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Aberration free lens system for electron microscope

  • US 5,336,891 A
  • Filed: 06/16/1992
  • Issued: 08/09/1994
  • Est. Priority Date: 06/16/1992
  • Status: Expired due to Fees
First Claim
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1. A system for reducing aberration of a charged particle beam, comprising:

  • means for generating a charged particle beam; and

    building block means for generating at least one of (1) a magnetic field and (2) a combination of a magnetic field and an electrostatic field for controlling said charged particle beam from a focal point at an entrance to said building block means to a focal point at an exit from said building block means and each building block of said building block means having coefficients of spherical and chromatic aberration equal and opposite and having a numerical value which is an integral multiple of one-half a characteristic length l being a distance at which said charged particle beam is focused along the axis of a uniform magnetic field generated by said building block means.

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