Address buffer

• US 5,339,277 A
• Filed: 04/30/1993
• Issued: 08/16/1994
• Est. Priority Date: 04/30/1993
• Status: Expired due to Term

• Current Assignee: SGS Thomson Microelectronics Inc (STMicroelectronics NV)
• Original Assignee: SGS Thomson Microelectronics Inc (STMicroelectronics NV)
• Inventors: McClure, David C.
• Primary Examiner(s): LaRoche, Eugene R.
• Assistant Examiner(s): NIRANJAN, FRANK
• Application Number:
  US08/056,078
• Time in Patent Office: 473 Days
• Field of Search: 365/230.08, 365/201, 365/189.05
• US Class Current: 365/230.08
• CPC Class Codes: G11C 29/34 Accessing multiple bits simultaneously
• CPC Class Codes: G11C 8/06 Address interface arrangements, e.g. address buffers
• CPC Class Codes: G11C 8/12 Group selection circuits, e.g. for memory block selection, chip selection, array selection

Abstract

An address buffer which allows for the simultaneous selection and/or deselection of a plurality of rows and/or columns within a memory array. A first and a second circuit generate a true and a complementary signal, respectively, during normal operations of the integrated circuit. When desired, the first and second circuits may be used to generate two signals of the same voltage level. The two signals of the same voltage level may then be used by an address decoder to simultaneously select and/or deselect a plurality of rows and/or columns within a memory array.

Claims

1. An address buffer in an integrated circuit, comprising:

a first circuit which generates a true signal, wherein a delay occurs in generating the true signal; and

a second circuit which generates a complementary signal during normal operations of the integrated circuit, and during a special operating mode of the integrated circuit the second circuit generates a control signal that matches a voltage level of the true signal, wherein the second circuit includes a circuit which provides a delay in the second circuit that matches the delay in the first circuit.

2. The address buffer of claim 1, further comprising an address decoder for a memory array connected to the address buffer, wherein the first and second control signals are used by the address decoder to select or deselect a plurality of rows within a memory array.

3. The address buffer of claim 1, further comprising an address decoder for a memory array connected to the address buffer, wherein the first and second control signals are used by the address decoder to select or deselect a plurality of columns within a memory array.

4. The address buffer of claim 1, wherein the special operating mode comprises a test mode.

5. The address buffer of claim 1, wherein the second circuit includes a pass gate so that the time delay of the first circuit and the second circuit is equal.

6. The address buffer of claim 5, wherein the second circuit further includes a pull up transistor and a pull down transistor connected to the output of the pass gate.

7. The address buffer of claim 6, wherein the pass gate conducts when both the pull up and pull down transistors are turned off, and does not conduct when either the pull up or pull down transistor is turned on.

8. The address buffer of claim 1, wherein the first and second control signals comprise a high voltage.

9. The address buffer of claim 1, Wherein the first and second control signals comprise a low voltage.

10. The address buffer of claim 1, wherein the second circuit comprises:

an input signal line;

a pass gate, wherein the pass gate is designed to provide the second delay;

at least one logic gate connected in series between the input signal line and an input of the pass gate;

a first inverter connected to an output of the pass gate; and

a pull up transistor and a pull down transistor connected to the output of the pass gate.

12. The address buffer of claim 10, wherein the voltage level of the first and second control signals is determined by the voltage on the input signal line, the states of the pull up and pull down transistors and the state of the pass gate.

21. The address buffer of claim 7, wherein the voltage level of the first and second control signals is determined by the voltage on the input signal line, the states of the pull up and pull down transistors and the state of the pass gate.

11. An address buffer in an integrated circuit, comprising:

a first circuit which generates a true signal during normal operations of the integrated circuits, and special operating mode of the integrated circuit the first circuit generates a first control signal, wherein the first circuit comprises a second inverter and a third inverter connected in series to the output of the at least one logic gate ; and

a second circuit which generates a complementary signal during normal operations of the integrated circuit, and during a special operating mode of the integrated circuit the second circuit generates a second control signal, wherein the second circuit includes an input signal line;

a pass gate;

at least one logic gate connected in series between the input signal line and an input of the pass gate;

a first inverter connected to an output of the pass gate; and

a pull up transistor and a pull down transistor connected to the output of the pass gate, wherein the first and second control signals are set to the same voltage level.

13. An address buffer in an integrated circuit, comprising:

an input signal line;

a pass gate;

at least one logic gate connected in series between the input signal line and an input to the pass gate;

a pull up transistor and a pull down transistor connected to an output of the pass gate, wherein the pull up and pull down transistors are used to generate a first control signal; and

a first inverter and a second inverter connected in series to the output of the at least one logic gate, wherein the at least one logic gate, the first and second inverters are used to generate a second control signal, and wherein the first control signal and the second control signal are set to a single output voltage level during a special operating mode of the integrated circuit.

14. The address buffer of claim 13, further comprising an address decoder for a memory array connected to the address buffer, wherein the first and second control signals are used by the address decoder to select or deselect a plurality of rows within a memory array.

15. The address buffer of claim 13, further comprising an address decoder for a memory array connected to the address buffer, wherein the first and second control signals are used by the address decoder to select or deselect a plurality of columns within a memory array.

16. The address buffer of claim 13, wherein the special operating mode comprises a test mode.

22. The address buffer of claim 13, further comprising a third inverter connected to the output of the pass gate for generating the first control signal in conjunction with the pull up and pull down transistors.

17. An address buffer in an integrated circuit, comprising:

an input signal line;

a pass gate;

a first inverter and a second inverter connected in series between the input signal line and an input to the pass gate;

a pull up transistor and a pull down transistor connected to an output of the pass gate, wherein the pull up and pull down transistors are used to generate a first control signal; and

a third inverter and a fourth inverter connected in series to the output of the second inverter, wherein the first, second, third and fourth inverters are used to generate a second control signal, and wherein the first and second control signals are set to a single output voltage level during a special operating mode of the integrated circuit.

18. The address buffer of claim 17, further comprising an address decoder for a memory array connected to the address buffer, wherein the first and second control signals are used by the address decoder to select or deselect a plurality of rows within a memory array.

19. The address buffer of claim 17, further comprising an address decoder for a memory array connected to the address buffer, wherein the first and second control signals are used by the address decoder to select or deselect a plurality of columns within a memory array.

20. The address buffer of claim 17, wherein the special operating mode comprises a test mode.

23. The address buffer of claim 17, further comprising a third inverter connected to the output of the pass gate for generating the first control signal in conjunction with the pull up and pull down transistors.