Surface plasmon resonance measuring instruments

• US 5,351,127 A
• Filed: 06/17/1992
• Issued: 09/27/1994
• Est. Priority Date: 06/17/1992
• Status: Expired due to Term

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: King, David A., Seher, Jens-Peter
• Primary Examiner(s): Rosenberger, Richard A.
• Application Number:
  US07/900,217
• Time in Patent Office: 832 Days
• Field of Search: 356/445, 356/136
• US Class Current: 356/445
• CPC Class Codes: G01N 21/553 and using surface plasmons fluorescence excitation G01N21/648; enhanced Raman G01N21/658

Abstract

A measuring instrument utilizing surface plasmon resonance is described. The instrument employs no moving mechanical part because it produces the resonance by changing the parameters either electrically or acoustically, and it detects the reflection by a stationary detector.

Claims

1. A surface plasmon resonance (SPR) instrument, comprising:

a block of material transparent to an electromagnetic beam, the block of material having a first surface;

a crystalline material having an amplitude that is electrically modulated, the amplitude corresponding to an adjustable index of refraction, having a second surface for providing internal reflection of the electromagnetic beam;

a source of electricity supplying electricity with adjustable amplitude to modulate the adjustable index of refraction of said crystalline material;

a conductive layer adjacent to the second surface, the conductive layer adapted to contact a sample;

an electromagnetic beam radiating to the second surface to produce internal reflection; and

a detector of electromagnetic radiation coupled to the block for detecting reflection of the source beam from the second surface.

2. A SPR instrument as in claim 1, wherein said crystalline material is quartz.

3. A surface plasmon resonance (SPR) instrument, comprising:

a block of material transparent to an electromagnetic beam, the block of material having a first surface;

a liquid crystal material having an amplitude that is electrically modulated, the amplitude corresponding to an adjustable index of refraction, having a second surface for providing internal reflection of the electromagnetic beam;

a source of electricity supplying electricity with adjustable amplitude to modulate the adjustable index of refraction of said liquid crystal material;

a conductive layer adjacent to the second surface, the conductive layer adapted to contact a sample;

an electromagnetic beam radiating to the second surface to produce internal reflection; and

a detector of electromagnetic radiation coupled to the block for detecting reflection of the source beam from the second surface.

4. A surface plasmon resonance (SPR) instrument comprising:

a block of material transparent to an electromagnetic beam, the block of material having a first surface;

a semiconductor material having an amplitude that is electrically modulated, the amplitude corresponding to an adjustable index of refraction, having a second surface for providing internal reflection of the electromagnetic beam;

a source of electricity supplying electricity with adjustable amplitude to modulate the adjustable index of refraction of said semiconductor material;

a conductive layer adjacent to the second surface, the conductive layer adapted to contact a sample;

an electromagnetic beam radiating to the second surface to produce internal reflection; and

a detector of electromagnetic radiation coupled to the block for detecting reflection of the source beam from the second surface.

5. A surface plasmon resonance (SPR) instrument, comprising:

a block of material transparent to an electromagnetic beam, the block of material having a first surface;

a multiple quantum well structure having an amplitude that is electrically modulated, the amplitude corresponding to an adjustable index of refraction, having a second surface for providing internal reflection of the electromagnetic beam;

a source of electricity supplying electricity with adjustable amplitude to modulate the adjustable index of refraction of said structure;

a conductive layer adjacent to the second surface, the conductive layer adapted to contact a sample;

an electromagnetic beam radiating to the second surface to produce internal reflection; and

a detector of electromagnetic radiation coupled to the block for detecting reflection of the source beam from the second surface.

6. A surface plasmon resonance (SPR) instrument, comprising:

a block of material transparent to an electromagnetic beam, the block of material having a first surface;

a photo refractive material having an amplitude that is electrically modulated, the amplitude corresponding to an adjustable index of refraction, having a second surface for providing internal reflection of the electromagnetic beam;

a light source supplying light with adjustable intensity to modulate the adjustable index of refraction of said photo refractive material;

a conductive layer adjacent to the second surface, the conductive layer adapted to contact a sample;

an electromagnetic beam radiating to the second surface to produce internal reflection; and

a detector of electromagnetic radiation coupled to the block for detecting reflection of the source beam from the second surface.

7. A SPR instrument as in claim 6, wherein said photo refractive material comprises a layer of BaTiO₃.

8. A surface plasmon resonance (SPR) instrument without any moving mechanical parts, comprising:

a block of material transparent to a source beam of electromagnetic radiation, said block of material having a first surface,

means for providing a periodic structure adjacent to said first surface, wherein said means for providing periodic structure comprises a layer of material for generating surface acoustic waves (SAW), and a plurality of non-uniformly spaced interdigital transducers in contact with said material, said instrument further comprising a source of electricity providing electrical signals to said interdigital transducers, wherein said periodic structure providing means further comprises a second surface for providing internal reflection of said source beam,

a layer of conductive material adjacent to said second surface, said layer of conductive material adapted to contact a sample, and

a detector of electromagnetic radiation coupled to said block for detecting reflection of said source beam from said second surface.

9. A SPR instrument as in claim 8, wherein said material for generating SAW is LiNbO₃.

10. A SPR instrument as in claim 9, wherein said source of electricity provides electrical signals at 3.5 GHz.

11. A SPR instrument as in claim 8, wherein said means for providing a periodic structure comprises a layer of semiconductor material and a first and a second light source generating light beams with adjustable wavelengths and producing an interference in said semiconductor material.

12. A SPR instrument as in claim 11, wherein said light sources are laser sources.

13. A surface plasmon resonance (SPR) instrument without any moving mechanical part, comprising:

a block of non-dispersive material transparent to a tunable source beam of electromagnetic radiation and having a first surface,

a layer of dispersive material adjacent to said surface, said layer of dispersive material having a second surface for providing internal reflection of said tunable source beam of electromagnetic radiation,

a layer of conductive material adjacent to said second surface, said layer of conductive material adapted to contact a sample, and

a detector of electromagnetic radiation coupled to said block for detecting reflection of said source beam from said second surface.

14. A surface plasmon resonance (SPR) instrument without any moving mechanical part, comprising:

a block material transparent to a source beam of electromagnetic radiation and having a surface for providing internal reflection of said source beam of electromagnetic radiation,

a layer of conductive material adjacent to said surface, said layer adapted to contact a sample, and

a detector of electromagnetic radiation coupled to block for detecting reflection of said source beam from said surface, and

means for adjusting temperature of said block of material to change its refractive index.

15. The instrument of claim 14, wherein said temperature adjusting means comprises means for applying radiation to the block and the layer of conductive material.

16. A surface plasmon resonance (SPR) instrument without any moving mechanical part, comprising:

a block material transparent to a source beam of electromagnetic radiation and having a surface for providing internal reflection of said source beam of electromagnetic radiation,

a layer of conductive material adjacent to said surface, said layer adapted to contact a test sample, and

a detector of electromagnetic radiation coupled to said block for detecting reflection of said source beam from said surface, and

means for adjusting temperature of said layer of conductive material to change its dielectric constant.

17. The instrument of claim 16, wherein said temperature adjusting means comprises means for applying a current to said layer of conductive material.

18. A method for detecting surface plasmon resonance associated with a test sample which is placed adjacent to a surface plasmon resonance instrument, said method being performed without the use of any moving mechanical part, said method comprising the steps of:

(a) transmitting a source beam of electromagnetic radiation into a block of material transparent to said source beam of electromagnetic radiation, said block of material including a layer of transparent material within said block, said layer of transparent material having an adjustable index of refraction and having a surface for providing internal reflection of said source beam;

(b) repeatedly altering the index of refraction of said layer of transparent material by applying an adjustable electrical signal to said layer of transparent material;

(c) repeatedly detecting a reflection of said source beam and a corresponding amplitude thereof, and

(d) detecting surface plasmon resonance associated with a test sample based upon relative amplitudes of said detected reflection of said source beam.

19. A method for detecting surface plasmon resonance associated with a test sample which is placed adjacent to a surface plasmon resonance instrument, said method being performed without the use of any moving mechanical part, said method comprising the steps of:

(a) transmitting a source beam of electromagnetic radiation into a block of material transparent to said source beam, said block of material including a layer of substrate suitable for generating surface acoustic waves therein, said layer of substrate having a surface for providing internal reflection of said source beam;

(b) generating surface acoustic waves in said layer of substrate, said surface acoustic waves being adjustable in frequency;

(c) repeatedly varying the frequency of said surface acoustic waves;

(d) repeatedly detecting a reflection of said source beam and a corresponding amplitude thereof, and

(e) detecting surface plasmon resonance associated with a test sample based upon relative amplitudes of said detected reflection of said source beam.

20. A method for detecting surface plasmon resonance associated with a test sample which is placed adjacent to a surface plasmon resonance instrument, said method being performed without the use of any moving mechanical part, said method comprising the steps of:

(a) transmitting a source beam of electromagnetic radiation into a block of material transparent to said source beam, said block having a surface for providing internal reflection of said source beam;

(b) repeatedly adjusting the temperature of said block of material to change its refractive index;

(c) repeatedly detecting a reflection of said source beam and a corresponding amplitude thereto, and

(d) detecting surface plasmon resonance associated with a test sample based upon relative amplitudes of said detected reflection of said source beam.

21. A method for detecting surface plasmon resonance associated with a test sample which is placed adjacent to a surface plasmon resonance instrument, said method being performed without the use of any moving mechanical part, said method comprising the steps of:

(a) transmitting a source beam of electromagnetic radiation into a block of material transparent to said source beam of electromagnetic radiation, said block having a surface for providing internal reflection of said source beam;

(b) repeatedly adjusting the temperature of said layer to change its dielectric constant;

(c) repeatedly detecting a reflection of said source beam and a corresponding amplitude thereof, and

(d) detecting surface plasmon resonance associated with a test sample based upon relative amplitudes of said detected reflection of said source beam.