a U-shaped member; and

a pair of lever arms extending from said U-shaped member, said first flexure being connected to one lever arm of said pair of lever arms, said second flexure being connected to the other lever arm of said pair of lever arms.

19. A substrate as claimed in claim 7 and further comprising torsion inhibiting means connecting said first and second accelerometers to said dither frame for placing torsional modes of movement of said first and second accelerometers at a frequency significantly above the natural frequency of said first and second accelerometers.

20. A substrate as claimed in claim 19 wherein said torsion inhibiting means comprises:

a first L-shaped flexure extending between said support frame of said first accelerometer and said second side of said dither frame; and

a second L-shaped flexure extending between said support frame of said second accelerometer and said first side of said dither frame.

21. A substrate as claimed in claim 20 wherein said first L-shaped flexure extends from an exterior side of said support frame of said first accelerometer and wherein said second L-shaped flexure extends from an exterior side of said support frame of said second accelerometer.