Method for inspecting components having complex geometric shapes

• US 5,345,514 A
• Filed: 09/16/1991
• Issued: 09/06/1994
• Est. Priority Date: 09/16/1991
• Status: Expired due to Term

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Mahdavieh, Yaghoub, Hedengren, Kristina H. V.
• Primary Examiner(s): Boudreau, Leo H.
• Assistant Examiner(s): KELLEY, CHRISTOPHER S
• Application Number:
  US07/772,761
• Time in Patent Office: 1,086 Days
• Field of Search: 382/1, 382/8, 382/25, 364/481, 358/106, 356/32, 324/209, 324/233, 324/238, 324/240
• US Class Current: 382/152
• CPC Class Codes: B82Y 15/00 Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
• CPC Class Codes: G01N 27/9046 by analysing electrical signals

Abstract

A method for inspecting a component of a gas turbine engine or the like having a plurality of similarly shaped structural portions, such as the gear teeth of a gear, the dovetail slots of a turbine disk or the like, includes the steps of: scanning a surface of at least one of the similarly shaped structural portions with an eddy current probe to induce eddy currents in the component; generating a two-dimensional image of the at least one portion from eddy current signals received during scanning, the image including a multiplicity of pixels arranged in a two-dimensional array and each pixel having a gray scale intensity responsive to the eddy current induced in the component at a component location corresponding to a position of the pixel in the matrix array; preprocessing the image to substantially reduce any signals or changes in the gray scale intensity of any pixels relative to the background pixel intensities of the image caused by geometrical characteristics and background noise common to all similarly shaped structuaral portions; identifying any suspected defect regions from the preprocessed image; determining a defect signal for each suspected defect region; and rejecting the component if any defect signal exceeds a predetermined reference value.

Claims

1. A method for inspecting a component having a plurality of similarly shaped structural portions, comprising the steps of:

(a) scanning a surface of at least one of the similarly shaped structural portions with an eddy current probe means to induce eddy currents in the component;

(b) generating a two-dimensional image of the at least one portion from eddy current signals received during scanning, the image including a multiplicity of pixels arranged in a two-dimensional matrix array and each pixel having a gray scale intensity responsive to the eddy current induced in the component at a component location corresponding to a position of the pixel in the two-dimensional matrix array;

(c) preprocessing the image to substantially reduce any signals caused by geometrical characteristics and background noise common to all of the similarly shaped structural portions;

(d) identifying any suspected defect regions in the two-dimensional image from corresponding regions in the preprocessed image of step (c);

(e) determining a defect signal from the gray scale intensities for each suspected defect regions in the two-dimensional image; and

(f) rejecting the component if any defect signal exceeds a predetermined reference value, wherein step (c) comprises the steps of;

(c1) repeating steps (a) and (b) to generate a two-dimensional image for a second and third similarly shaped structural portion;

(c2) selecting a test portion and an associated test image, a first reference portion and an associated first reference image, and a second reference portion and an associated second reference image from the three similarly shaped portions;

(c3) taking a difference between the first reference image and the test image to provide a first resulting image by taking a difference between the gray scale intensity of each pixel of the first reference image and the gray scale intensity of a corresponding pixel of the test image;

(c4) taking a difference between the second reference image and the test image to provide a second resulting image by taking a difference between gray scale intensities of corresponding pixels of each image;

(c5) converting each of the first and second reference images from a gray scale image to respective first and second binary images; and

(c6) combining the first and second binary images by a logic AND operation to provide a preprocessed composite binary image.

2. The method of claim 1, wherein step (d) comprises the steps of:

identifying any sections within the preprocessed composite binary image which contain a cluster of pixels with predominantly all pixels having a predetermined binary value; and

identifying any suspected defect regions in one of the first and second resulting images which correspond to the identified sections in the preprocessed composite binary image.

3. The method of claim 1, wherein steps (c5) and (c6) are replaced by:

(c5'"'"') combining the first and second resulting images to provide a composite image; and

(c6'"'"') converting the composite image to a preprocessed composite binary image.

4. The method of claim 3, wherein step (d) comprises the steps of:

identifying any sections within the preprocessed composite binary image which contain a cluster of pixels with predominantly all pixels having a predetermined binary value; and

identifying any suspected defect regions in one of the first and second resulting images which correspond to the identified sections in the preprocessed composite binary image.

5. The method of claim 1, further comprising the step of filtering each of the first and second resulting images to reduce any signals caused by noise in each image and to enhance any signals caused by a defect before step (c5).

6. The method of claim 5, wherein the filtering is accomplished by image convolution using a digital filter.

7. The method of claim 5, wherein the filtering step comprises the step of applying a set of predetermined apriori signals to each of the first and second resulting images by image convolution to extract selected features of any defect signal from each of the resulting images.

8. The method of claim 7, wherein the step of applying a set of predetermined apriori signals comprises the step of providing a template means for comparing at least one predetermined apriori signal of a selected feature to each resulting image.

9. The method of claim 8, wherein image convolution comprises the step of providing at least one template means for comparatively extracting respective apriori features from each resulting image.

10. The method of claim 9, wherein a plurality of template means are compared to each of the resulting images, each of the template means being predetermined to select at least one specific defect signal feature from each resulting image.

11. The method of claim 10, wherein the plurality of template means collectively cooperate as a composite template to detect a corresponding plurality of defect signal features in each resulting image.

12. The method of claim 9, wherein the step of comparatively extracting comprises the step of calculating a respective correlation coefficient between each signal feature characterized in the template means and signals corresponding to each of the resulting images.

13. The method of claim 1, further comprising the step of repeating steps (a)-(f) until all similarly shaped structural portions have been inspected.

14. A method for inspecting a component having a complex geometric shape, comprising the steps of:

(a) scanning a surface of the component with an eddy current probe means to induce eddy currents in the component;

(b) generating a two-dimensional image of the component from eddy current signals received during scanning, the image including a multiplicity of pixels arranged in a two-dimensional matrix array and each pixel having a gray scale intensity responsive to the eddy current induced in the component at a component location corresponding to a position of the pixel in the two-dimensional matrix array;

(c) preprocessing the image to substantially reduce any signals caused by geometrical characteristics and background noise common to all components having substantially the same geometric shape by subtracting a reference image of a substantially identically shaped component from the image generated in step (b);

(d) identifying any suspected defect regions in the two-dimensional image from corresponding regions in the preprocessed image of step (c); and

(e) determining a defect signal from the gray scale intensities for each suspected defect region in the two-dimensional image;

(f) rejecting the component if any defect signal exceeds a predetermined reference value,

converting the preprocessed image from a gray scale image to a binary image;

identifying any sections within the binary image which contain a cluster of pixels with predominantly all pixels having a predetermined binary value; and

identifying any suspected defect regions in the preprocessed image which correspond to the identified sections in the preprocessed composite binary image.

15. The method of claim 14, further comprising the step of filtering the preprocessed image before converting to a binary image, to reduce any signals caused by noise and to enhance any signals caused by a defect.

16. A method for inspecting dovetail slots of a gas turbine engine component, comprising the steps of:

(a) scanning a surface of a dovetail slot with an eddy current probe means to induce eddy currents in the component;

(b) generating a two-dimensional image of the dovetail slot surface from eddy current signals received during scanning, each image including a multiplicity of pixels arranged in a two-dimensional matrix array and each pixel having a gray scale intensity responsive to the eddy current induced in the component at a component location corresponding to a position of the pixel in the two-dimensional matrix array;

(c) repeating steps (a) and (b) to generate a two-dimensional image for three dovetail slots;

(d) selecting a test slot and an associated test image, a first reference slot and an associated first reference image, and a second reference slot and an associated second reference image from the three dovetail slots;

(e) taking a difference between the first reference image and the test image to provide a first resulting image by taking a difference between the gray scale intensity of each pixel of the first reference image and the gray scale intensity of a corresponding pixel of the test image;

(f) taking a difference between the second reference image and the test image to provide a second resulting image by taking a difference between gray scale intensities of corresponding pixels of each image;

(g) converting each of the first and second resulting images from a gray scale image to respective first and second binary images by thresholding;

(h) combining the first and second binary images by a logic AND operation to provide a composite binary image;

(i) identifying any sections within the composite binary image which contain a cluster of pixels with predominantly all pixels having a predetermined binary value;

(j) identifying any suspected defect regions in one of the first and second resulting images of step (e) which correspond to the identified sections of step (i);

(k) calculating a defect signal for each suspected defect region; and

(l) comparing the defect signal for each region with a predetermined reference value to determine whether a defect is present in the test slot at a location corresponding to the suspected defect region.

17. The method of claim 16, further comprising the step of filtering each of the first and second resulting images before step (g), to reduce signals caused by noise in each image and to enhance any signals which may be caused by a defect, by image convolution using a digital filter.

18. The method of claim 17, wherein the step of filtering includes convoluting each of the first and second resulting images with a 7×

3 digital filter.

19. The method of claim 18, wherein the 7×

3 digital filter has the following matrix array;

##EQU1##

20. The method of claim 16, further comprising the step of applying a digital filter to the composite binary image after step (h) by image convolution.

21. The method of claim 20, wherein the digital filter is a 9×

2 filter having the following matrix array;

##EQU2##

22. The method of claim 16, wherein step (k) comprises the steps of:

(k1) calculating a symmetrical coefficient for each suspected defect region of step (j) from the gray scale intensities within each respective region; and

(k2) calculating an integrated signal for each suspected defect region of step (j) from the gray scale intensities within each respective region.

23. The method of claim 22, wherein step (k1) comprises the steps of:

bisecting each suspected defect region along a first selected dimension of each region;

calculating a first percentage of corresponding pixels in each half of each region which have substantially the same gray scale intensity;

bisecting each suspected defect region along a second selected dimension of each region;

calculating a second percentage of corresponding pixels in each half of each region bisected by the second selected dimension which have substantially the same gray scale intensity; and

multiplying the first and second percentages of each region to provide a symmetrical coefficient for each region.

24. The method of claim 22, wherein the defect signal for each region is equal to AHAT and AHAT is determined according to the following equation:

space="preserve" listing-type="equation">AHAT=(symmetrical coefficient).sup.α

×

(area of the suspected defect region).sup.β

×

(integrated signal).sup.γ

.

25. The method of claim 24, wherein α

=1, β

=1/4, and γ

=1/4.

26. The method of claim 16, further comprising the step of repeating steps (a)-(l) until all dovetail slots have been inspected.

27. The method of claim 16, further comprising the steps of:

estimating a possible defect length for each suspected defect region;

plotting a point on a probability of detection POD plot which corresponds to the defect signal versus the defect length for each suspected defect region; and

rejecting the component if the plotted point for any suspected defect region exceeds a threshold curve of the POD plot.

28. A method for inspecting gear teeth and the like of a component, comprising the steps of:

(a) scanning a surface of a gear tooth with an eddy current probe means to induce eddy currents in the component;

(b) generating a two-dimensional image of the gear tooth surface from eddy current signals received during scanning, each image including a multiplicity of pixels arranged in a two-dimensional matrix array and each pixel having a gray scale intensity responsive to the eddy current induced in the component at a component location corresponding to a position of the pixel in the matrix array;

(c) repeating steps (a) and (b) to generate a two-dimensional image for three gear teeth;

(d) selecting a test tooth and an associated test image, a first reference tooth and an associated first reference image, and a second reference tooth and an associated second reference image from the three gear teeth;

(e) taking a difference between the first reference image and the test image to provide a first resulting image by taking a difference between the gray scale intensity of each pixel of the first reference image and the gray scale intensity of a corresponding pixel of the test image;

(f) taking a difference between the second reference image and the test image to provide a second resulting image by taking a difference between the gray scale intensities of corresponding pixels of each image;

(g) converting each of the first and second resulting images from a gray scale image to respective first and second binary images by thresholding;

(h) combining the first and second binary image by a logic AND operation to provide a composite binary image;

(i) identifying any sections within the composite binary image which contain a cluster of pixels with predominantly all pixels having a predetermined binary value;

(j) identifying any suspected defect regions in one of the first and second resulting images of step (e) which correspond to the identified sections of step (i);

(k) calculating a defect signal for each suspected defect region; and

(l) comparing the defect signal for each region with a predetermined reference value to determine whether a defect is present in the test tooth at a location corresponding to the suspected defect region.

29. The method of claim 28, further comprising the step of filtering each of the first and second resulting images before step (g), to reduce signals caused by noise in each image and to enhance any signals which may be caused by a defect, by image convolution using a digital filter.

30. The method of claim 28, further comprising the step of applying a digital filter to the composite binary image after step (h) by image convolution.

31. The method of claim 28, wherein step (k) comprises the steps of:

(k1) calculating a symmetrical coefficient for each suspected defect region of step (j) from the gray scale intensities within each respective region; and

(k2) calculating an integrated signal for each suspected defect region of step (j) from the gray scale intensities within each respective region.

32. The method of claim 31, wherein step (k1) comprises the steps of:

bisecting each suspected defect region along a first selected dimension;

calculating a first percentage of corresponding pixels in each half of each region which have substantially the same gray scale intensity;

bisecting each suspected defect region along a second selected dimension;

calculating a second percentage of corresponding pixels in each half of each region bisected by the second selected dimension which have substantially the same gray scale intensity; and

multiplying the first and second percentages of each region to provide a symmetrical coefficient for each region.

33. The method of claim 31, wherein step (k2) comprises the step of summing the gray scale intensities of all pixels within each individual suspected defect region to provide an integrated signal for each region.

34. The method of claim 31, wherein the defect signal for each region is equal to AHAT and AHAT is determined according to the following equation:

space="preserve" listing-type="equation">AHAT=(symmetrical coefficient).sup.α

×

(area of the suspected defect region).sup.β

×

(integrated signal).sup.γ

.