Technique for substantially eliminating temperature induced measurement errors from a coriolis meter

• US 5,331,859 A
• Filed: 02/08/1993
• Issued: 07/26/1994
• Est. Priority Date: 07/11/1991
• Status: Expired due to Term

• Current Assignee: Micro Motion Incorporated (Emerson Electric Company)
• Original Assignee: Micro Motion Incorporated (Emerson Electric Company)
• Inventors: Zolock, Michael J.
• Primary Examiner(s): Goldstein, Herbert
• Application Number:
  US08/014,618
• Time in Patent Office: 533 Days
• Field of Search: 73/3, 73/861.37, 73/861.38, 324/76.52, 324/76.77, 324/76.82, 324/601, 324/617, 364/484, 364/510, 364/571.01, 364/571.05
• US Class Current: 73/861.356
• CPC Class Codes: G01F 1/8413 means for influencing the flowmeter's motional or vibrational behaviour, e.g., conduit support or fixing means, or conduit attachments
• CPC Class Codes: G01F 1/8431 electronic circuits
• CPC Class Codes: G01F 1/8436 signal processing
• CPC Class Codes: G01F 1/8477 with multiple measuring conduits
• CPC Class Codes: G01F 15/024 involving digital counting

Abstract

Apparatus and accompanying methods for inclusion in a Coriolis meter that substantially eliminate temperature induced measurement errors which might otherwise be produced by performance differences existing between the separate input channels contained in the meter. Specifically, two pairs of input channels are used in the meter. In operation, the meter repetitively measures the internal phase delay of each of these pairs and then subtracts the delay associated with each pair from actual flow based measurement data subsequently obtained therefrom. While one channel pair is measuring actual flow, the other channel pair is measuring its internal phase delay, with the channels being continuously cycled between these functions. Because both channel pairs are cycled at a sufficiently rapid rate, the current value of the internal phase delay for each of the pairs accurately reflects any temperature induced changes then occurring in the performance of that pair thereby eliminating substantially all temperature induced error components from the flow measurements subsequently obtained therefrom. In addition, the meter measures flow tube temperature in a manner that removes temperature induced errors therefrom.

Claims

1. Circuitry for measuring first and second input signals comprising:

first, second and third input channels, having first, second and third channel inputs, for respectively producing first, second and third channel output signals in response to a predetermined characteristic of said first, second and third channel inputs;

measurement means comprising;

means, responsive to said first, second and third channel output signals for determining first and second internal offset values respectively associated with first and second pairs of said input channels and for respectively measuring first and second signal values through said first and second pairs so as to produce first and second measured signal values; and

means, responsive to said first and second measured signal values and said first and second internal offset values, for respectively compensating said first and second measured signal values by said first and second internal offset values to yield first and second compensated values, respectively, as measurements of said first and second input signals;

means for selectively routing said first or second input signals to corresponding inputs of said first, second and third input channels; and

control means, connected to said selectively routing means and to said measurement means, for specifying which one of said input signals is to be simultaneously applied as input to each one of the input channels and for operating said selectively routing means and said first and second pairs of the input channels in conjunction with said measurement means such that while the first pair is determining the first internal offset delay value the second pair is measuring the second signal value and for reversing operation of said channel pairs after a pre-defined interval of time has elapsed such that the first pair will measure the signal value while the second pair will determine the second internal offset delay value so as to continuously measure the first and second input signals and compensate measurements of the first and second input signals produced by each of the channel pairs by the value of the internal offset associated with that particular channel pair.

2. The circuitry in claim 1 further comprising:

input multiplexor means, connected to the first and second input signals, for providing first, second and third multiplexor outputs and, operative in response to select signals, for selectively routing said first or second input signals to each of said first, second or third multiplexor outputs;

said first, second and third channel inputs being respectively connected to the first, second and third multiplexor outputs;

first and second measuring means connected to the first and second channel output signals, and to said second and third channel output signals, respectively, so as to define the first and second channel pairs, wherein said first and second channel pairs respectively measure the pre-determined characteristic of the first and second channel pair output signals and said second and third channel pair output signals; and

said control means comprises;

logic means, connected to said first and second measuring means and to said input multiplexor means, for generating said select signals so as to continuously route said first or second input signal to the second multiplexor output and to selectively route either said first or second signal to each of said first and third multiplexor outputs so as to operate said first and second channel pairs such that both of said channel pairs simultaneously operate in differing ones of first or second modes and each of said channel pairs repetitively cycles between the first and second modes;

wherein;

for one of said channel pairs operating in said first mode the first or second input signal is applied to both the channel inputs of said one channel pair such that a first measured value produced thereby reflects a value of the pre-defined offset internally produced by said one channel pair; and

for an opposite one of said channel pairs operating in said second mode, the first and second input signals are applied to corresponding ones of said channel inputs of said opposite channel pair such that a second measured value produced thereby reflects a desired characteristic of said first and second input signals.

3. The circuitry in claim 2 wherein, for either one of said first or second channel pairs, the first mode comprises, in succession, a first switching interval during which one of the channel inputs to the one channel pair is switched through said input multiplexor means from the second input signal to the first input signal, a zeroing interval during which the one channel pair generates a plurality of first measured values, and a second switching interval during which the one channel input is switched through the input multiplexor means back from said first input signal to said second input signal.

4. The circuitry in claim 3 wherein the first and second switching intervals are equal in duration to each other and are each sufficiently long enough such that switching transients occurring during each of these intervals decrease to a pre-defined level.

5. The circuitry in claim 4 wherein said logic means further comprises:

means for generating said select signals and for providing state information signifying a current state of each one of said channel pairs; and

processor means, operative in response to said first and second measured values produced by each of the channel pairs and to said state information, for compensating each of a plurality of second measured values produced by said one channel pair operating in the second mode by the first measured value previously obtained for that channel pair during its operation in the first mode.

6. The circuitry in claim 5 wherein said desired characteristic is a time difference (at) occurring between corresponding points on said first and second input signals, and said first measured value for the first and second channel pairs respectively reflect internal phase delay for said first and second channel pairs.

7. The circuitry in claim 6 wherein said first and second measurement means each comprises a counter.

8. The circuitry in claim 7 wherein said predetermined characteristic for said signals applied to said first, second or third channel inputs is given by a time when a signal applied to said first, second or third channel inputs respectively equals a pre-defined amplitude.

9. In circuitry for measuring first and second input signals, a method comprising the steps of:

respectively producing through first, second and third input channels having first, second and third channel inputs first, second and third channel output signals in response to a predetermined characteristic of said first, second and third channel inputs;

determining, in response to said first, second and third channel output signals, first and second internal offset values respectively associated with first and second pairs of said input channels and respectively measuring first and second signal values through said first and second pairs so as to produce first and second measured signal values;

respectively compensating, in response to said first and second measured signal values and said first and second internal offset values, the first and second measured signal values by said first and second internal offset values to yield first and second compensated values, respectively, as measurements of said first and second input signals;

selectively routing said first or second input signals to corresponding inputs of said first, second and third input channels; and

specifying, to said selectively routing step, which one of said input signals is to be simultaneously applied as input to each one of the input channels, operating said selectively routing means and said first and second pairs of the input channels in conjunction with said measurement means such that while the first pair is determining the first internal offset delay value the second pair is measuring the second signal value and reversing operation of said channel pairs after a pre-defined interval of time has elapsed such that the first pair will measure the signal value while the second pair will determine the second internal offset delay value so as to continuously measure the first and second input signals and compensate measurements of the first and second input signals produced by each of the channel pairs by the value of the internal offset associated with that particular channel pair.

10. The method in claim 9 further comprising the steps of:

providing through input multiplexor means, connected to the first and second input signals, first, second and third multiplexor outputs and, operative in response to select signals, for selectively routing said first or second input signals to each of said first, second or third multiplexor outputs;

said first, second and third channel inputs being respectively connected to the first, second and third multiplexor outputs;

first and second measuring means connected to the first and second channel output signals, and to said second and third channel output signals, respectively, so as to define the first and second channel pairs, wherein in said first and second channel pairs respectively measuring the pre-determined characteristic of the first and second channel pair output signals and said second and third channel pair output signals; and

generating said select signals so as to continuously route said first or second input signal to the second multiplexor output and to selectively route either said first or second signal to each of said first and third multiplexor outputs so as to operate said first and second channel pairs such that both of said channel pairs simultaneously operate in differing ones of first or second modes and each of said channel pairs repetitively cycles between the first and second modes;

wherein;

for one of said channel pairs operating in said first mode applying the first or second input signal to both the channel inputs of said one channel pair such that a first measured value produced thereby reflects a value of the pre-defined offset internally produced by said one channel pair; and

for an opposite one of said channel pairs operating in said second mode applying the first and second input signals to corresponding ones of said channel inputs of said opposite channel pair such that a second measured value produced thereby reflects a desired characteristic of said first and second input signals.

11. The method in claim 10 wherein, for either one of said first or second channel pairs, the first mode comprises, in succession, a first switching interval during which one of the channel inputs to the one channel pair is switched through said input multiplexor means from the second input signal to the first input signal, a zeroing interval during which the one channel pair generates a plurality of first measured values, and a second switching interval during which the one channel input is switched through the input multiplexor means back from said first input signal to said second input signal.

12. The method in claim 11 wherein the first and second switching intervals are equal in duration to each other and are each sufficiently long enough such that switching transients occurring during each of these intervals decrease to a pre-defined level.

13. The method in claim 12 further comprising the steps of:

generating said select signals and for providing state information signifying a current state of each one of said channel pairs; and

compensating, in response to said first and second measured values produced by each of the channel pairs and to said state information, each of a plurality of second measured values produced by said one channel pair operating in the second mode by the first measured value previously obtained for that channel pair during its operation in the first mode.

14. The method in claim 13 wherein said desired characteristic is a time difference (Δ

t) occurring between corresponding points on said first and second input signals, and said first measured value for the first and second channel pairs respectively reflect internal phase delay for said first and second channel pairs.

15. The method in claim 14 wherein said predetermined characteristic for said signals applied to said first, second or third channel inputs is given by a time when a signal applied to said first, second or third channel inputs respectively equals a pre-defined amplitude.