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Micromachined sensor device using a beam of light with a frequency swept modulated intensity to activate at least two resonance modes of the sensor element

  • US 5,338,929 A
  • Filed: 03/02/1993
  • Issued: 08/16/1994
  • Est. Priority Date: 03/30/1992
  • Status: Expired due to Term
First Claim
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1. A method for monitoring strain variations of a strain responsive element of a micromachined sensor device, the method comprising the steps of:

  • (a) irradiating said element by a beam of light with at least frequency swept modulated intensity for activating said element such that at least two oscillation resonance modes are activated subsequently at their resonance frequencies;

    (b) determining frequency characteristics of said device when subjected to predefined parameter conditions by measuring the corresponding resonance frequencies of two said resonance modes at said predefined parameter conditions;

    (c) determining correspondingly two parameter values for said device by fitting the measured resonance frequencies upon the corresponding frequency characteristics;

    (d) subjecting said element to outside parameter conditions; and

    (e) detecting the beam of light after being modified correspondingly by said activated element.

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