Phase noise measurements utilizing a frequency down conversion/multiplier, direct spectrum measurement technique

• US 5,337,014 A
• Filed: 12/24/1992
• Issued: 08/09/1994
• Est. Priority Date: 06/21/1991
• Status: Expired due to Term

• Current Assignee: Advanced Testing Technologies, Inc., Harris Corporation (L3Harris Technologies, Inc.)
• Original Assignee: Advanced Testing Technologies, Inc., Harris Corporation (L3Harris Technologies, Inc.)
• Inventors: Najle, Esteban G., Buckley, Robert M.
• Primary Examiner(s): Wieder, Kenneth A.
• Assistant Examiner(s): Solis, Jose M.
• Application Number:
  US07/996,791
• Time in Patent Office: 593 Days
• Field of Search: 324/613, 324/85, 324/622, 324/76.23, 324/76.43, 324/, 324/76.52, 324/76.77, 455/226.1
• US Class Current: 324/613
• CPC Class Codes: G01R 29/26 Measuring noise figure; Measuring signal-to-noise ratio

Abstract

An improved circuit for phase noise measurements utilizing a frequency down conversion/multiplier and direct spectrum measurement technique. The circuit is particularly useful for field test environments where laboratory instrumentation is normally not available, and fast and accurate phase noise measurements are required. The phase noise measuring circuit includes a frequency mixer which has a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise with a fixed center frequency. The frequency mixer produces a down converted signal comprising the frequency difference signal of the first and second input signals. A lowpass filter passes the down converted signal to a frequency multiplier circuit which produces a second harmonic signal, a fourth harmonic signal, and higher harmonic signals of the down converted signal. A narrow bandpass filter passes a selected one of the second or higher harmonic signals to a low noise amplifier, the output of which is passed to a direct approach spectrum analyzer for measurement of the phase noise of the device under test. A second embodiment includes an additional multiplication stage which includes a second frequency multiplier circuit, a second narrow bandpass filter, and a second low noise amplifier, the output of which is passed to the direct approach spectrum analyzer for measurement of he phase noise of the device under test.

Claims

1. A phase noise measuring circuit for measuring the noise a device under test, comprising:

a. a frequency mixer circuit, having a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise and a fixed center frequency, for mixing the first and second input signals to produce a down converted signal comprising the frequency difference signal of the first and second input signals;

b. a down converted signal lowpass filter for passing the down converted signal;

c. a frequency multiplier circuit, having the down converted signal as an input, for producing at its output a second harmonic signal, a fourth harmonic signal, an eighth harmonic signal, a sixteenth harmonic signal, and higher harmonic signals, of the down converted signal;

d. a narrow bandpass filter, coupled to the output of said frequency multiplier circuit, for passing to its output one of the second harmonic, fourth harmonic, eighth harmonic, sixteenth harmonic, or higher harmonic, signals of the frequency multiplier circuit;

e. an amplifier, coupled to the output of said narrow bandpass filter, for multiplying the output signal of the narrow bandpass filter and passing the amplified signal to its output; and

f. a direct approach spectrum analyzer, connected directly to said amplifier output, for analyzing the output signal of said amplifier to measure the phase noise of the device under test.

2. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 1, wherein the fixed center frequency of said reference stable oscillator is selected to produce a harmonic signal passed by said narrow bandpass filter having an intermediate frequency in the most sensitive range of the spectrum analyzer.

3. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 2, wherein the second input signal from said reference stable oscillator has a phase noise which is less than the phase noise of the device under test by at least 10 dB.

4. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 3, wherein said direct approach spectrum analyzer includes a local oscillator, and the combined actions of said frequency mixer circuit and said frequency multiplier circuit increases the phase noise of the down converted and multiplied signal of the device under test by at least 12 dB, which enables the spectrum analyzer to directly perform a phase noise measurement thereon without being seriously adversely affected by phase noise of the local oscillator of the spectrum analyzer, and also results in the frequency of the measured signal being further away in frequency from the frequency of the down converted signal, which results in improved phase noise characteristics of the direct approach spectrum analyzer local oscillator.

5. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 4, further comprising a coaxial switch coupled between said down converted lowpass signal filter and said frequency multiplier circuit, and having a first switch position which passes the output of said down converted lowpass signal filter to said direct approach spectrum analyzer for calibration purposes, and a second switch position which passes the output of said down converted lowpass signal filter to said frequency multiplier circuit for a phase noise measurement of the device under test.

6. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 1, wherein the second input signal from said reference stable oscillator has a phase noise which is less than the phase noise of the device under test by at least 10 dB.

7. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 1, wherein said direct approach spectrum analyzer includes a local oscillator, and the combined actions of said frequency mixer circuit and said frequency multiplier circuit increases the phase noise of the down converted and multiplied signal of the device under test by at least 12 dB, which enables the spectrum analyzer to directly perform a phase noise measurement thereon without being seriously adversely affected by phase noise of the local oscillator of the spectrum analyzer, and also results in the frequency of the measured signal being further away in frequency from the frequency of the down converted signal, which results in improved phase noise characteristics of the direct approach spectrum analyzer local oscillator.

8. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 1, further comprising a coaxial switch coupled between said down converted lowpass signal filter and said frequency multiplier circuit, and having a first switch position which passes the output of said down converted lowpass signal filter to said direct approach spectrum analyzer for calibration purposes, and a second switch position which passes the output of said down converted lowpass signal filter to said frequency multiplier circuit for a phase noise measurement of the device under test.

9. A phase noise measuring circuit for measuring the phase noise of a device under test, comprising:

a. a frequency mixer circuit, having a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise and a fixed center frequency, for mixing the first and second input signals to produce a down converted signal comprising the frequency difference signal of the first and second input signals;

b. a down converted signal lowpass filter for passing the down converted signal;

c. a frequency multiplier circuit, having the down converted signal as an input, for producing at its output a second harmonic signal, a fourth harmonic signal, an eighth harmonic signal, a sixteenth harmonic signal, and higher harmonic signals, of the down converted signal;

d. a narrow bandpass filter, coupled to the output of said frequency multiplier circuit, for passing to its output one of the second harmonic, fourth harmonic, eighth harmonic, sixteenth harmonic, or higher harmonic, signals of the frequency multiplier circuit;

e. an amplifier, coupled to the output of said narrow bandpass filter, for amplifying the output signal of said narrow bandpass filter and passing the amplified signal to its output;

f. a second frequency multiplier circuit, coupled to the output of said amplifier, for producing at an output a second harmonic signal, a fourth harmonic signal, an eighth harmonic signal, a sixteenth harmonic signal, and higher harmonic signals, of the output signal of said amplifier;

g. a second narrow bandpass filter, coupled to the output of said second frequency multiplier circuit, for passing to its output one of the second harmonic, fourth harmonic, eighth harmonic, sixteenth harmonic, or higher harmonic, signals of said second frequency multiplier circuit;

h. a second amplifier, coupled to the output of said second narrow bandpass filter, for amplifying the output signal of said second narrow bandpass filter and passing the amplified signal to its output; and

i. a direct approach spectrum analyzer, connected directly to said second amplifier output, for analyzing the output signal of said second amplifier to measure the phase noise of the device under test.

10. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 9, wherein the fixed center frequency of said reference stable oscillator is selected to produce a harmonic signal passed by said second narrow bandpass filter having an intermediate frequency in the most sensitive range of the spectrum analyzer.

11. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 10, wherein the second input signal from said reference stable oscillator has a phase noise which is less than the phase noise of the device under test by at least 10 dB.

12. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 11, wherein said direct approach spectrum analyzer includes a local oscillator, and the combined actions of said frequency mixer circuit and said frequency multiplier circuits increases the phase noise of the down converted and multiplied signal of the device under test by at least 12 dB, which enables the spectrum analyzer to directly perform a phase noise measurement thereon without being seriously adversely affected by phase noise of the local oscillator of the spectrum analyzer, and also results in the frequency of the measured signal being further away in frequency from the frequency of the down converted signal, which results in improved phase noise characteristics of the direct approach spectrum analyzer local oscillator.

13. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 12, further comprising a coaxial switch coupled between said down converted lowpass signal filter and said frequency multiplier circuit, and having a first switch position which passes the output of said down converted lowpass signal filter to said direct approach spectrum analyzer for calibration purposes, and a second switch position which passes the output of said down converted lowpass signal filter to said frequency multiplier circuit for a phase noise measurement of the device under test.

14. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 9, wherein the second input signal from said reference stable oscillator has a phase noise which is less than the phase noise of the device under test by at least 10 d/B.

15. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 9, wherein said direct approach spectrum analyzer includes a local oscillator, and the combined actions of said frequency mixer circuit and said frequency multiplier circuits increases the phase noise of the down converted and multiplied signal of the device under test by at least 12 dB, which enables the spectrum analyzer to directly perform a phase noise measurement thereon without being seriously adversely affected by phase noise of the local oscillator of the spectrum analyzer, and also results in the frequency of the measured signal being further away in frequency from the frequency of the down converted signal, which results in improved phase noise characteristics of the direct approach spectrum analyzer local oscillator.

16. A phase noise measuring circuit for measuring the phase noise of a device under test as claimed in claim 9, further comprising a coaxial switch coupled between said down converted lowpass signal filter and said frequency multiplier circuit, and having a first switch position which passes the output of said down converted lowpass signal filter to said direct approach spectrum analyzer for calibration purposes, and a second switch position which passes the output of said down converted lowpass signal filter to said frequency multiplier circuit for a phase noise measurement of the device under test.