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Method and apparatus for interim, in-situ testing of an electronic system with an inchoate ASIC

  • US 5,339,262 A
  • Filed: 07/10/1992
  • Issued: 08/16/1994
  • Est. Priority Date: 07/10/1992
  • Status: Expired due to Term
First Claim
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1. A method of testing the performance of a target electronic system ultimately employing an ASIC comprising a core cell and surrounding logic, comprising:

  • constructing an interim electronic system, said interim electronic system including features of a target electronic system that will, when built, employ an ASIC having a core cell and surrounding logic, said interim electronic system lacking the ASIC and the ASIC'"'"'S functionality, said interim electronic system including a socket in lieu of the ASIC;

    plugging a pod into the socket, said pod including a plug for plugging into the socket, a functional model of the ASIC core cell, one or more programmable logic devices, and connections between the programmable logic devices; and

    configuring the programmable logic devices to perform the functions of logic surrounding the core cell in the ASIC;

    with the pod connected to the interim electronic system, exercising and verifying the intended functionality of the target electronic system by operating the interim electronic system, observing electrical (functional) responses of the interim electronic system as it is being operated and comparing the responses of the interim electronic system with a set of anticipated responses for the intended target electronic system.

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